Defects and Diffusion in Semicondutors, 2009 : An Annual Retrospective XI.
Title:
Defects and Diffusion in Semicondutors, 2009 : An Annual Retrospective XI.
Author:
Fisher, David J.
ISBN:
9783038132080
Personal Author:
Edition:
1st ed.
Physical Description:
1 online resource (160 pages)
Series:
Defect and Diffusion Forum ; v.282
Defect and Diffusion Forum
Contents:
Defects and Diffusion in Semicondutors, 2009 -- Table of Contents -- Structural and Electron-Hopping Studies of Pr and Nd Substituted La2/3Ba1/3MnO3 Manganites -- Recrystallization Annealing of Cold Rolled 9Cr 1Mo Ferritic Steel Containing Silicon -- Quantitative Concept for Morphological Stability Analysis of Liquid-Solid Interface in Rapid Solidification of Dilute Binary Alloys -- Studies of the Spin Hamiltonian Parameters for NiX2 and CdX2:Ni2+ (X=Cl, Br) -- Abstracts -- Keywords Index -- Authors Index.
Abstract:
This eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volume 272). As well as the 295 metals abstracts, the issue includes - in line with the new editorial policy of including original papers on all of the major material groups: "Structural and Electron-Hopping Studies of Pr- and Nd-Substituted La2/3Ba1/3MnO3 Manganites" (H.Abdullah and S.A.Halim), "Recrystallization Annealing of Cold-Rolled 9Cr-1Mo Ferritic Steel Containing Silicon" (M.N.Mungole, M.Surender, R.Balasubramaniam and S.Bhargava), "Quantitative Concept for Morphological Stability Analysis of Solid/Liquid Interface in Rapid Solidification of Dilute Binary Alloys" (M.Draissia), "Studies of the Spin Hamiltonian Parameters for NiX2 and CdX2:Ni2+ (X = Cl, Br) (Z.H.Zhang, S.Y.Wu, X.F.Wang and Y.X.Hu).
Local Note:
Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2017. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.
Genre:
Electronic Access:
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