Cover image for Analytical techniques for the characterization of compound semiconductors: proceedings of Symposium D on Analytical Techniques for the Characterization o Compound Semiconductors of the 1990 E-MRS fall Conference, Strasbourg, France, November 27-30, 1990
Analytical techniques for the characterization of compound semiconductors: proceedings of Symposium D on Analytical Techniques for the Characterization o Compound Semiconductors of the 1990 E-MRS fall Conference, Strasbourg, France, November 27-30, 1990
Title:
Analytical techniques for the characterization of compound semiconductors: proceedings of Symposium D on Analytical Techniques for the Characterization o Compound Semiconductors of the 1990 E-MRS fall Conference, Strasbourg, France, November 27-30, 1990
Author:
Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors (1990: Strasbourg, France)
ISBN:
9780444891969
Publication Information:
Amsterdam: North-Holland, c1991.
Physical Description:
xvi, 537 pages : illustrations ; 27 cm.
Series:
European Materials Research Society Symposia Proceedings; v.21

European Materials Research Society symposia proceedings; v. 21.
Holds: Copies: