Contents -- 1 Preliminaries -- 1.1 Elementary principles of phase-contrast microscopy -- 1.2 Instrumental requirements and modifications for high-resolution work -- 1.3 First experiments -- References -- 2 Electron Optics -- 2.1 The electron wavelength and relativity -- 2.2 Simple lens properties -- 2.3 The paraxial ray equation -- 2.4 The constant-field approximation -- 2.5 Projector lenses -- 2.6 The objective lens -- 2.7 Practical lens design -- 2.8 Aberrations -- 2.9 The pre-field -- References -- 3 Wave Optics -- 3.1 Propagation and Fresnel diffraction -- 3.2 Lens action and the diffraction limit -- 3.3 Wave and ray aberrations -- 3.4 Strong-phase and weak-phase objects -- 3.5 Optical and digital diffractograms -- References -- 4 Coherence and Fourier Optics -- 4.1 Independent electrons and computed images -- 4.2 Coherent and incoherent images and the damping envelopes -- 4.3 The characterization of coherence -- 4.4 Spatial coherence using hollow-cone illumination -- 4.5 The effect of source size on coherence -- 4.6 Coherence requirements in practice -- References -- 5 High-Resolution Images of Crystals and their Defects -- 5.1 The effect of lens aberrations on simple lattice fringes -- 5.2 The effect of beam divergence on depth of field for simple fringes -- 5.3 Approximations for the diffracted amplitudes -- 5.4 Images of crystals with variable spacing-spinodal decomposition and modulated structures -- 5.5 Are the atom images black or white? A simple symmetry argument -- 5.6 The multislice method and the polynomial solution -- 5.7 Bloch wave methods, bound states and 'symmetry reduction' of the dispersion matrix -- 5.8 Partial coherence effects in dynamical computations-beyond the product representation. Fourier images -- 5.9 Absorption effects -- 5.10 Dynamical forbidden reflections.

5.11 Computational algorithms and the relationship between them. Supercells and image patching -- 5.12 Sign conventions -- 5.13 Testing image-simulation programs. The accuracy of atom position determinations -- 5.14 Image interpretation in germanium-a case study -- 5.15 Images of defects in crystalline solids. HREM tomography -- References -- 6 HREM in Biology, Organic Crystals, and Radiation Damage -- 6.1 Phase and amplitude contrast -- 6.2 Single atoms in bright field -- 6.3 The use of higher accelerating voltage -- 6.4 Contrast and atomic number -- 6.5 Dark-field methods -- 6.6 Inelastic scattering -- 6.7 Molecular image simulation -- 6.8 Noise, information and the Rose equation -- 6.9 Molecular imaging in three dimensions-electron tomography -- 6.10 Electron crystallography of two-dimensional membrane protein crystals -- 6.11 Organic crystals -- 6.12 Radiation damage. Organics -- 6.13 Radiation damage. Inorganics -- References -- 7 Image Processing and Super-Resolution Schemes -- 7.1 Through-focus series. Coherent detection. Optimization. Error metrics -- 7.2 Tilt series, aperture synthesis -- 7.3 Off-axis electron holography for HREM -- 7.4 Aberration correction -- 7.5 Combining diffraction and image information -- 7.6 Ptychography, ronchigrams, shadow imaging, and in-line holography -- 7.7 Direct inversion from diffraction patterns -- 7.8 Atom lenses -- 7.9 Internal source holography and lensless (diffractive) imaging -- References -- 8 STEM and Z-contrast -- 8.1 Introduction. Lattice imaging in STEM -- 8.2 Coherence functions in STEM -- 8.3 Dark-field STEM. Incoherent imaging. Resolution limits -- 8.4 Multiple elastic scattering in STEM. Channelling -- 8.5 STEM Z-contrast. TDS. 3-D STEM tomography -- References -- 9 Electron Sources and Detectors -- 9.1 The illumination system -- 9.2 Brightness measurement.

9.3 Biasing and high-voltage stability -- 9.4 Hair-pin filaments -- 9.5 Lanthanum hexaboride sources -- 9.6 Field-emission sources. Degeneracy -- 9.7 Detectors. The charged-coupled device (CCD) camera -- 9.8 Image plates -- 9.9 Film -- 9.10 Video cameras and intensifiers -- References -- 10 Measurement of Electron-Optical Parameters -- 10.1 Objective-lens focus increments -- 10.2 Spherical aberration constant -- 10.3 Magnification calibration -- 10.4 Objective-lens current measurement -- 10.5 Chromatic aberration constant -- 10.6 Astigmatic difference. Three-fold astigmatism -- 10.7 Diffractogram measurements -- 10.8 Lateral coherence -- 10.9 Electron wavelength and camera length -- 10.10 Resolution -- References -- 11 Instabilities and the Microscope Environment -- 11.1 Magnetic fields -- 11.2 High-voltage instability -- 11.3 Vibration -- 11.4 Specimen movement -- 11.5 Contamination and the vacuum system -- 11.6 Pressure, temperature and drafts -- References -- 12 Experimental Methods -- 12.1 Astigmatism correction -- 12.2 Taking the picture -- 12.3 Finding and recording lattice fringes-an example -- 12.4 Adjusting the crystal orientation using non-eucentric specimen holders -- 12.5 Focusing techniques and auto-tuning -- 12.6 Substrate films -- 12.7 Photographic techniques and micrograph examination -- 12.8 Ancillary instrumentation for HREM -- 12.9 A checklist for high-resolution work -- References -- 13 Associated Techniques -- 13.1 X-ray microanalysis and 'ALCHEMI' -- 13.2 Electron energy loss spectroscopy (EELS) in STEM -- 13.3 Electron microdiffraction and CBED -- 13.4 Cathodoluminescence in STEM -- 13.5 Environmental HREM, HREM of surfaces, holography of fields and in-situ manipulation -- References -- Appendices -- Index -- A -- B -- C -- D -- E -- F -- G -- H -- I -- K -- L -- M -- N -- O -- P -- Q -- R -- S -- T -- U -- V -- W -- X -- Y.

Z.