Surface contamination and cleaning
Title:
Surface contamination and cleaning
Author:
International Symposium on Surface Contamination and Cleaning (2001 : Newark, N.J.)
ISBN:
9781601192325
9789067643764
9789047403289
Publication Information:
Utrecht ; Boston : VSP, 2003-
Physical Description:
1 online resource : ill.
General Note:
Proceedings of the International Symposium on Surfase Contamination and Cleaning held under the aegis of MST Conferences in Newark. New Jersey, May 23-25, 2001.
Contents:
Preface; Mapping of surface contaminants by tunable infrared-laser imaging; Monitoring cleanliness and defining acceptable cleanliness levels; Tracking surface ionic contamination by ion chromatography; A new method using MESERAN technique for measuring surface contamination after solvent extraction; Methods for pharmaceutical cleaning validations; Influence of cleaning on the surface of model glasses and their sensitivity to organic contamination; Decontamination of sensitive equipment; The fundamentals of no-chemistry process cleaning
Abstract:
This work constitutes the proceedings of the International Symposium on Surface Contamination and Cleaning, held in 2001. It contains a total of 24 papers, covering topics such as: mapping of surface contaminants; acceptable cleanliness levels; ionic contamination; and particle removal.
Subject Term:
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Electronic Access:
Knovel http://app.knovel.com/web/toc.v/cid:kpSCCV0003