Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
Title:
Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
Author:
Guérin, Christopher J.
Personal Author:
Publication Information:
Cambridge, MA MyJoVE Corp 2016
Physical Description:
online resource (549 seconds)
Series:
Biology
General Note:
Title from resource description page
Abstract:
Here, we present a protocol for efficiently combining serial block face and focused ion beam scanning electron microscopy to target an area of interest. This allows for efficient searching, in three dimensions, and locating rare events in a large field of view.
Reading Level:
For undergraduate, graduate, and professional students
Subject Term:
Electronic Access:
https://www.jove.com/t/59480