Built-in test for VLSI : pseudorandom techniques
Title:
Built-in test for VLSI : pseudorandom techniques
Author:
Bardell, Paul H.
Personal Author:
Publication Information:
New York : Wiley, ©1987.
Physical Description:
1 online resource (xiii, 354 pages) : illustrations
Local Note:
O'Reilly
Genre:
Holds: Copies: