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Fundamentals of Bias Temperature Instability in MOS Transistors Characterization Methods, Process and Materials Impact, DC and AC Modeling
Fundamentals of Bias Temperature Instability in MOS Transistors Characterization Methods, Process and Materials Impact, DC and AC Modeling
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Mahapatra, Souvik. editor.
https://doi.org/10.1007/978-81-322-2508-9
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Power Amplifiers for the S-, C-, X- and Ku-bands An EDA Perspective
Power Amplifiers for the S-, C-, X- and Ku-bands An EDA Perspective
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Božanić, Mladen. author.
https://doi.org/10.1007/978-3-319-28376-0
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