INTERNAL REFLECTION AND ATR SPECTROSCOPY -- CONTENTS -- PREFACE -- 1: Introduction to Spectroscopy -- 1.1 HISTORY -- 1.2 DEFINITION OF TRANSMITTANCE AND REFLECTANCE -- 1.3 THE SPECTROSCOPIC EXPERIMENT AND THE SPECTROMETER -- 1.4 PROPAGATION OF LIGHT THROUGH A MEDIUM -- 1.5 TRANSMITTANCE AND ABSORBANCE -- 1.6 S/N IN A SPECTROSCOPIC MEASUREMENT -- 2: Harmonic Oscillator Model for Optical Constants -- 2.1 HARMONIC OSCILLATOR MODEL FOR POLARIZABILITY -- 2.2 CLAUSIUS-MOSSOTTI EQUATION -- 2.3 REFRACTIVE INDEX -- 2.4 ABSORPTION INDEX AND CONCENTRATION -- 3: Propagation of Electromagnetic Energy -- 3.1 POYNTING VECTOR AND FLOW OF ELECTROMAGNETIC ENERGY -- 3.2 LINEAR MOMENTUM OF LIGHT -- 3.3 LIGHT ABSORPTION IN ABSORBING MEDIA -- 3.4 LAMBERT LAW AND MOLECULAR CROSS SECTION -- 4: Fresnel Equations -- 4.1 ELECTROMAGNETIC FIELDS AT THE INTERFACE -- 4.2 SNELL'S LAW -- 4.3 BOUNDARY CONDITIONS AT THE INTERFACE -- 4.4 FRESNEL FORMULAE -- 4.5 REFLECTANCE AND TRANSMITANCE OF INTERFACE -- 4.6 SNELL'S PAIRS -- 4.7 NORMAL INCIDENCE -- 4.8 BREWSTER'S ANGLE -- 4.9 THE CASE OF THE 45° ANGLE OF INCIDENCE -- 4.10 TOTAL INTERNAL REFLECTION -- 5: Evanescent Wave -- 5.1 EXPONENTIAL DECAY AND PENETRATION DEPTH -- 5.2 ENERGY FLOW AT A TOTALLY INTERNALLY REFLECTING INTERFACE -- 5.3 THE EVANESCENT WAVE IN ABSORBING MATERIALS -- 6: Electric Fields at a Totally Internally Reflecting Interface -- 6.1 EX, EY, AND EZ FOR S-POLARIZED INCIDENT LIGHT -- 6.2 EX, EY, AND EZ FOR P-POLARIZED INCIDENT LIGHT -- 7: Anatomy of ATR Absorption -- 7.1 ATTENUATED TOTAL REFLECTION (ATR) REFLECTANCE FOR S- AND P-POLARIZED BEAM -- 7.2 ABSORBANCE TRANSFORM OF ATR SPECTRA -- 7.3 WEAK ABSORPTION APPROXIMATION -- 7.4 SUPERCRITICAL REFLECTANCE AND ABSORPTION OF EVANESCENT WAVE -- 7.5 THE LEAKY INTERFACE MODEL -- 8: Effective Thickness -- 8.1 DEFINITION AND EXPRESSIONS FOR EFFECTIVE THICKNESS.

8.2 EFFECTIVE THICKNESS AND PENETRATION DEPTH -- 8.3 EFFECTIVE THICKNESS AND ATR SPECTROSCOPY -- 8.4 EFFECTIVE THICKNESS FOR STRONG ABSORPTIONS -- 9: Internal Reflectance nearCritical Angle -- 9.1 TRANSITION FROM SUBCRITICAL TO SUPERCRITICAL REFLECTION -- 9.2 EFFECTIVE THICKNESS AND REFRACTIVE INDEX OF SAMPLE -- 9.3 CRITICAL ANGLE AND REFRACTIVE INDEX OF SAMPLE -- 10: Depth Profiling -- 10.1 ENERGY ABSORPTION AT DIFFERENT DEPTHS -- 10.2 THIN ABSORBING LAYER ON A NONABSORBING SUBSTRATE -- 10.3 THIN NONABSORBING FILM ON AN ABSORBING SUBSTRATE -- 10.4 THIN NONABSORBING FILM ON A THIN ABSORBING FILM ON A NONABSORBING SUBSTRATE -- 11: Multiple Interfaces -- 11.1 REFLECTANCE AND TRANSMITTANCE OF A TWO-INTERFACE SYSTEM -- 11.2 VERY THIN FILMS -- 11.3 INTERFERENCE FRINGES -- 11.4 NORMAL INCIDENCE -- 11.5 INTERFERENCE FRINGES AND TRANSMISSION SPECTROSCOPY -- 11.6 THIN FILMS AND ATR -- 11.7 INTERNAL REFLECTION: SUBCRITICAL, SUPERCRITICAL, AND IN BETWEEN -- 11.8 UNUSUAL FRINGES -- 11.9 PENETRATION DEPTH REVISITED -- 11.10 REFLECTANCE AND TRANSMITTANCE OF A MULTIPLE INTERFACE SYSTEM -- 12: Metal Optics -- 12.1 ELECTROMAGNETIC FIELDS IN METALS -- 12.2 PLASMA -- 12.3 REFLECTANCE OF METAL SURFACES -- 12.4 THIN METAL FILMS ON TRANSPARENT SUBSTRATES -- 12.5 CURIOUS REFLECTANCE OF EXTREMELY THIN METAL FILMS -- 12.6 ATR SPECTROSCOPY THROUGH THIN METAL FILMS -- 13: Grazing Angle ATR (GAATR) Spectroscopy -- 13.1 ATTENUATED TOTAL REFLECTION (ATR) SPECTROSCOPY OF THIN FILMS ON SILICON SUBSTRATES -- 13.2 ENHANCEMENT FOR S- AND P-POLARIZED LIGHT -- 13.3 ENHANCEMENT AND FILM THICKNESS -- 13.4 ELECTRIC FIELDS IN A VERY THIN FILM ON A SI SUBSTRATE -- 13.5 SOURCE OF ENHANCEMENT -- 13.6 GAATR SPECTROSCOPY -- 14: Super Grazing Angle Reflection Spectroscopy (SuGARS) -- 14.1 REFLECTANCE OF THIN FILMS ON METAL SUBSTRATES -- 14.2 PROBLEM OF REFERENCE -- 14.3 SENSITIVITY ENHANCEMENT.

15: ATR Experiment -- 15.1 MULTIPLE REFLECTION ATTENUATED TOTAL REFLECTION (ATR) -- 15.2 FACET REFLECTIONS -- 15.3 BEAM SPREAD AND THE ANGLE OF INCIDENCE -- 15.4 EFFECT OF FACET SHAPE -- 15.5 BEAM SPREAD AND THE NUMBER OF REFLECTIONS IN MULTIPLE REFLECTION ATR -- 15.6 EFFECT OF BEAM ALIGNMENT ON MULTIPLE REFLECTION ATR -- 15.7 CHANGE IN THE REFRACTIVE INDEX OF THE SAMPLE DUE TO CONCENTRATION CHANGE -- 16: ATR Spectroscopy of Small Samples -- 16.1 BENEFITS OF ATTENUATED TOTAL REFLECTION (ATR) FOR MICROSAMPLING -- 16.2 CONTACT PROBLEM FOR SOLID SAMPLES -- 17: Surface Plasma Waves -- 17.1 EXCITATION OF SURFACE PLASMA WAVES -- 17.2 EFFECT OF METAL FILM THICKNESS ON REFLECTANCE -- 17.3 EFFECT OF THE REFRACTIVE INDEX OF METAL ON REFLECTANCE -- 17.4 EFFECT OF THE ABSORPTION INDEX OF METAL ON REFLECTANCE -- 17.5 USE OF PLASMONS FOR DETECTING MINUTE CHANGES OF THE REFRACTIVE INDEX OF MATERIALS -- 17.6 USE OF PLASMONS FOR DETECTING MINUTE CHANGES OF THE ABSORPTION INDEX OF MATERIALS -- 18: Extraction of Optical Constants of Materials from Experiments -- 18.1 EXTRACTION OF OPTICAL CONSTANTS FROM MULTIPLE EXPERIMENTS -- 18.2 KRAMERS-KRONIG RELATIONS -- 18.3 KRAMERS-KRONIG EQUATIONS FOR NORMAL INCIDENCE REFLECTANCE -- 19: ATR Spectroscopy of Powders -- 19.1 PROPAGATION OF LIGHT THROUGH INHOMOGENEOUS MEDIA -- 19.2 SPECTROSCOPIC ANALYSIS OF POWDERED SAMPLES -- 19.3 PARTICLE SIZE AND ABSORBANCE OF POWDERS -- 19.4 PROPAGATION OF EVANESCENT WAVE IN POWDERED MEDIA -- 20: Energy Flow at a Totally Internally Reflecting Interface -- 20.1 ENERGY CONSERVATION AT A TOTALLY REFLECTING INTERFACE -- 20.2 SPEED OF PROPAGATION AND THE FORMATION OF AN EVANESCENT WAVE -- 21: Orientation Studies and ATR Spectroscopy -- 21.2 ORIENTATION AND FIELD STRENGTHS IN ATTENUATED TOTAL REFLECTION (ATR) -- 21.1 ORIENTED FRACTION AND DICHROIC RATIO -- 22: Applications of ATR Spectroscopy.

22.1 SOLID SAMPLES -- 22.2 LIQUID SAMPLES -- 22.3 POWDERS -- 22.4 SURFACE-MODIFIED SOLID SAMPLES -- 22.5 HIGH SAMPLE THROUGHPUT ATR ANALYSIS -- 22.6 PROCESS AND REACTION MONITORING -- APPENDIX A: ATR Correction -- APPENDIX B: Quantification in ATR Spectroscopy -- INDEX -- CHEMICAL ANALYSIS.