Cover image for Testing complex and embedded systems
Testing complex and embedded systems
Title:
Testing complex and embedded systems
Author:
Pries, Kim H., 1955, author.
ISBN:
9781439821411

9781466533721
Physical Description:
1 online resource (xxxi, 287 pages)
General Note:
An Auerbach book.
Contents:
1. Does your testing look like this? -- 2. Benefits of improved testing -- 3. Overview -- 4. Basic principles -- 5. The question -- 6. Contradictory perspectives of testing -- 7. The use of noise -- 8. How to perform 'bad' tests -- 9. Documenting the testing -- 10. Test administration -- 11. Advanced concepts -- 12. Software test documentation -- 13. Configuration management -- 14. Software testing -- 15. Systems testing -- 16. Simulation and emulation -- 17. Span of tests -- 18. Exit criteria.
Abstract:
Using combinatorial approaches, this book aims to motivate testers and testing organizations to perform meaningful testing. The text details planning activities prior to testing, how to scope the work, and how to achieve a successful conclusion. Rather than presenting the entire continuum of testing for a particular product or design attribute, this volume focuses on boundary conditions. The authors provide various techniques that can be used to streamline testing and help identify problems before they occur, including turbocharge testing methods from Six Sigma. Coverage includes testing, simulation, and emulation-- Provided by publisher.
Added Author:
Electronic Access:
Click here to view.
Holds: Copies: