Microwave Electronics -- Contents -- Preface -- 1 Electromagnetic Properties of Materials -- 1.1 Materials Research and Engineering at Microwave Frequencies -- 1.2 Physics for Electromagnetic Materials -- 1.2.1 Microscopic scale -- 1.2.2 Macroscopic scale -- 1.3 General Properties of Electromagnetic Materials -- 1.3.1 Dielectric materials -- 1.3.2 Semiconductors -- 1.3.3 Conductors -- 1.3.4 Magnetic materials -- 1.3.5 Metamaterials -- 1.3.6 Other descriptions of electromagnetic materials -- 1.4 Intrinsic Properties and Extrinsic Performances of Materials -- 1.4.1 Intrinsic properties -- 1.4.2 Extrinsic performances -- References -- 2 Microwave Theory and Techniques for Materials Characterization -- 2.1 Overview of the Microwave Methods for the Characterization of Electromagnetic Materials -- 2.1.1 Nonresonant methods -- 2.1.2 Resonant methods -- 2.2 Microwave Propagation -- 2.2.1 Transmission-line theory -- 2.2.2 Transmission Smith charts -- 2.2.3 Guided transmission lines -- 2.2.4 Surface-wave transmission lines -- 2.2.5 Free space -- 2.3 Microwave Resonance -- 2.3.1 Introduction -- 2.3.2 Coaxial resonators -- 2.3.3 Planar-circuit resonators -- 2.3.4 Waveguide resonators -- 2.3.5 Dielectric resonators -- 2.3.6 Open resonators -- 2.4 Microwave Network -- 2.4.1 Concept of microwave network -- 2.4.2 Impedance matrix and admittance matrix -- 2.4.3 Scattering parameters -- 2.4.4 Conversions between different network parameters -- 2.4.5 Basics of network analyzer -- 2.4.6 Measurement of reflection and transmission properties -- 2.4.7 Measurement of resonant properties -- References -- 3 Reflection Methods -- 3.1 Introduction -- 3.1.1 Open-circuited reflection -- 3.1.2 Short-circuited reflection -- 3.2 Coaxial-line Reflection Method -- 3.2.1 Open-ended apertures -- 3.2.2 Coaxial probes terminated into layered materials.

3.2.3 Coaxial-line-excited monopole probes -- 3.2.4 Coaxial lines open into circular waveguides -- 3.2.5 Shielded coaxial lines -- 3.2.6 Dielectric-filled cavity adapted to the end of a coaxial line -- 3.3 Free-space Reflection Method -- 3.3.1 Requirements for free-space measurements -- 3.3.2 Short-circuited reflection method -- 3.3.3 Movable metal-backing method -- 3.3.4 Bistatic reflection method -- 3.4 Measurement of Both Permittivity and Permeability Using Reflection Methods -- 3.4.1 Two-thickness method -- 3.4.2 Different-position method -- 3.4.3 Combination method -- 3.4.4 Different backing method -- 3.4.5 Frequency-variation method -- 3.4.6 Time-domain method -- 3.5 Surface Impedance Measurement -- 3.6 Near-field Scanning Probe -- References -- 4 Transmission/Reflection Methods -- 4.1 Theory for Transmission/reflection Methods -- 4.1.1 Working principle for transmission/reflection methods -- 4.1.2 Nicolson-Ross-Weir (NRW) algorithm -- 4.1.3 Precision model for permittivity determination -- 4.1.4 Effective parameter method -- 4.1.5 Nonlinear least-squares solution -- 4.2 Coaxial Air-line Method -- 4.2.1 Coaxial air lines with different diameters -- 4.2.2 Measurement uncertainties -- 4.2.3 Enlarged coaxial line -- 4.3 Hollow Metallic Waveguide Method -- 4.3.1 Waveguides with different working bands -- 4.3.2 Uncertainty analysis -- 4.3.3 Cylindrical rod in rectangular waveguide -- 4.4 Surface Waveguide Method -- 4.4.1 Circular dielectric waveguide -- 4.4.2 Rectangular dielectric waveguide -- 4.5 Free-space Method -- 4.5.1 Calculation algorithm -- 4.5.2 Free-space TRL calibration -- 4.5.3 Uncertainty analysis -- 4.5.4 High-temperature measurement -- 4.6 Modifications on Transmission/reflection Methods -- 4.6.1 Coaxial discontinuity -- 4.6.2 Cylindrical cavity between transmission lines -- 4.6.3 Dual-probe method -- 4.6.4 Dual-line probe method.

4.6.5 Antenna probe method -- 4.7 Transmission/reflection Methods for Complex Conductivity Measurement -- References -- 5 Resonator Methods -- 5.1 Introduction -- 5.2 Dielectric Resonator Methods -- 5.2.1 Courtney resonators -- 5.2.2 Cohn resonators -- 5.2.3 Circular-radial resonators -- 5.2.4 Sheet resonators -- 5.2.5 Dielectric resonators in closed metal shields -- 5.3 Coaxial Surface-wave Resonator Methods -- 5.3.1 Coaxial surface-wave resonators -- 5.3.2 Open coaxial surface-wave resonator -- 5.3.3 Closed coaxial surface-wave resonator -- 5.4 Split-resonator Method -- 5.4.1 Split-cylinder-cavity method -- 5.4.2 Split-coaxial-resonator method -- 5.4.3 Split-dielectric-resonator method -- 5.4.4 Open resonator method -- 5.5 Dielectric Resonator Methods for Surface-impedance Measurement -- 5.5.1 Measurement of surface resistance -- 5.5.2 Measurement of surface impedance -- References -- 6 Resonant-perturbation Methods -- 6.1 Resonant Perturbation -- 6.1.1 Basic theory -- 6.1.2 Cavity-shape perturbation -- 6.1.3 Material perturbation -- 6.1.4 Wall-impedance perturbation -- 6.2 Cavity-perturbation Method -- 6.2.1 Measurement of permittivity and permeability -- 6.2.2 Resonant properties of sample-loaded cavities -- 6.2.3 Modification of cavity-perturbation method -- 6.2.4 Extracavity-perturbation method -- 6.3 Dielectric Resonator Perturbation Method -- 6.4 Measurement of Surface Impedance -- 6.4.1 Surface resistance and surface reactance -- 6.4.2 Measurement of surface resistance -- 6.4.3 Measurement of surface reactance -- 6.5 Near-field Microwave Microscope -- 6.5.1 Basic working principle -- 6.5.2 Tip-coaxial resonator -- 6.5.3 Open-ended coaxial resonator -- 6.5.4 Metallic waveguide cavity -- 6.5.5 Dielectric resonator -- References -- 7 Planar-circuit Methods -- 7.1 Introduction -- 7.1.1 Nonresonant methods -- 7.1.2 Resonant methods.

7.2 Stripline Methods -- 7.2.1 Nonresonant methods -- 7.2.2 Resonant methods -- 7.3 Microstrip Methods -- 7.3.1 Nonresonant methods -- 7.3.2 Resonant methods -- 7.4 Coplanar-line Methods -- 7.4.1 Nonresonant methods -- 7.4.2 Resonant methods -- 7.5 Permeance Meters for Magnetic Thin Films -- 7.5.1 Working principle -- 7.5.2 Two-coil method -- 7.5.3 Single-coil method -- 7.5.4 Electrical impedance method -- 7.6 Planar Near-field Microwave Microscopes -- 7.6.1 Working principle -- 7.6.2 Electric and magnetic dipole probes -- 7.6.3 Probes made from different types of planar transmission lines -- References -- 8 Measurement of Permittivity and Permeability Tensors -- 8.1 Introduction -- 8.1.1 Anisotropic dielectric materials -- 8.1.2 Anisotropic magnetic materials -- 8.2 Measurement of Permittivity Tensors -- 8.2.1 Nonresonant methods -- 8.2.2 Resonator methods -- 8.2.3 Resonant-perturbation method -- 8.3 Measurement of Permeability Tensors -- 8.3.1 Nonresonant methods -- 8.3.2 Faraday rotation methods -- 8.3.3 Resonator methods -- 8.3.4 Resonant-perturbation methods -- 8.4 Measurement of Ferromagnetic Resonance -- 8.4.1 Origin of ferromagnetic resonance -- 8.4.2 Measurement principle -- 8.4.3 Cavity methods -- 8.4.4 Waveguide methods -- 8.4.5 Planar-circuit methods -- References -- 9 Measurement of Ferroelectric Materials -- 9.1 Introduction -- 9.1.1 Perovskite structure -- 9.1.2 Hysteresis curve -- 9.1.3 Temperature dependence -- 9.1.4 Electric field dependence -- 9.2 Nonresonant Methods -- 9.2.1 Reflection methods -- 9.2.2 Transmission/reflection method -- 9.3 Resonant Methods -- 9.3.1 Dielectric resonator method -- 9.3.2 Cavity-perturbation method -- 9.3.3 Near-field microwave microscope method -- 9.4 Planar-circuit Methods -- 9.4.1 Coplanar waveguide method -- 9.4.2 Coplanar resonator method -- 9.4.3 Capacitor method.

9.4.4 Influence of biasing schemes -- 9.5 Responding Time of Ferroelectric Thin Films -- 9.6 Nonlinear Behavior and Power-Handling Capability of Ferroelectric Films -- 9.6.1 Pulsed signal method -- 9.6.2 Intermodulation method -- References -- 10 Microwave Measurement of Chiral Materials -- 10.1 Introduction -- 10.2 Free-space Method -- 10.2.1 Sample preparation -- 10.2.2 Experimental procedure -- 10.2.3 Calibration -- 10.2.4 Time-domain measurement -- 10.2.5 Computation of ε, µ, and β of the chiral composite samples -- 10.2.6 Experimental results for chiral composites -- 10.3 Waveguide Method -- 10.3.1 Sample preparation -- 10.3.2 Experimental procedure -- 10.3.3 Computation of ε, µ, and ξ of the chiral composite samples -- 10.3.4 Experimental results for chiral composites -- 10.4 Concluding Remarks -- References -- 11 Measurement of Microwave Electrical Transport Properties -- 11.1 Hall Effect and Electrical Transport Properties of Materials -- 11.1.1 Direct current Hall effect -- 11.1.2 Alternate current Hall effect -- 11.1.3 Microwave Hall effect -- 11.2 Nonresonant Methods for the Measurement of Microwave Hall Effect -- 11.2.1 Faraday rotation -- 11.2.2 Transmission method -- 11.2.3 Reflection method -- 11.2.4 Turnstile-junction method -- 11.3 Resonant Methods for the Measurement of the Microwave Hall Effect -- 11.3.1 Coupling between two orthogonal resonant modes -- 11.3.2 Hall effect of materials in MHE cavity -- 11.3.3 Hall effect of endplate of MHE cavity -- 11.3.4 Dielectric MHE resonator -- 11.3.5 Planar MHE resonator -- 11.4 Microwave Electrical Transport Properties of Magnetic Materials -- 11.4.1 Ordinary and extraordinary Hall effect -- 11.4.2 Bimodal cavity method -- 11.4.3 Bimodal dielectric probe method -- References -- 12 Measurement of Dielectric Properties of Materials at High Temperatures -- 12.1 Introduction.

12.1.1 Dielectric properties of materials at high temperatures.