RF and microwave modeling and measurement techniques for field effect transistors
by
Gao, Jianjun, 1968-
Title
:
RF and microwave modeling and measurement techniques for field effect transistors
Author
:
Gao, Jianjun, 1968-
ISBN
:
9781613442869
9781613530900
Personal Author
:
Gao, Jianjun, 1968-
Publication Information
:
Raleigh, NC : SciTech Pub., c2010.
Physical Description
:
1 online resource (x, 339 p.) : ill.
Contents
:
Representation of Microwave Two-Port Network -- Microwave and RF Measurement Techniques -- FET Small Signal Modeling and Parameter Extraction -- FET Nonlinear Modeling and Parameter Extraction -- Microwave Noise Modeling and Parameter Extraction Technique for FETs -- Artificial Neural Network Modeling Technique for FET
Abstract
:
"This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success.
The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based."--pub. desc.
Subject Term
:
Field-effect transistors -- Testing.
Compound semiconductors -- Testing.
Field-effect transistors -- Mathematical models.
Compound semiconductors -- Mathematical models.
Microwave measurements.
Radio measurements.
Genre
:
Electronic books.
Added Corporate Author
:
Knovel (Firm)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | Status |
---|
IYTE Library | E-Book | 473775-1001 | TK7871.95 .G36 2010 EB | Online Knovel |