Search Results for - Narrowed by: Kwok, James T. editor. - Springer Collection - Computational complexity. SirsiDynix Enterprise https://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dAUTHOR$002509Author$002509Kwok$00252C$002bJames$002bT.$002beditor.$002509Kwok$00252C$002bJames$002bT.$002beditor.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AONLINESPR$002509Springer$002bCollection$0026qf$003dSUBJECT$002509Subject$002509Computational$002bcomplexity.$002509Computational$002bcomplexity.$0026ps$003d300? 2024-06-23T10:52:36Z Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, SSPR &amp; SPR 2008, Orlando, USA, December 4-6, 2008. Proceedings ent://SD_ILS/0/SD_ILS:503826 2024-06-23T10:52:36Z 2024-06-23T10:52:36Z by&#160;Vitoria Lobo, Niels. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-89689-0">http://dx.doi.org/10.1007/978-3-540-89689-0</a><br/>Format:&#160;Electronic Resources<br/> Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings ent://SD_ILS/0/SD_ILS:511470 2024-06-23T10:52:36Z 2024-06-23T10:52:36Z by&#160;Yeung, Dit-Yan. editor.<br/><a href="http://dx.doi.org/10.1007/11815921">http://dx.doi.org/10.1007/11815921</a><br/>Format:&#160;Electronic Resources<br/>