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Testing for small-delay defects in nanoscale CMOS integrated circuits
Title:
Testing for small-delay defects in nanoscale CMOS integrated circuits
Author:
Goel, Sandeep K., editor.
ISBN:
9781439829424

9781315217819
Physical Description:
1 online resource (xv, 247 pages) : illustrations
Series:
Devices, circuits, and systems

Devices, circuits, and systems.
Local Note:
O'Reilly
Subject Term:
Metal oxide semiconductors, Complementary -- Testing.

MOS complémentaires -- Essais.

TECHNOLOGY & ENGINEERING -- Mechanical.

Metal oxide semiconductors, Complementary -- Testing. (OCoLC)fst01017645
Added Author:
Goel, Sandeep K.,

Chakrabarty, Krishnendu,
Electronic Access:
https://go.oreilly.com/library-access/library/view/-/9781439829417/?ar
https://learning.oreilly.com/library/view/~/9781439829417/?ar
Holds: Copies:

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