Cover image for Nondestructive evalution and reliability of micro-and nanomaterial systems: 18-19 March 2002, Newport Beach, USA.
Nondestructive evalution and reliability of micro-and nanomaterial systems: 18-19 March 2002, Newport Beach, USA.
Title:
Nondestructive evalution and reliability of micro-and nanomaterial systems: 18-19 March 2002, Newport Beach, USA.
Author:
Meyendorf, Norbert.
ISBN:
9780819444516
Publication Information:
Bellingham,Wash,USA: SPIE, c2002
Physical Description:
ix, 228 p.: ill
Series:
SPIE proceedings series, v. 4703

Proceedings of SPIE--the International Society for Optical Engineering ; v. 4703
Holds: Copies: