Front Cover -- Surfaces and their Measurement -- Copyright Page -- Contents -- Foreword -- Chapter 1. Introduction -- 1.1 General -- 1.2 What is surface metrology? -- 1.3 Usefulness of surfaces -- 1.4 Nature of surfaces -- Chapter 2. Identification and separation of surface features -- 2.1 Visualization -- 2.2 Profiles and roughness - understanding the measurement routine -- 2.3 Waviness -- 2.4 Implementing the concept of sampling length -- 2.5 The shape of the reference line -- 2.6 Other methods -- 2.7 Filtering and M system -- 2.8 Conclusions -- Chapter 3. Profile and areal (3D) parameter characterization -- 3.1 Specification -- 3.2 Classification of parameters for the profile -- 3.3 Random process analysis -- 3.4 Areal (3D) assessment -- 3.5 Space frequency functions -- 3.6 Comments on digital areal analysis -- 3.7 Two-dimensional filtering (areal filtering) -- 3.8 Fractal surfaces -- 3.9 Summary of characterization -- Chapter 4. Surface metrology and manufacture -- 4.1 Where and when to measure -- 4.2 The process and surface finish -- 4.3 Process control -- 4.4 Relationship between surface metrology and manufacture -- 4.5 Force and metrology loops -- 4.6 Unit events and autocorrelation -- 4.7 Use ofthe power spectrum -- 4.8 Application of space frequency functions -- 4.9 Conclusions -- Chapter 5. Function and surface texture -- 5.1 Generic approach -- 5.2 Some specific examples in tribology -- 5.3 Surface models -- 5.4 Summary of function -- Chapter 6. Surface finish measurement - general -- 6.1 Some quick ways of examining the surface -- 6.2 Surface finish instrumentation -- 6.3 Comments -- Chapter 7. Stylus instruments -- 7.1 The stylus -- 7.2 Reference -- 7.3 Use of skids -- 7.4 Pick-up systems -- 7.5 Stylus damage -- 7.6 Stylus instrument usage -- Chapter 8. Optical methods -- 8.1 Optical path length -- 8.2 Optical penetration.

8.3 Resolution and depth of focus -- 8.4 Comparison between optical and stylus methods -- 8.5 Gloss meters -- 8.6 Total integrating sphere -- 8.7 Diffractometer -- 8.8 Interferometry -- 8.9 Optical followers -- 8.10 Heterodyne method -- 8.11 Other optical methods -- 8.12 Conclusions from the comparison of tactile and optical methods -- Chapter 9. Scanning microscopes -- 9.1 General -- 9.2 Scanning microscopes -- 9.3 Operation of the STM -- 9.4 The atomic force microscope -- 9.5 Scanning microscopes: conclusions -- 9.6 Instruments 'horns of metrology' : conclusions -- Chapter 10. Errors of form (excluding axes of rotation) -- 10.1 General statement -- 10.2 Straightness and related topics -- 10.3 Measurement -- 10.4 Assessment and classification of straightness -- 10.5 Flatness -- 10.6 Conclusions -- Chapter 11. Roundness and related subjects -- 11.1 General -- 11.2 Direction of measurement -- 11.3 Display of roundness -- 11.4 Lobing -- 11.5 Methods of measuring roundness -- 11.6 Nature of the roundness signal -- 11.7 Assessment of roundness -- 11.8 Partial arc determination -- 11.9 Other parameters -- 11.10 Filtering for roundness -- 11.11 Harmonic problems -- 11.12 Alternatives to harmonic analysis -- 11.13 Non-roundness parameters -- 11.14 Conclusions -- Chapter 12. Cylindricity, sphericity -- 12.1 Cylindricity -- 12.2 Configurations for measurement -- 12.3 Some definitions of cylindrical parameters -- 12.4 Assessment -- 12.5 Other points on cylinders -- 12.6 Sphericity -- 12.7 Partial sphericity -- 12.8 Wankel - other shapes -- Chapter 13. Metrology instrument design and operation for minimum error -- 13.1 Introduction -- 13.2 Capability -- 13.3 Errors -- 13.4 Metrology instrument design and error reduction -- 13.5 Instrument usage -- 13.6 Elastic design - removal of hysteresis and friction errors -- 13.7 Workpiece cleaning and handling.

13.8 Conclusions -- Chapter 14. Calibration of instruments -- 14.1 General -- 14.2 The stylus calibration -- 14.3 Height calibration -- 14.4 General height -- 14.5 Roundness calibration - for height -- 14.6 Filter calibration (type C standard) -- 14.7 Vibrating tables -- 14.8 Instrument comparisons -- 14.9 Chain of standards -- 14.10 Conclusions -- Chapter 15. Sampling, numerical analysis, display -- 15.1 General -- 15.2 Numerical model -- 15.3 Sampling criteria -- 15.4 Error of application -- 15.5 Representation on drawing -- 15.6 Sample guides -- 15.7 Philosophical background to standards in roughness -- 15.8 Concluding remarks -- Glossary -- Index -- Color Plate Section.