Search Results for - Narrowed by: İzmir Institute of Technology. Electronics and Communication Engineering. - Thesis - Atomic force microscopy.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dAUTHOR$002509Author$002509$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002b$002bElectronics$002band$002bCommunication$002bEngineering.$002509$0025C4$0025B0zmir$002bInstitute$002bof$002bTechnology.$002b$002bElectronics$002band$002bCommunication$002bEngineering.$0026qf$003dITYPE$002509Material$002bType$0025091$00253ATEZ$002509Thesis$0026qf$003dSUBJECT$002509Subject$002509Atomic$002bforce$002bmicroscopy.$002509Atomic$002bforce$002bmicroscopy.$0026ps$003d300?2024-09-25T11:10:26ZAnalysis of cantilevers for high-speed atomic force microscopyent://SD_ILS/0/SD_ILS:20756722024-09-25T11:10:26Z2024-09-25T11:10:26Zby Brar, Harpreet Singh, author.<br/><a href="http://hdl.handle.net/11147/7010">Access to Electronic Versiyon.</a><br/>Format: Manuscript<br/>Nonlinear controller design for high speed dynamic atomic force microscope systement://SD_ILS/0/SD_ILS:21029702024-09-25T11:10:26Z2024-09-25T11:10:26Zby Coşar, Alper, author.<br/><a href="https://hdl.handle.net/11147/7212">Access to Electronic Versiyon.</a><br/>Format: Manuscript<br/>