Encyclopedia of materials characterization surfaces, interfaces, thin films
Title:
Encyclopedia of materials characterization surfaces, interfaces, thin films
Author:
Brundle, C. R.
ISBN:
9781591245025
9780080523606
Publication Information:
Boston : Butterworth-Heinemann ; Greenwich, CT : Manning, c1992.
Physical Description:
1 online resource (xix, 751 p.) : ill.
Series:
Materials characterization series
Materials characterization series.
Contents:
Introduction and summaries -- Imaging techniques (Microscopy) -- Electron beam instruments -- Structure determination by diffraction and scattering -- Electron emission spectroscopies -- X-ray emission techniques -- Visible/UV emission, reflection, and absorption -- Vibrational spectroscopies and NMR -- Ion scattering techniques -- Mass and optical spectroscopies -- Neutron and nuclear techniques -- Physical and magnetic properties.
Abstract:
Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.
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Electronic Access:
Knovel http://app.knovel.com/web/toc.v/cid:kpEMCSITF4