Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Title:
Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Author:
Asada, Takato
Personal Author:
Publication Information:
Cambridge, MA MyJoVE Corp 2016
Physical Description:
online resource (458 seconds)
Series:
Engineering
General Note:
Title from resource description page
Abstract:
As one of the important physical parameters in semiconductors, carrier lifetime is measured herein via a protocol employing the microwave photoconductivity decay method.
Reading Level:
For undergraduate, graduate, and professional students
Subject Term:
Electronic Access:
https://www.jove.com/t/59007