Source: Sina Shahbazmohamadi and Peiman Shahbeigi-Roodposhti-Roodposhti, School of Engineering, University of Connecticut, Storrs, CT As electron microscopes become more complex and widely used in research labs, it becomes more of a necessity to introduce their capabilities. Focused ion beam (FIB) is an instrument that can be employed in order to fabricate, trim, analyze and characterize materials on mico- and nano-scales in a wide variety of fields from nano-electronics to medicine. FIB systems can be thought of as a beam of ions that can be used to mill (sputter), deposit, and image materials on micro- and nano-scales. The ion columns of FIBs are commonly integrated with the electron columns of scanning electron microscopes (SEMs). The goal of this experiment is to introduce the state of the art in focused ion beam technologies and to show how these instruments can be used in order to fabricate structures that are as small as the smallest membranes that are found in the human body.