by
Demirhan, Yasemin.
Format:
Manuscript
Excerpt:
fabrication, the exact dimensions of the mesas were obtained using surface profilometer and atomic force
by
Köseoğlu, Hasan.
Format:
Manuscript
Excerpt:
, profilometer and SEM. We have investigated temperature dependence of c-axis resistivity and current-voltage
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by
Kes, Mürşide.
Format:
Manuscript
Excerpt:
obtained from AFM, profilometer and SEM measurements for the surfaces prepared with IPS Empress 2 veneer
by
Meriç, Zeynep.
Format:
Manuscript
Excerpt:
thickness measurement on a glass substrate with a surface profilometer. The analysis of data commented
by
Gülen, Sena, author.
Format:
Manuscript
Excerpt:
and porosity of the thin films are investigated by surface profilometer, XRD, UV-Visible Spectroscopy
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