Also of Interest -- Title Page -- Copyright Page -- Preface -- Table of Contents -- Table for physical constants -- 1 Introduction -- 1.1 Characteristic of electron microscopy -- 1.2 What information can be obtained by electron microscopy? -- 1.3 Various types of electron microscopy -- 1.3.1 Transmission electron microscope -- 1.3.2 Electron diffraction -- 1.3.3 High-resolution electron microscope -- 1.3.4 Energy dispersive X-ray spectroscopy -- 1.3.5 Electron energy-loss spectroscopy EELS) -- 1.3.6 Energy filtering TEM (EF-TEM) -- 1.3.7 Lorentz microscopy -- 1.3.8 Electron holography -- 1.3.9 Cs corrected TEM -- 1.3.10 In-situ observation -- 1.3.11 Convergent beam electron diffraction CBED) -- 1.3.12 High-angle annular dark-field scanning transmission electron microscopy HAADF-STEM) -- 1.3.13 Scanning electron microscope -- Bibliography -- 2 Structure and principle of electron microscopes -- 2.1 Structure of transmission electron microscope -- 2.2 Observation mechanism of atoms by electrons -- 2.3 Information from electron diffraction pattern -- 2.4 High-resolution electron microscopy -- 2.4.1 Atomic species -- 2.4.2 Atomic position -- 2.4.3 Number of atoms -- 2.5 Scanning electron microscope -- 2.6 Electron energy-loss spectroscopy -- 2.7 Energy dispersive X-ray spectroscopy -- 2.8 High-angle annular dark-field scanning TEM -- 2.9 Electron holography and Lorentz microscopy -- 2.10 Image simulation -- Bibliography -- 3 Practice of HREM -- 3.1 Sample preparation -- 3.2 Specimen preparation methods -- 3.2.1 Crushing and powder -- 3.2.2 Ion milling -- 3.2.3 Electropolising -- 3.2.4 Focused ion beam method -- 3.2.5 Ultra microtome -- 3.3 Structure analysis by X-ray diffraction -- 3.4 TEM observation -- 3.5 HREM observation -- 3.6 Fourier filtering -- 3.7 Resolution of HREM images -- 3.8 Prevention of damage and contamination.

3.9 Taking images and reading data -- 3.10 Mental attitude for TEM -- Bibliography -- 4 Characterization by HREM -- 4.1 What information can be obtained? -- 4.2 Direct atomic observation -- 4.3 Crystallographic image processing -- 4.4 Comparison of HREM image with calculated images -- 4.5 Atomic coordinates from HREM image -- 4.6 Combination of HREM and electron diffraction -- 4.7 Quantitative HREM analysis with residual indices -- 4.8 Detection of atomic disordering by difference image -- 4.9 Combination of diffraction amplitudes and phases -- 4.10 Structural optimization by molecular orbital calculation -- 4.11 Three-dimensional high-resolution imaging -- 4.12 Detection of doping atoms in C60 solid clusters -- Bibliography -- 5 Electron diffraction analysis of nanostructured materials -- 5.1 Modulated superstructures of Tl-based copper oxides -- 5.2 Modulate structures of lanthanoid-based copper oxides -- 5.3 Oxygen ordering in YBa2Cu3O7-x -- 5.4 Structures of Bi-based copper oxides -- 5.5 Twin structures in BN nanoparticles -- Bibliography -- 6 HREM analysis of nanostructured materials -- 6.1 Defect structures -- 6.2 Interfaces and surface structures -- 6.3 GaAs-based semiconductor devices -- 6.4 Zeolite materials -- 6.5 Solid clusters and doping atoms -- 6.6 Surface structure with light elements -- 6.7 Crystal structures of Pb-based copper oxides -- 6.8 Structures of Sm-based copper oxides -- 6.9 Y-based copper oxides with high Jc -- 6.10 BN nanotubes -- 6.11 BN nanotubes with cup-stacked structures -- 6.12 BN nanotubes encaging Fe nanowires -- 6.13 Nanoparticles with 5-fold symmetry -- Bibliography -- A Appendix -- A.1 7 crystal systems and 14 Bravais lattices in three dimensions -- A.2 Miller indices and direction in the crystals -- A.3 Distances dhkl and angles φ of lattice planes -- Index.