Cover image for ISTFA2002 : Proceedings of the 28th International Symposium for Testing and Failure Analysis.
ISTFA2002 : Proceedings of the 28th International Symposium for Testing and Failure Analysis.
Title:
ISTFA2002 : Proceedings of the 28th International Symposium for Testing and Failure Analysis.
Author:
Boit, Christian.
ISBN:
9781615030774
Personal Author:
Physical Description:
1 online resource (713 pages)
Contents:
Preface -- Table of Contents -- IPFA Best Paper Award Winner -- Session 1: Advanced Techniques 1 -- Session 2: Advanced Techniques 2 -- Session 3: Metrology & Materials Analysis -- Session 4: Package Level Analysis 1 -- Session 5: Poster -- Session 6: MEMS -- Session 7: Sample Preparation 1 -- Session 8: Failure Analysis Process 1 -- Session 9: System Level Analysis 1 -- Session 10: Die Level Fault Isolation 1 -- Session 11: Discretes, Passive -- Session 12: SPM Techniques -- Session 13: Package Level Analysis 2 -- Session 14: Die Level Fault Isolation 2 -- Session 15: Yield Enhancement -- Session 16: System Level Analysis 2 -- Session 17: Optical Probing 1 -- Session 18: Sample Preparation 2 -- Session 19: Test -- Session 20: Optical Probing 2 -- Session 21: Failure Analysis Process 2 -- Author Index.
Local Note:
Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2017. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.
Electronic Access:
Click to View
Holds: Copies: