Cover image for Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Title:
Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Author:
Cao, Norman M.
Personal Author:
Publication Information:
Cambridge, MA MyJoVE Corp 2016
Physical Description:
online resource (406 seconds)
Series:
Engineering
General Note:
Title from resource description page
Abstract:
X-ray spectra provide a wealth of information on high temperature plasmas. This manuscript presents the operation of a high wavelength resolution spatially imaging X-ray spectrometer used to view hydrogen- and helium-like ions of medium atomic number elements in a tokamak plasma.
Reading Level:
For undergraduate, graduate, and professional students
Subject Term:
Electronic Access:
https://www.jove.com/t/54408
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