Materials characterization techniques
Title:
Materials characterization techniques
Author:
Zhang, Sam.
ISBN:
9781420042948
Personal Author:
Publication Information:
Boca Raton : CRC Press, c2009.
Physical Description:
328 p. : ill. ; 25 cm.
Contents:
Contact angle in surface analysis -- X-ray photoelectron spectroscopy and Auger electron spectroscopy -- Scanning tunneling microscopy and atomic force microscopy -- X-ray diffraction -- Transmission electron microscopy -- Scanning electron microscopy -- Chromatographic methods -- Infrared spectroscopy and UV/Vis spectroscopy -- Macro and micro thermal analyses -- Laser confocal fluorescence microscopy.
Abstract:
"With an emphasis on practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement. The book reviews the most popular and powerful analysis and quality control tools, explaining the appropriate uses and related technical requirements. The text features coverage of a wide range of topics, including Auger electron spectroscopy, atomic force microscopy, transmission electron microscopy, gel electrophoresis chromatography, laser confocal scanning florescent microscopy, and UV spectroscopy."--Jacket.
Subject Term: