Surface contamination and cleaning
by
 
International Symposium on Surface Contamination and Cleaning (2001 : Newark, N.J.)

Title
Surface contamination and cleaning

Author
International Symposium on Surface Contamination and Cleaning (2001 : Newark, N.J.)

ISBN
9781601192325
 
9789067643764
 
9789047403289

Conference Author
International Symposium on Surface Contamination and Cleaning (2001 : Newark, N.J.)

Publication Information
Utrecht ; Boston : VSP, 2003-

Physical Description
1 online resource : ill.

General Note
Proceedings of the International Symposium on Surfase Contamination and Cleaning held under the aegis of MST Conferences in Newark. New Jersey, May 23-25, 2001.

Contents
Preface; Mapping of surface contaminants by tunable infrared-laser imaging; Monitoring cleanliness and defining acceptable cleanliness levels; Tracking surface ionic contamination by ion chromatography; A new method using MESERAN technique for measuring surface contamination after solvent extraction; Methods for pharmaceutical cleaning validations; Influence of cleaning on the surface of model glasses and their sensitivity to organic contamination; Decontamination of sensitive equipment; The fundamentals of no-chemistry process cleaning

Abstract
This work constitutes the proceedings of the International Symposium on Surface Contamination and Cleaning, held in 2001. It contains a total of 24 papers, covering topics such as: mapping of surface contaminants; acceptable cleanliness levels; ionic contamination; and particle removal.

Subject Term
Surface contamination -- Congresses.

Genre
Electronic books.
 
Conference proceedings. (OCoLC)fst01423772

Added Author
Mittal, K. L., 1945-

Added Corporate Author
MST Conferences (Firm)

Electronic Access
Knovel http://app.knovel.com/web/toc.v/cid:kpSCCV0003


LibraryMaterial TypeItem BarcodeShelf NumberStatus
IYTE LibraryE-Book474421-1001TA418.7 .I555 2003 EBOnline Knovel