PREFACE -- ACKNOWLEDGMENTS -- CONTENTS -- CHAPTER A -- Accuracy (definition) -- Activation energy (definition and properties) -- Activator -- Adirovitch model -- Afterglow -- Aluminium oxide (Al2O3) -- Annealing (definition) -- Annealing (general considerations) -- Annealing procedures -- 1st procedure -- 2nd procedure -- Anomalous fading -- Anomalous thermal fading -- Area measurement methods (generality) -- Area measurement method (Maxia et al.) -- Area measurement methods (May and Partridge: general order) -- Area measurement method (Muntoni et al.: general order) -- Area measurement method (Moharil: general order) -- Area measurement method (Moharil: general order, s = s(T)) -- Area measurement method (Rasheedy: general order) -- Arrhenius equation -- Assessment of random uncertainties in precision of TL measurements (general) -- Atomic number (calculation) -- CHAPTER B -- Basic equation of radiation dosimetry by thermoluminescence -- Batch of TLDs -- Braunlich-Scharmann model -- CHAPTER C -- Calcium fluoride (CaF2) -- Calibration factor Fc (definition) -- Calibration factor Fc (procedures) -- 1st procedure -- 2nd procedure -- Competition -- Competitors -- Computerized glow curve deconvolution (CGCD): Kitis' expressions -- First-order expression -- Second order expression -- General order -- Condition at the maximum (first order) -- Condition at the maximum (first order): remarks -- Condition at the maximum (general order) -- Condition at the maximum (second order) -- Condition at the maximum when s'=s'(T) (second-order kinetics) -- Condition at the maximum when s"=s"(T) (general-order kinetics) -- Condition at the maximum when s=s(T) (first-order kinetics) -- Considerations on the heating rate -- Considerations on the methods for determining E -- Considerations on the symmetry factor, and the order of kinetics, b.

Correction factor for the beam quality, Fen (general) -- Curve fitting method (Kirsh: general order) -- CVD diamond -- CHAPTER D -- Defects -- The intrinsic or native defects. -- Extrinsic or impurity defects, like chemical impurities Y in a crystal X. -- Ionizing radiation produces further defects in alkali halides. -- Delocalized bands -- Determination of the dose by thermoluminescence -- Dihalides phosphors -- Dosimeter's background or zero dose reading (definition) -- Dosimeter's background or zero dose reading (procedure) -- Dosimetric peak -- Dosimetric trap -- CHAPTER E -- Effect of temperature lag on trapping parameters -- Energy dependence (procedure) -- Environmental dose rate (calculation) -- Environmental dose rate (correction factors) -- Correction in the fading experiment -- Correction in the environmental measurement -- Correction of the sensitivity factor, a. -- Erasing treatment -- Error sources in TLD measurements -- Sources of error due to the dosimeter -- Errors generated in the reader -- Errors due to the annealing procedures -- CHAPTER F -- Fading (theoretical aspects) -- Expressions related to different situations -- Fading factor -- Fading: useful expressions -- 1. Initial and instantaneous irradiation followed by fading at room temperature -- 2. Initial but not instantaneous irradiation, followed by fading at room temperature -- 3. The irradiation is carried out over all the experimental period -- 4. An initial and short irradiation is superposed to a background irradiation -- First-order kinetics when s=s(T) -- Fluorescence -- Fluorapatite (Ca5F(PO4)3) -- Frequency factor, s -- Frequency factor, s (errors in its determination) -- Frequency factor and pre-exponential factor expressions -- CHAPTER G -- Garlick-Gibson model (second-order kinetics) -- General characteristics of first and second order glow-peaks.

First order peaks -- Second order peaks -- General-order kinetics when s"-s"(T) -- Glow curve -- CHAPTER I -- In-vivo dosimetry (dose calibration factors) -- Entrance dose calibration factor -- Exit dose calibration factor -- Inflection points method (Land: first order) -- Inflection points method (Singh et al.: general order) -- Initial rise method when s =s(T) (Aramu et al.) -- Initialization procedure -- Integral approximation -- Integral approximation when S = S(T) -- Interactive traps -- Isothermal decay method (Garlick-Gibson: first order) -- Isothermal decay method (general) -- Isothermal decay method (May-Partridge: (a) general order) -- Isothermal decay method (May-Partridge : (b) general order) -- Isothermal decay method (Moharil: general order) -- Isothermal decay method (Takeuchi et al.: general order) -- CHAPTER K -- Keating method (first-order, s=s(T) ) -- Killer centers -- Kinetic parameters determination: observations -- Kinetics order: effects on the glow-curve shape -- CHAPTER L -- Linearization factor, Flin (general requirements for linearity) -- Linearity (procedure) -- Linearity test (procedure) -- Lithium borate (Li2B4O7) -- Lithium fluoride family (LiF) -- LiF: Mg, Ti -- LiF: Mg, Cu,P -- LiF: Cu2+ -- Localized energy levels -- Lower detection limit (Dldl) -- Luminescence (general) -- Luminescence (thermal stimulation) -- Luminescence centers -- Luminescence dosimetric techniques -- Luminescence dosimetry -- Luminescence efficiency -- Luminescence phenomena -- CHAPTER M -- Magnesium borate (MgO x nB2O3) -- Magnesium fluoride (MgF2) -- Magnesium orthosilicate (Mg2SiO4) -- May-Partridge model (general order kinetics) -- Mean and half-life of a trap -- Metastable state -- Method based on the temperature at the maximum (Randall-Wilkins) -- Method based on the temperature at the maximum (Urbach) -- Methods for checking the linearity.

Graphical method. -- UNI, IEC and IAEA methods. -- Regression analysis. -- Analysis of variance. -- Model of non-ideal heat transfer in TL measurements -- Multi-hit or multi-stage reaction models -- CHAPTER N -- Nonlinearity -- Non-ideal heat transfer in TL measurements (generality) -- Numerical curve fitting method (Mohan-Chen: first order) -- Numerical curve fitting methods (Mohan-Chen: second order) -- Numerical curve fitting method (Shenker-Chen: general order) -- CHAPTER O -- Optical bleaching -- Optical fading -- Oven (quality control) -- CHAPTER P-1 -- Partridge-May model (zero-order kinetics) -- Peak-shape method (Balarin: first- and second-order kinetics) -- Peak shape method (Chen: first- and second-order) -- Total half-width peak method -- High-temperature-side half peak -- Low-temperature side half peak -- Peak shape method (Chen: general-order kinetics) -- Peak shape method (Christodoulides: first- and general-order) -- Peak shape method (Gartia, Singh & Mazumdar: (b) general order) -- Peak shape method (Grossweiner: first order) -- Peak shape method (Halperin-Braner) -- Peak shape method (Lushchik: first and second order) -- Peak shape method (Mazumdar, Singh & Gartia: (a) general order) -- Peak shape method (parameters) -- Peak shape method when s=s(T). (Chen: first-, second- and general-order) -- Total half-width of a peak -- High-temperature side half peak -- Low-temperature side half peak -- Peak shape method: reliability expressions -- Grosswiener expressions given as a function of and w: -- Lushchik expressions given as a function of and w: -- Halperin-Braner expressions given as a function of and w: -- Grosswiener's modified expressions related to Chen's expressions -- Error analysis -- CHAPTER P-2 -- Peak shift -- Perovskite's family (ABX3) -- Phosphorescence -- Phosphors (definition) -- Photon energy response (calculation).

Photon energy response (definition) -- Phototransferred thermoluminescence (PTTL) (general) -- Phototransferred thermoluminescence (PTTL): model -- Post-irradiation annealing -- Post-readout annealing -- Precision and accuracy (general considerations) -- Random uncertainties -- Systematic uncertainties -- Precision concerning a group of TLDs of the same type submitted to one irradiation -- Precision concerning only one TLD undergoing repeated cycles of measurements (same dose) -- Precision concerning several identical dosimeters submitted to different doses -- Precision concerning several identical dosimeters undergoing repeated and equal irradiations (procedures) -- First procedure -- Second procedure -- Precision in TL measurements (definition) -- Pre-irradiation annealing -- Pre-readout annealing -- Properties of the maximum conditions -- CHAPTER Q -- Quasiequilibrium condition -- CHAPTER R -- Radiation-induced defects -- Randall-Wilkins model (first-order kinetics) -- Recombination center -- Recombination processes -- Reference and field dosimeters (definitions) -- Relative intrinsic sensitivity factor or individual correction factor Si (definition) -- Relative intrinsic sensitivity factor or individual correction factor Si (procedures) -- 1st procedure -- 2nd procedure -- 3rd procedure -- Residual TL signal -- Rubidium halide -- CHAPTER S -- Second-order kinetics when s'=s'(T) -- Self-dose in competition to fading (procedure) -- Sensitization (definition) -- Sensitivity (definition) -- Set up of a thermoluminescent dosimetric system (general requirements) -- Simultaneous determination of dose and time elapsed since irradiation -- Theoretical model -- Sodium pyrophosphate (Na4P2O7) -- Solid state dosimeters -- Solid state dosimetry -- Spurious thermoluminescence: chemiluminescence -- Spurious thermoluminescence: surface-related phenomena.

Spurious thermoluminescence: triboluminescence.