Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Title:
Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Author:
Rubino, Stefano
Personal Author:
Publication Information:
Cambridge, MA MyJoVE Corp 2016
Physical Description:
online resource (654 seconds)
Series:
Biology
General Note:
Title from resource description page
Abstract:
Cryo Electron Microscopes, either Scanning (SEM) or Transmission (TEM), are widely used for characterization of biological samples or other materials with a high water content1. A SEM/Focused Ion Beam (FIB) is used to identify features of interest in samples and extract a thin, electron-transparent lamella for transfer to a cryo-TEM.
Reading Level:
For undergraduate, graduate, and professional students
Subject Term:
Electronic Access:
https://www.jove.com/t/51463