Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Title:
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Author:
Cullis, A. G. editor.
ISBN:
9783540319153
Physical Description:
XVI, 540 p. online resource.
Series:
Springer Proceedings in Physics, 107
Contents:
Epitaxy: Wide Band-Gap Nitrides -- Epitaxy: Silicon-Germanium Alloys -- Epitaxy: Growth and Defect Phenomena -- High Resolution Microscopy and Nanoanalysis -- Self-Organised and Quantum Domain Structures -- Processed Silicon and Other Device Materials -- Device Studies -- Scanning Electron and Scanning Probe Advances.
Abstract:
This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/3-540-31915-8