Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings
by
 
Yeung, Dit-Yan. editor.

Title
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings

Author
Yeung, Dit-Yan. editor.

ISBN
9783540372417

Physical Description
XXI, 939 p. Also available online. online resource.

Series
Lecture Notes in Computer Science, 4109

Contents
Invited Talks -- SSPR -- Poster Papers -- SPR -- Poster Papers.

Subject Term
Computer science.
 
Computational complexity.
 
Artificial intelligence.
 
Computer graphics.
 
Computer vision.
 
Optical pattern recognition.
 
Pattern Recognition.
 
Discrete Mathematics in Computer Science.
 
Artificial Intelligence (incl. Robotics).
 
Image Processing and Computer Vision.

Added Author
Yeung, Dit-Yan.
 
Kwok, James T.
 
Fred, Ana.
 
Roli, Fabio.
 
Ridder, Dick.

Added Corporate Author
SpringerLink (Online service)

Electronic Access
http://dx.doi.org/10.1007/11815921


LibraryMaterial TypeItem BarcodeShelf NumberStatus
IYTE LibraryE-Book511470-1001Q337.5Online Springer