Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Title:
Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Author:
Ho, Mon-Shu
Personal Author:
Publication Information:
Cambridge, MA MyJoVE Corp 2016
Physical Description:
online resource (838 seconds)
Series:
Engineering
General Note:
Title from resource description page
Abstract:
This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic simulation.
Reading Level:
For undergraduate, graduate, and professional students
Subject Term:
Electronic Access:
https://www.jove.com/t/54235