On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond
Title:
On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond
Author:
Rumiantsev, Andrej, author.
ISBN:
9788770221115
Personal Author:
Physical Description:
1 online resource (278 pages).
Series:
River publishers series in electronic materials and devices
River Publishers series in electronic materials and devices.
Local Note:
Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Subject Term:
Genre:
Electronic Access:
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