Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
Title:
Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
Author:
Knott, Graham
Personal Author:
Publication Information:
Cambridge, MA MyJoVE Corp 2016
Physical Description:
online resource (537 seconds)
Series:
Neuroscience
General Note:
Title from resource description page
Abstract:
This protocol describes how resin embedded brain tissue can be prepared and imaged in the three dimensions in the focussed ion beam, scanning electron microscope.
Reading Level:
For undergraduate, graduate, and professional students
Subject Term:
Electronic Access:
https://www.jove.com/t/2588