X-Ray Scattering From Semiconductors.
Title:
X-Ray Scattering From Semiconductors.
Author:
Fewster, P F.
ISBN:
9781860944581
Personal Author:
Edition:
2nd ed.
Physical Description:
1 online resource (310 pages)
Contents:
Copyright -- Preface -- Contents -- 1 - An Introduction to Semiconductor Materials -- 2 - An Introduction to X-Ray Scattering -- 3 - Equipment for Measuring Diffraction Patterns -- 4 - A Practical Guide to the Evaluation of Structural Parameters -- Appendix 1 -- Subject Index.
Abstract:
This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.
Local Note:
Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2017. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.
Genre:
Electronic Access:
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