Cover image for Single-Electron Devices and Circuits in Silicon.
Single-Electron Devices and Circuits in Silicon.
Title:
Single-Electron Devices and Circuits in Silicon.
Author:
Durrani, Zahid Ali Khan.
ISBN:
9781848164147
Personal Author:
Physical Description:
1 online resource (300 pages)
Contents:
Contents -- Preface -- 1. Introduction -- 1.1 Single-Electron Effects -- 1.2 Early Observations of Single-Electron Effects -- 1.3 Basic Single-Electron Devices -- 1.3.1 Single-electron transistor. -- 1.3.2 Single-electron box -- 1.3.3 Multiple-tunnel junction -- 1.4 Scope of This Book -- 1.4.1 Introduction to subsequent chapters -- 2. Single-Electron Charging Effects -- 2.1 Introduction -- 2.2 Single Tunnel Junction -- 2.3 The Single-Electron Box. -- 2.3.1 The 'critical charge'. -- 2.3.2 Electrostatic energy changes -- 2.3.3 Energy diagram for the single-electron box. -- 2.4 The Single-Electron Transistor -- 2.4.1 Electrostatic energy changes -- 2.4.2 Tunnelling rates. -- 2.4.3 Offset charge -- 2.4.4 Calculation of I-V characteristics. -- 2.4.5 The Coulomb staircase -- 2.4.6 Energy band diagrams -- 2.5 Quantum Dots -- 2.5.1 Coulomb oscillations in quantum dots. -- 2.6 The Multiple-Tunnel Junction -- 3. Single-Electron Transistors in Silicon -- 3.1 Early Observations -- 3.2 SETs in Crystalline Silicon -- 3.2.1 SETs with lithographically defined islands -- 3.2.1.1 Etched islands. -- 3.2.1.2 Pattern-dependant oxidation -- 3.2.2 SETs using MOSFET structures -- 3.2.3 Crystalline silicon nanowire SETs -- 3.2.4 Room temperature Coulomb oscillations with large peak-to- valley ratio -- 3.2.5 Fabrication and characterization of nanowire SETs -- 3.2.5.1 Fabrication -- 3.2.5.2 Electrical characterization -- 3.3 Single-Electron Transistors in Nanocrystalline Silicon -- 3.3.1 Conduction in continuous nanocrystalline silicon films -- 3.3.2 Nanocrystalline silicon nanowire SETs -- 3.3.3 Point-contact nc-Si SET: Room temperature operation. -- 3.3.4 'Grain-boundary' engineering -- 3.3.5 SETs using discrete silicon nanocrystals -- 3.3.6 Comparison with crystalline silicon SETs. -- 3.3.7 Electron coupling effects in nanocrystalline silicon.

3.3.7.1 Electrostatic coupling effects -- 3.3.7.2 Electron wavefunction coupling effects. -- 3.4 Single-Electron Effects in Grown Si Nanowires and Nanochains. -- 4. Single-Electron Memory -- 4.1 Introduction -- 4.1.1 Multiple-tunnel junction memory. -- 4.2 MTJ Memories in Silicon. -- 4.2.1 The single-electron detector. -- 4.3 Single- and Few-Electron Memories with Floating Gates -- 4.4 Large-scale Integrated Single-Electron Memory in Nanocrystalline Silicon -- 4.5 Few-Electron Memory with Integrated SET/MOSFET -- 4.5.1 Silicon nanowire SETs for L-SEM application -- 4.5.1.1 Nanowire SET in crystalline silicon. -- 4.5.1.2 Nanowire SET in polycrystalline silicon -- 4.5.1.3 Potential for mass fabrication -- 4.5.2 Single-gate L-SEM -- 4.5.2.1 Single-gate L-SEM fabrication and characterization -- 4.5.3 Split-gate L-SEM -- 4.5.4 L-SEM 3 × 3 cell array. -- 4.5.4.1 Memory cell selection -- 4.5.4.2 Temperature dependence of memory cell characteristics -- 5. Few-Electron Transfer Devices -- 5.1 Introduction -- 5.2 Single-Electron Turnstiles and Pumps -- 5.2.1 Single-electron turnstile -- 5.2.2 Single-electron pump -- 5.2.3 Single-electron pump and turnstile using a semiconductor quantum dot -- 5.3 Few-Electron Devices using MTJs. -- 5.3.1 Operation of single r.f. signal MTJ electron pump. -- 5.3.2 Single r.f. signal MTJ electron pumps in GaAs -- 5.3.3 Single r.f. signal MTJ electron pumps in silicon -- 5.3.3.1 Device fabrication and experimental Characteristics -- 5.3.4 MTJ electron pump with multi-phase r.f. signals. -- 5.4 Single-Electron Transfer Devices in Silicon -- 5.4.1 Single-electron transfer using a CCD -- 5.4.2 SET/MOSFET single-electron pump and turnstile -- 5.5 Metrological Applications -- 6. Single-Electron Logic Circuits -- 6.1 Introduction -- 6.2 Voltage State Logic -- 6.2.1 SET inverter with resistive load -- 6.2.2 Complementary SET inverter.

6.2.3 Complementary SET NAND and NOR gates -- 6.2.4 Programmable SET logic -- 6.2.5 Logic using SETs with multiple input terminals -- 6.2.6 Effect of offset charge -- 6.3 Charge State Logic -- 6.3.1 Binary decision diagram logic -- 6.3.1.1 Binary decision diagram logic: Basic logic gates -- 6.3.1.2 Implementation of BDD logic circuits in GaAs. -- 6.3.2 Implementation of BDD logic circuits in silicon. -- 6.3.2.1 Two-way BDD switch using silicon nanowire SETs. -- 6.3.2.2 Extension to a 'universal' three-way switch -- 6.4 Quantum Cellular Automaton Circuits. -- 6.5 Single-Electron Parametron -- Bibliography -- Index.
Abstract:
This book reviews research on single-electron devices and circuits in silicon. These devices provide a means to control electronic charge at the one-electron level and are promising systems for the development of few-electron, nanoscale electronic circuits. The book considers the design, fabrication, and characterization of single-electron transistors, single-electron memories, few-electron transfer devices such as electron pumps and turnstiles, and single-electron logic devices. A review of the many different approaches used for the experimental realisation of these devices is provided and devices developed during the author's own research are used as detailed examples. An introduction to the physics of single-electron charging effects is included. Sample Chapter(s). Chapter 1: Introduction (301 KB). Contents: Introduction; Single-Electron Charging Effects; Single-Electron Transistors in Silicon; Single-Electron Memory; Few-Electron Transfer Devices; Single-Electron Logic Circuits. Readership: Researchers, academics, and postgraduate students in nanoelectronics, nanofabrication, nanomaterials and nanostructures, quantum physics and electrical & electronic engineering.
Local Note:
Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2017. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.
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