RF and microwave modeling and measurement techniques for field effect transistors
by
 
Gao, Jianjun, 1968-

Title
RF and microwave modeling and measurement techniques for field effect transistors

Author
Gao, Jianjun, 1968-

ISBN
9781613442869
 
9781613530900

Personal Author
Gao, Jianjun, 1968-

Publication Information
Raleigh, NC : SciTech Pub., c2010.

Physical Description
1 online resource (x, 339 p.) : ill.

Contents
Representation of Microwave Two-Port Network -- Microwave and RF Measurement Techniques -- FET Small Signal Modeling and Parameter Extraction -- FET Nonlinear Modeling and Parameter Extraction -- Microwave Noise Modeling and Parameter Extraction Technique for FETs -- Artificial Neural Network Modeling Technique for FET

Abstract
"This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success.
 
The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based."--pub. desc.

Subject Term
Field-effect transistors -- Testing.
 
Compound semiconductors -- Testing.
 
Field-effect transistors -- Mathematical models.
 
Compound semiconductors -- Mathematical models.
 
Microwave measurements.
 
Radio measurements.

Genre
Electronic books.

Added Corporate Author
Knovel (Firm)

Electronic Access
Knovel http://app.knovel.com/web/toc.v/cid:kpRFMMMTCH


LibraryMaterial TypeItem BarcodeShelf NumberStatus
IYTE LibraryE-Book473775-1001TK7871.95 .G36 2010 EBOnline Knovel