Cover image for Aberration-Corrected Analytical Electron Microscopy of Transition Metal Nitride and Silicon Nitride Multilayers.
Aberration-Corrected Analytical Electron Microscopy of Transition Metal Nitride and Silicon Nitride Multilayers.
Title:
Aberration-Corrected Analytical Electron Microscopy of Transition Metal Nitride and Silicon Nitride Multilayers.
Author:
Fallqvist, Amie.
ISBN:
9789175194707
Personal Author:
Edition:
1st ed.
Physical Description:
1 online resource (44 pages)
Series:
Linköping Studies in Science and Technology. Thesis Series ; v.1628

Linköping Studies in Science and Technology. Thesis Series
Local Note:
Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2024. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.
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