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Cooper, S.L.
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flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS): detection
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Bandyopadhyay, Amit.
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-- ACKNOWLEDGMENTS -- REFERENCES -- Chapter 4 - Surface Characterization of Biomaterials -- 4.1. X-RAY PHOTOELECTRON
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Favret, Eduardo A.
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. Electron Spectroscopies -- 4.1. UV Photoelectron Spectroscopy (UPS) -- 4.2. X-ray Photoelectron
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