Search Results for - Narrowed by: Ali, Moonis. editor. - Computation by Abstract Devices. - Pattern Recognition.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dAUTHOR$002509Author$002509Ali$00252C$002bMoonis.$002beditor.$002509Ali$00252C$002bMoonis.$002beditor.$0026qf$003dSUBJECT$002509Subject$002509Computation$002bby$002bAbstract$002bDevices.$002509Computation$002bby$002bAbstract$002bDevices.$0026qf$003dSUBJECT$002509Subject$002509Pattern$002bRecognition.$002509Pattern$002bRecognition.$0026ps$003d300?2024-09-27T10:03:46ZNew Frontiers in Applied Artificial Intelligence 21st International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2008 Wrocław, Poland, June 18-20, 2008 Proceedingsent://SD_ILS/0/SD_ILS:5027022024-09-27T10:03:46Z2024-09-27T10:03:46Zby Nguyen, Ngoc Thanh. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-69052-8">http://dx.doi.org/10.1007/978-3-540-69052-8</a><br/>Format: Electronic Resources<br/>New Trends in Applied Artificial Intelligence 20th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2007, Kyoto, Japan, June 26-29, 2007. Proceedingsent://SD_ILS/0/SD_ILS:5126382024-09-27T10:03:46Z2024-09-27T10:03:46Zby Okuno, Hiroshi G. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-73325-6">http://dx.doi.org/10.1007/978-3-540-73325-6</a><br/>Format: Electronic Resources<br/>Advances in Applied Artificial Intelligence 19th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2006, Annecy, France, June 27-30, 2006. Proceedingsent://SD_ILS/0/SD_ILS:5112762024-09-27T10:03:46Z2024-09-27T10:03:46Zby Ali, Moonis. editor.<br/><a href="http://dx.doi.org/10.1007/11779568">http://dx.doi.org/10.1007/11779568</a><br/>Format: Electronic Resources<br/>Innovations in Applied Artificial Intelligence 18th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2005, Bari, Italy, June 22-24, 2005. Proceedingsent://SD_ILS/0/SD_ILS:5102762024-09-27T10:03:46Z2024-09-27T10:03:46Zby Ali, Moonis. editor.<br/><a href="http://dx.doi.org/10.1007/b137656">http://dx.doi.org/10.1007/b137656</a><br/>Format: Electronic Resources<br/>