Atomic and Nuclear Analytical Methods XRF, Mössbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques
Title:
Atomic and Nuclear Analytical Methods XRF, Mössbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques
Author:
Verma, H. R. author.
ISBN:
9783540302797
Personal Author:
Physical Description:
XIV, 376 p. 128 illus. online resource.
Contents:
X-ray Fluorescence (XRF) and Particle-Induced X-ray Emission (PIXE) -- Rutherford Backscattering Spectroscopy -- Elastic Recoil Detection -- Mössbauer Spectroscopy (MS) -- X-Ray Photoelectron Spectroscopy -- Neutron Activation Analysis -- Nuclear Reaction Analysis and Particle-Induced Gamma-Ray Emission -- Accelerator Mass Spectrometry (AMS).
Abstract:
This book is a blend of analytical methods based on the phenomenon of atomic and nuclear physics. It comprises comprehensive presentations about X-ray Fluorescence (XRF), Mössbauer Spectroscopy (MS), X-ray Photoelectron Spectroscopy (XPS), Neutron- Activation Analysis (NAA), Particle Induced X-ray Emission Analysis (PIXE), Rutherford Backscattering Analysis (RBS), Elastic Recoil Detection (ERD), Nuclear Reaction Analysis (NRA), Particle Induced Gamma-ray Emission Analysis (PIGE), and Accelerator Mass Spectrometry (AMS). These techniques are commonly applied in the fields of medicine, biology, environmental studies, archaeology or geology et al. and pursued in major international research laboratories.
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Electronic Access:
http://dx.doi.org/10.1007/978-3-540-30279-7