Search Results for - Narrowed by: Ho, Tin Kam. editor. - Springer Collection - Pattern Recognition. SirsiDynix Enterprise https://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dAUTHOR$002509Author$002509Ho$00252C$002bTin$002bKam.$002beditor.$002509Ho$00252C$002bTin$002bKam.$002beditor.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AONLINESPR$002509Springer$002bCollection$0026qf$003dSUBJECT$002509Subject$002509Pattern$002bRecognition.$002509Pattern$002bRecognition.$0026ps$003d300? 2024-09-27T10:36:10Z Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17&ndash;19, 2018, Proceedings ent://SD_ILS/0/SD_ILS:2085316 2024-09-27T10:36:10Z 2024-09-27T10:36:10Z by&#160;Bai, Xiao. editor.<br/><a href="https://doi.org/10.1007/978-3-319-97785-0">https://doi.org/10.1007/978-3-319-97785-0</a><br/>Format:&#160;Electronic Resources<br/> Data Complexity in Pattern Recognition ent://SD_ILS/0/SD_ILS:508420 2024-09-27T10:36:10Z 2024-09-27T10:36:10Z by&#160;Basu, Mitra. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-84628-172-3">http://dx.doi.org/10.1007/978-1-84628-172-3</a><br/>Format:&#160;Electronic Resources<br/>