Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings
Title:
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings
Author:
Yeung, Dit-Yan. editor.
ISBN:
9783540372417
Physical Description:
XXI, 939 p. Also available online. online resource.
Series:
Lecture Notes in Computer Science, 4109
Contents:
Invited Talks -- SSPR -- Poster Papers -- SPR -- Poster Papers.
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/11815921