Cover image for Atomic-force Microscopy and Its Applications
Atomic-force Microscopy and Its Applications
Title:
Atomic-force Microscopy and Its Applications
Author:
Tomasz Tański
ISBN:
intechopen.74139

9781789851700

9781789851694
Personal Author:
Publication Information:
IntechOpen 2019
Physical Description:
1 electronic resource (114 p.)
Abstract:
Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.
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