Cover image for Monte Carlo Modeling for Electron Microscopy and Microanalysis.
Monte Carlo Modeling for Electron Microscopy and Microanalysis.
Title:
Monte Carlo Modeling for Electron Microscopy and Microanalysis.
Author:
Joy, David C.
ISBN:
9780195358469
Personal Author:
Physical Description:
1 online resource (225 pages)
Series:
Oxford Series in Optical and Imaging Sciences ; v.9

Oxford Series in Optical and Imaging Sciences
Contents:
Contents -- 1. An Introduction to Monte Carlo Methods -- 1.1. Electron Beam Interaction-The Problem -- 1.2. The Monte Carlo Method -- 1.3. Brief History of Monte Carlo Modeling -- 1.4. About This Book -- 2. Constructing a Simulation -- 2.1. Introduction -- 2.2. Describing the Problem -- 2.3. Programming the Simulation -- 2.4. Reading a PASCAL Program -- 2.5. Running the Simulation -- 3. The Single Scattering Model -- 3.1. Introduction -- 3.2. Assumptions of the Single Scattering Model -- 3.3. The Single Scattering Model -- 3.4. The Single Scattering Monte Carlo Code -- 3.5. Notes on the Procedures and Functions Used in the Program -- 3.6. Running the Program -- 4. The Plural Scattering Model -- 4.1. Introduction -- 4.2. Assumptions of the Plural Scattering Model -- 4.3. The Plural Scattering Monte Carlo Code -- 4.4. Notes on the Procedures and Functions Used in the Program -- 4.5. Running the Program -- 5. The Practical Application of Monte Carlo Models -- 5.1. General Considerations -- 5.2. Which Type of Monte Carlo Model Should Be Used? -- 5.3. Customizing the Generic Programs -- 5.4. The "All Purpose" Program -- 5.5. The Applicability of Monte Carlo Techniques -- 6. Backscattered Electrons -- 6.1. Backscattered Electrons -- 6.2. Testing the Monte Carlo Models of Backscattering -- 6.3. Predictions of the Monte Carlo Models -- 6.4. Modeling Inhomogeneous Materials -- 6.5. Notes on the Program -- 6.6. Incorporating Detector Geometry and Efficiency -- 7. Charge Collection Microscopy and Cathodoluminescence -- 7.1. Introduction -- 7.2. The Principles of EBIC and C/L Image Formation -- 7.3. Monte Carlo Modeling of Charge Collection Microscopy -- 8. Secondary Electrons and Imaging -- 8.1. Introduction -- 8.2. First Principles-SE Models -- 8.3. The Fast Secondary Model -- 8.4. The Parametric Model -- 9. X-ray Production and Microanalysis.

9.1. Introduction -- 9.2. The Generation of Characteristic X-rays -- 9.3. The Generation of Continuum X-rays -- 9.4. X-ray Production in Thin Films -- 9.5. X-ray Production in Bulk Samples -- 10. What Next in Monte Carlo Simulations? -- 10.1. Improving the Monte Carlo Model -- 10.2. Faster Monte Carlo Modeling -- 10.3. Alternatives to Sequential Monte Carlo Modeling -- 10.4. Conclusions -- References -- Index -- A -- B -- C -- D -- E -- F -- G -- H -- I -- J -- K -- M -- N -- O -- P -- Q -- R -- S -- T -- U -- V -- W -- X.
Abstract:
1. Preface 2. An Introduction to Monte Carlo Methods 3. Constructing a Simulation 4. The Single Scattering Model 5. The Plural Scattering Model 6. Practical Applications of Monte Carlo Models 7. Backscattered Electrons 8. Charge Collection and Cathodoluminescence 9. Secondary Electrons and Imaging 10. X-Ray Production and Micro-Analysis 11. What Next in Monte Carlo Simulations?.
Local Note:
Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2017. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.
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