Search Results for - Narrowed by: E-Book - IYTE Library - Systems engineering.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dITYPE$002509Material$002bType$0025091$00253AE-BOOKS$002509E-Book$0026qf$003dLIBRARY$002509Library$0025091$00253AIYTE$002509IYTE$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Systems$002bengineering.$002509Systems$002bengineering.$0026ps$003d300?2024-06-20T02:26:58ZEngineering intelligent systems : systems engineering and design with artificial intelligence, visual modeling, and systems thinkingent://SD_ILS/0/SD_ILS:23343502024-06-20T02:26:58Z2024-06-20T02:26:58Zby Brown, Barclay R., author.<br/><a href="https://learning.oreilly.com/library/view/~/9781119665595">https://learning.oreilly.com/library/view/~/9781119665595</a>
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<a href="https://go.oreilly.com/library-access/library/view/-/9781119665595/?ar">https://go.oreilly.com/library-access/library/view/-/9781119665595/?ar</a><br/>Format: Electronic Resources<br/>IBM z16 technical introductionent://SD_ILS/0/SD_ILS:23325772024-06-20T02:26:58Z2024-06-20T02:26:58Zby White, Bill (Telecommunications engineer), author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780738460499/?ar">https://go.oreilly.com/library-access/library/view/-/9780738460499/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9780738460499">https://learning.oreilly.com/library/view/~/9780738460499</a><br/>Format: Electronic Resources<br/>Introducing IBM Z System Recovery Boostent://SD_ILS/0/SD_ILS:23343812024-06-20T02:26:58Z2024-06-20T02:26:58Zby Houlbjerg, Jannie, author.<br/><a href="https://learning.oreilly.com/library/view/~/9780738460796">https://learning.oreilly.com/library/view/~/9780738460796</a>
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<a href="https://go.oreilly.com/library-access/library/view/-/9780738460796/?ar">https://go.oreilly.com/library-access/library/view/-/9780738460796/?ar</a><br/>Format: Electronic Resources<br/>MODEL-BASED SYSTEMS ARCHITECTING using cesam to architect complex systems.ent://SD_ILS/0/SD_ILS:23331882024-06-20T02:26:58Z2024-06-20T02:26:58Zby KROB, DANIEL.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781786308207/?ar">https://go.oreilly.com/library-access/library/view/-/9781786308207/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781786308207">https://learning.oreilly.com/library/view/~/9781786308207</a><br/>Format: Electronic Resources<br/>Systems Design : Building Systems that Drive Ideal Behavior.ent://SD_ILS/0/SD_ILS:23318842024-06-20T02:26:58Z2024-06-20T02:26:58Zby Allen, Brent R., editor.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781000562811/?ar">https://go.oreilly.com/library-access/library/view/-/9781000562811/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781000562811">https://learning.oreilly.com/library/view/~/9781000562811</a><br/>Format: Electronic Resources<br/>Optimal and robust state estimation : finite impulse response (FIR) and Kalman approachesent://SD_ILS/0/SD_ILS:23341522024-06-20T02:26:58Z2024-06-20T02:26:58Zby Shmaliy, Yuriy, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781119863076/?ar">https://go.oreilly.com/library-access/library/view/-/9781119863076/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781119863076/?ar">https://learning.oreilly.com/library/view/~/9781119863076/?ar</a><br/>Format: Electronic Resources<br/>PRODUCT MATURITY principles and illustrations.ent://SD_ILS/0/SD_ILS:23335102024-06-20T02:26:58Z2024-06-20T02:26:58Zby BAYLE, FRANCK.<br/><a href="https://learning.oreilly.com/library/view/~/9781786307408">https://learning.oreilly.com/library/view/~/9781786307408</a>
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<a href="https://learning.oreilly.com/library/view/~/9781786307408/?ar">https://learning.oreilly.com/library/view/~/9781786307408/?ar</a><br/>Format: Electronic Resources<br/>Data analytics : systems engineering - cybersecurity - project managementent://SD_ILS/0/SD_ILS:22750842024-06-20T02:26:58Z2024-06-20T02:26:58Zby Greco, Christopher, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=6457843">Click to View</a><br/>Format: Electronic Resources<br/>Process systems engineering for biofuels developmentent://SD_ILS/0/SD_ILS:23244022024-06-20T02:26:58Z2024-06-20T02:26:58Zby Bonilla-Petriciolet, Adrian, editor.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781119580270/?ar">https://go.oreilly.com/library-access/library/view/-/9781119580270/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781119580270">https://learning.oreilly.com/library/view/~/9781119580270</a><br/>Format: Electronic Resources<br/>Practical entity framework : database access for enterprise applications.ent://SD_ILS/0/SD_ILS:23254642024-06-20T02:26:58Z2024-06-20T02:26:58Zby Gorman, Brian L.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781484260449/?ar">https://go.oreilly.com/library-access/library/view/-/9781484260449/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781484260449/?ar">https://learning.oreilly.com/library/view/~/9781484260449/?ar</a><br/>Format: Electronic Resources<br/>Red Hat RHCSA 8 practice exament://SD_ILS/0/SD_ILS:23221462024-06-20T02:26:58Z2024-06-20T02:26:58Zby Vugt, Sander van, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780136552512/?ar">https://go.oreilly.com/library-access/library/view/-/9780136552512/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9780136552512/?ar">https://learning.oreilly.com/library/view/~/9780136552512/?ar</a><br/>Format: Electronic Resources<br/>IBM z15 configuration setupent://SD_ILS/0/SD_ILS:23260162024-06-20T02:26:58Z2024-06-20T02:26:58Zby Lascu, Octavian, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780738459004/?ar">https://go.oreilly.com/library-access/library/view/-/9780738459004/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9780738459004">https://learning.oreilly.com/library/view/~/9780738459004</a><br/>Format: Electronic Resources<br/>Meet the expert : Liz Fong-Jones on cultivating production excellenceent://SD_ILS/0/SD_ILS:23257522024-06-20T02:26:58Z2024-06-20T02:26:58Zby Fong-Jones, Liz, on-screen presenter.<br/><a href="https://go.oreilly.com/library-access/library/view/-/0636920431862/?ar">https://go.oreilly.com/library-access/library/view/-/0636920431862/?ar</a>
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<a href="https://learning.oreilly.com/videos/~/0636920431862">https://learning.oreilly.com/videos/~/0636920431862</a><br/>Format: Electronic Resources<br/>IBM z15 (8561) technical guideent://SD_ILS/0/SD_ILS:23246622024-06-20T02:26:58Z2024-06-20T02:26:58Zby Lascu, Octavian, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780738458120/?ar">https://go.oreilly.com/library-access/library/view/-/9780738458120/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9780738458120">https://learning.oreilly.com/library/view/~/9780738458120</a><br/>Format: Electronic Resources<br/>Introducing IBM Z System Recovery Boostent://SD_ILS/0/SD_ILS:23258382024-06-20T02:26:58Z2024-06-20T02:26:58Zby Lascu, Octavian, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780738459202/?ar">https://go.oreilly.com/library-access/library/view/-/9780738459202/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9780738459202">https://learning.oreilly.com/library/view/~/9780738459202</a><br/>Format: Electronic Resources<br/>IBM z15 (8562) Technical Guideent://SD_ILS/0/SD_ILS:23256542024-06-20T02:26:58Z2024-06-20T02:26:58Zby Lascu, Octavian, author.<br/><a href="https://learning.oreilly.com/library/view/~/9780738458991/?ar">https://learning.oreilly.com/library/view/~/9780738458991/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9780738458991">https://learning.oreilly.com/library/view/~/9780738458991</a><br/>Format: Electronic Resources<br/>IBM z15 Technical Introductionent://SD_ILS/0/SD_ILS:23239222024-06-20T02:26:58Z2024-06-20T02:26:58Zby White, Bill, author.<br/><a href="https://learning.oreilly.com/library/view/~/9780738458694/?ar">https://learning.oreilly.com/library/view/~/9780738458694/?ar</a>
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<a href="https://go.oreilly.com/library-access/library/view/-/9780738458694/?ar">https://go.oreilly.com/library-access/library/view/-/9780738458694/?ar</a><br/>Format: Electronic Resources<br/>Systems engineering in the fourth industrial revolution : big data, novel technologies, and modern systems engineeringent://SD_ILS/0/SD_ILS:23220702024-06-20T02:26:58Z2024-06-20T02:26:58Zby Kenett, Ron, editor.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781119513896/?ar">https://go.oreilly.com/library-access/library/view/-/9781119513896/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781119513896/?ar">https://learning.oreilly.com/library/view/~/9781119513896/?ar</a><br/>Format: Electronic Resources<br/>Introducing IBM Z System Recovery Boostent://SD_ILS/0/SD_ILS:23239632024-06-20T02:26:58Z2024-06-20T02:26:58Zby Lascu, Octavian, author.<br/><a href="https://learning.oreilly.com/library/view/~/9780738457994">https://learning.oreilly.com/library/view/~/9780738457994</a>
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<a href="https://go.oreilly.com/library-access/library/view/-/9780738457994/?ar">https://go.oreilly.com/library-access/library/view/-/9780738457994/?ar</a><br/>Format: Electronic Resources<br/>Systems engineering in the fourth industrial revolution : big data, novel technologies, and modern systems engineeringent://SD_ILS/0/SD_ILS:23579682024-06-20T02:26:58Z2024-06-20T02:26:58Zby Zonnenshain, Avigdor, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5993968">Click to View</a><br/>Format: Electronic Resources<br/>Systems engineering : a systemic and systematic methodology for solving complex problemsent://SD_ILS/0/SD_ILS:23559382024-06-20T02:26:58Z2024-06-20T02:26:58Zby Kasser, Joseph Eli, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5898072">Click to View</a><br/>Format: Electronic Resources<br/>Optimization for engineering problemsent://SD_ILS/0/SD_ILS:22735842024-06-20T02:26:58Z2024-06-20T02:26:58Zby Kumar, K. (Kaushik), 1968- editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5825596">Click to View</a><br/>Format: Electronic Resources<br/>IBM Z next technical guide introductionent://SD_ILS/0/SD_ILS:23224182024-06-20T02:26:58Z2024-06-20T02:26:58Zby White, Bill (Telecommunications engineer), author.<br/><a href="https://learning.oreilly.com/library/view/~/9780738458021/?ar">https://learning.oreilly.com/library/view/~/9780738458021/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780738458021/?ar">https://go.oreilly.com/library-access/library/view/-/9780738458021/?ar</a><br/>Format: Electronic Resources<br/>IBM z14 model ZR1 configuration setupent://SD_ILS/0/SD_ILS:23230882024-06-20T02:26:58Z2024-06-20T02:26:58Zby Lascu, Octavian, author.<br/><a href="https://learning.oreilly.com/library/view/~/9780738458212/?ar">https://learning.oreilly.com/library/view/~/9780738458212/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780738458212/?ar">https://go.oreilly.com/library-access/library/view/-/9780738458212/?ar</a><br/>Format: Electronic Resources<br/>Red Hat OpenShift fundamentals : LiveLessonsent://SD_ILS/0/SD_ILS:23214822024-06-20T02:26:58Z2024-06-20T02:26:58Zby Vugt, Sander van, on-screen presenter.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780135767436/?ar">https://go.oreilly.com/library-access/library/view/-/9780135767436/?ar</a>
<a href="https://learning.oreilly.com/videos/~/9780135767436/?ar">https://learning.oreilly.com/videos/~/9780135767436/?ar</a><br/>Format: Electronic Resources<br/>Optimization for engineering problemsent://SD_ILS/0/SD_ILS:23213002024-06-20T02:26:58Z2024-06-20T02:26:58Zby Kumar, K. (Kaushik), 1968- editor.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9781786304742/?ar">https://go.oreilly.com/library-access/library/view/-/9781786304742/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781786304742/?ar">https://learning.oreilly.com/library/view/~/9781786304742/?ar</a><br/>Format: Electronic Resources<br/>Red Hat Certified System Administratorent://SD_ILS/0/SD_ILS:23230212024-06-20T02:26:58Z2024-06-20T02:26:58Zby Vugt, Sander van, speaker.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780135656495/?ar">https://go.oreilly.com/library-access/library/view/-/9780135656495/?ar</a>
<a href="https://learning.oreilly.com/videos/~/9780135656495/?ar">https://learning.oreilly.com/videos/~/9780135656495/?ar</a><br/>Format: Electronic Resources<br/>Upgrading to Red Hat Enterprise Linux (RHEL) 8ent://SD_ILS/0/SD_ILS:23208592024-06-20T02:26:58Z2024-06-20T02:26:58Zby Vugt, Sander van, on-screen presenter.<br/><a href="https://learning.oreilly.com/videos/~/9780135657232/?ar">https://learning.oreilly.com/videos/~/9780135657232/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780135657232/?ar">https://go.oreilly.com/library-access/library/view/-/9780135657232/?ar</a><br/>Format: Electronic Resources<br/>SAFe 4.5 distilled : applying the Scaled Agile Framework for Lean enterprisesent://SD_ILS/0/SD_ILS:23170702024-06-20T02:26:58Z2024-06-20T02:26:58Zby Knaster, Richard, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780135171264/?ar">https://go.oreilly.com/library-access/library/view/-/9780135171264/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9780135171264/?ar">https://learning.oreilly.com/library/view/~/9780135171264/?ar</a><br/>Format: Electronic Resources<br/>Fan-Out Wafer-Level Packagingent://SD_ILS/0/SD_ILS:20864492024-06-20T02:26:58Z2024-06-20T02:26:58Zby Lau, John H. author.<br/><a href="https://doi.org/10.1007/978-981-10-8884-1">https://doi.org/10.1007/978-981-10-8884-1</a><br/>Format: Electronic Resources<br/>Design Techniques for Mash Continuous-Time Delta-Sigma Modulatorsent://SD_ILS/0/SD_ILS:20868492024-06-20T02:26:58Z2024-06-20T02:26:58Zby Liu, Qiyuan. author.<br/><a href="https://doi.org/10.1007/978-3-319-77225-7">https://doi.org/10.1007/978-3-319-77225-7</a><br/>Format: Electronic Resources<br/>Power Electronics Circuit Analysis and Designent://SD_ILS/0/SD_ILS:20866852024-06-20T02:26:58Z2024-06-20T02:26:58Zby Batarseh, Issa. author.<br/><a href="https://doi.org/10.1007/978-3-319-68366-9">https://doi.org/10.1007/978-3-319-68366-9</a><br/>Format: Electronic Resources<br/>Brain-Machine Interface Closed-loop Bidirectional System Designent://SD_ILS/0/SD_ILS:20872002024-06-20T02:26:58Z2024-06-20T02:26:58Zby Liu, Xilin. author.<br/><a href="https://doi.org/10.1007/978-3-319-67940-2">https://doi.org/10.1007/978-3-319-67940-2</a><br/>Format: Electronic Resources<br/>Circuits, Systems and Signal Processing A Tutorials Approachent://SD_ILS/0/SD_ILS:20867792024-06-20T02:26:58Z2024-06-20T02:26:58Zby Dutta Roy, Suhash Chandra. author.<br/><a href="https://doi.org/10.1007/978-981-10-6919-2">https://doi.org/10.1007/978-981-10-6919-2</a><br/>Format: Electronic Resources<br/>Simulation and Optimization of Digital Circuits Considering and Mitigating Destabilizing Factorsent://SD_ILS/0/SD_ILS:20866202024-06-20T02:26:58Z2024-06-20T02:26:58Zby Melikyan, Vazgen. author.<br/><a href="https://doi.org/10.1007/978-3-319-71637-4">https://doi.org/10.1007/978-3-319-71637-4</a><br/>Format: Electronic Resources<br/>ASIC/SoC Functional Design Verification A Comprehensive Guide to Technologies and Methodologiesent://SD_ILS/0/SD_ILS:20873432024-06-20T02:26:58Z2024-06-20T02:26:58Zby Mehta, Ashok B. author.<br/><a href="https://doi.org/10.1007/978-3-319-59418-7">https://doi.org/10.1007/978-3-319-59418-7</a><br/>Format: Electronic Resources<br/>Adapted Compressed Sensing for Effective Hardware Implementations A Design Flow for Signal-Level Optimization of Compressed Sensing Stagesent://SD_ILS/0/SD_ILS:20871062024-06-20T02:26:58Z2024-06-20T02:26:58Zby Mangia, Mauro. author.<br/><a href="https://doi.org/10.1007/978-3-319-61373-4">https://doi.org/10.1007/978-3-319-61373-4</a><br/>Format: Electronic Resources<br/>Contactless VLSI Measurement and Testing Techniquesent://SD_ILS/0/SD_ILS:20871092024-06-20T02:26:58Z2024-06-20T02:26:58Zby Sayil, Selahattin. author.<br/><a href="https://doi.org/10.1007/978-3-319-69673-7">https://doi.org/10.1007/978-3-319-69673-7</a><br/>Format: Electronic Resources<br/>Fundamentals of Electrical Circuit Analysisent://SD_ILS/0/SD_ILS:20871102024-06-20T02:26:58Z2024-06-20T02:26:58Zby Salam, Md. Abdus. author.<br/><a href="https://doi.org/10.1007/978-981-10-8624-3">https://doi.org/10.1007/978-981-10-8624-3</a><br/>Format: Electronic Resources<br/>Digital Storage in Consumer Electronics The Essential Guideent://SD_ILS/0/SD_ILS:20871192024-06-20T02:26:58Z2024-06-20T02:26:58Zby Coughlin, Thomas M. author.<br/><a href="https://doi.org/10.1007/978-3-319-69907-3">https://doi.org/10.1007/978-3-319-69907-3</a><br/>Format: Electronic Resources<br/>Seamless Healthcare Monitoring Advancements in Wearable, Attachable, and Invisible Devicesent://SD_ILS/0/SD_ILS:20874352024-06-20T02:26:58Z2024-06-20T02:26:58Zby Tamura, Toshiyo. editor.<br/><a href="https://doi.org/10.1007/978-3-319-69362-0">https://doi.org/10.1007/978-3-319-69362-0</a><br/>Format: Electronic Resources<br/>Reliable and Energy Efficient Streaming Multiprocessor Systemsent://SD_ILS/0/SD_ILS:20874362024-06-20T02:26:58Z2024-06-20T02:26:58Zby Das, Anup Kumar. author.<br/><a href="https://doi.org/10.1007/978-3-319-69374-3">https://doi.org/10.1007/978-3-319-69374-3</a><br/>Format: Electronic Resources<br/>Flight Systems and Control A Practical Approachent://SD_ILS/0/SD_ILS:20867262024-06-20T02:26:58Z2024-06-20T02:26:58Zby Ng, Tian Seng. author.<br/><a href="https://doi.org/10.1007/978-981-10-8721-9">https://doi.org/10.1007/978-981-10-8721-9</a><br/>Format: Electronic Resources<br/>Discrete-Time Sliding Mode Control for Networked Control Systement://SD_ILS/0/SD_ILS:20875402024-06-20T02:26:58Z2024-06-20T02:26:58Zby Shah, Dipesh H. author.<br/><a href="https://doi.org/10.1007/978-981-10-7536-0">https://doi.org/10.1007/978-981-10-7536-0</a><br/>Format: Electronic Resources<br/>Fault Tolerant Architectures for Cryptography and Hardware Securityent://SD_ILS/0/SD_ILS:20869072024-06-20T02:26:58Z2024-06-20T02:26:58Zby PATRANABIS, SIKHAR. editor.<br/><a href="https://doi.org/10.1007/978-981-10-1387-4">https://doi.org/10.1007/978-981-10-1387-4</a><br/>Format: Electronic Resources<br/>High-Resolution and High-Speed Integrated CMOS AD Converters for Low-Power Applicationsent://SD_ILS/0/SD_ILS:20877852024-06-20T02:26:58Z2024-06-20T02:26:58Zby Li, Weitao. author.<br/><a href="https://doi.org/10.1007/978-3-319-62012-1">https://doi.org/10.1007/978-3-319-62012-1</a><br/>Format: Electronic Resources<br/>On the Learnability of Physically Unclonable Functionsent://SD_ILS/0/SD_ILS:20880692024-06-20T02:26:58Z2024-06-20T02:26:58Zby Ganji, Fatemeh. author.<br/><a href="https://doi.org/10.1007/978-3-319-76717-8">https://doi.org/10.1007/978-3-319-76717-8</a><br/>Format: Electronic Resources<br/>Parasitic Substrate Coupling in High Voltage Integrated Circuits Minority and Majority Carriers Propagation in Semiconductor Substrateent://SD_ILS/0/SD_ILS:20879672024-06-20T02:26:58Z2024-06-20T02:26:58Zby Buccella, Pietro. author.<br/><a href="https://doi.org/10.1007/978-3-319-74382-0">https://doi.org/10.1007/978-3-319-74382-0</a><br/>Format: Electronic Resources<br/>Intelligent Embedded Systems Select Proceedings of ICNETS2, Volume IIent://SD_ILS/0/SD_ILS:20881382024-06-20T02:26:58Z2024-06-20T02:26:58Zby Thalmann, Daniel. editor.<br/><a href="https://doi.org/10.1007/978-981-10-8575-8">https://doi.org/10.1007/978-981-10-8575-8</a><br/>Format: Electronic Resources<br/>Application-Specific Hardware Architecture Design with VHDLent://SD_ILS/0/SD_ILS:20877972024-06-20T02:26:58Z2024-06-20T02:26:58Zby Belean, Bogdan. author.<br/><a href="https://doi.org/10.1007/978-3-319-65025-8">https://doi.org/10.1007/978-3-319-65025-8</a><br/>Format: Electronic Resources<br/>Handheld Total Chemical and Biological Analysis Systems Bridging NMR, Digital Microfluidics, and Semiconductorsent://SD_ILS/0/SD_ILS:20878032024-06-20T02:26:58Z2024-06-20T02:26:58Zby Lei, Ka-Meng. author.<br/><a href="https://doi.org/10.1007/978-3-319-67825-2">https://doi.org/10.1007/978-3-319-67825-2</a><br/>Format: Electronic Resources<br/>Energy-Efficient Smart Temperature Sensors in CMOS Technologyent://SD_ILS/0/SD_ILS:20878872024-06-20T02:26:58Z2024-06-20T02:26:58Zby Souri, Kamran. author.<br/><a href="https://doi.org/10.1007/978-3-319-62307-8">https://doi.org/10.1007/978-3-319-62307-8</a><br/>Format: Electronic Resources<br/>Low-Power Design and Power-Aware Verificationent://SD_ILS/0/SD_ILS:20878882024-06-20T02:26:58Z2024-06-20T02:26:58Zby Khondkar, Progyna. author.<br/><a href="https://doi.org/10.1007/978-3-319-66619-8">https://doi.org/10.1007/978-3-319-66619-8</a><br/>Format: Electronic Resources<br/>Pathological Elements in Analog Circuit Designent://SD_ILS/0/SD_ILS:20878202024-06-20T02:26:58Z2024-06-20T02:26:58Zby Fakhfakh, Mourad. editor.<br/><a href="https://doi.org/10.1007/978-3-319-75157-3">https://doi.org/10.1007/978-3-319-75157-3</a><br/>Format: Electronic Resources<br/>Physics of Semiconductor Devicesent://SD_ILS/0/SD_ILS:20878992024-06-20T02:26:58Z2024-06-20T02:26:58Zby Rudan, Massimo. author.<br/><a href="https://doi.org/10.1007/978-3-319-63154-7">https://doi.org/10.1007/978-3-319-63154-7</a><br/>Format: Electronic Resources<br/>Self-powered SoC Platform for Analysis and Prediction of Cardiac Arrhythmiasent://SD_ILS/0/SD_ILS:20864362024-06-20T02:26:58Z2024-06-20T02:26:58Zby Saleh, Hani. author.<br/><a href="https://doi.org/10.1007/978-3-319-63973-4">https://doi.org/10.1007/978-3-319-63973-4</a><br/>Format: Electronic Resources<br/>Metamaterial Surface Plasmon-Based Transmission Lines and Antennasent://SD_ILS/0/SD_ILS:20869382024-06-20T02:26:58Z2024-06-20T02:26:58Zby Kianinejad, Amin. author.<br/><a href="https://doi.org/10.1007/978-981-10-8375-4">https://doi.org/10.1007/978-981-10-8375-4</a><br/>Format: Electronic Resources<br/>Advances in Multirate Systemsent://SD_ILS/0/SD_ILS:20866512024-06-20T02:26:58Z2024-06-20T02:26:58Zby Dolecek, Gordana Jovanovic. editor.<br/><a href="https://doi.org/10.1007/978-3-319-59274-9">https://doi.org/10.1007/978-3-319-59274-9</a><br/>Format: Electronic Resources<br/>Invasive Computing for Mapping Parallel Programs to Many-Core Architecturesent://SD_ILS/0/SD_ILS:20865692024-06-20T02:26:58Z2024-06-20T02:26:58Zby Weichslgartner, Andreas. author.<br/><a href="https://doi.org/10.1007/978-981-10-7356-4">https://doi.org/10.1007/978-981-10-7356-4</a><br/>Format: Electronic Resources<br/>VLSI Design: Circuits, Systems and Applications Select Proceedings of ICNETS2, Volume Vent://SD_ILS/0/SD_ILS:20872692024-06-20T02:26:58Z2024-06-20T02:26:58Zby Li, Jie. editor.<br/><a href="https://doi.org/10.1007/978-981-10-7251-2">https://doi.org/10.1007/978-981-10-7251-2</a><br/>Format: Electronic Resources<br/>Radiation Hardened CMOS Integrated Circuits for Time-Based Signal Processingent://SD_ILS/0/SD_ILS:20869972024-06-20T02:26:58Z2024-06-20T02:26:58Zby Prinzie, Jeffrey. author.<br/><a href="https://doi.org/10.1007/978-3-319-78616-2">https://doi.org/10.1007/978-3-319-78616-2</a><br/>Format: Electronic Resources<br/>Computer Systems Digital Design, Fundamentals of Computer Architecture and Assembly Languageent://SD_ILS/0/SD_ILS:20872092024-06-20T02:26:58Z2024-06-20T02:26:58Zby Elahi, Ata. author.<br/><a href="https://doi.org/10.1007/978-3-319-66775-1">https://doi.org/10.1007/978-3-319-66775-1</a><br/>Format: Electronic Resources<br/>Inside Radio: An Attack and Defense Guideent://SD_ILS/0/SD_ILS:20846952024-06-20T02:26:58Z2024-06-20T02:26:58Zby Yang, Qing. author.<br/><a href="https://doi.org/10.1007/978-981-10-8447-8">https://doi.org/10.1007/978-981-10-8447-8</a><br/>Format: Electronic Resources<br/>Inkjet-Configurable Gate Array Towards Application Specific Printed Electronic Circuitsent://SD_ILS/0/SD_ILS:20864092024-06-20T02:26:58Z2024-06-20T02:26:58Zby Mashayekhi, Mohammad. author.<br/><a href="https://doi.org/10.1007/978-3-319-72116-3">https://doi.org/10.1007/978-3-319-72116-3</a><br/>Format: Electronic Resources<br/>Spectral, Convolution and Numerical Techniques in Circuit Theoryent://SD_ILS/0/SD_ILS:20868272024-06-20T02:26:58Z2024-06-20T02:26:58Zby Badrieh, Fuad. author.<br/><a href="https://doi.org/10.1007/978-3-319-71437-0">https://doi.org/10.1007/978-3-319-71437-0</a><br/>Format: Electronic Resources<br/>Embedded Flash Memory for Embedded Systems: Technology, Design for Sub-systems, and Innovationsent://SD_ILS/0/SD_ILS:20871312024-06-20T02:26:58Z2024-06-20T02:26:58Zby Hidaka, Hideto. editor.<br/><a href="https://doi.org/10.1007/978-3-319-55306-1">https://doi.org/10.1007/978-3-319-55306-1</a><br/>Format: Electronic Resources<br/>CMOS Integrated Circuit Design for Wireless Power Transferent://SD_ILS/0/SD_ILS:20867522024-06-20T02:26:58Z2024-06-20T02:26:58Zby Lu, Yan. author.<br/><a href="https://doi.org/10.1007/978-981-10-2615-7">https://doi.org/10.1007/978-981-10-2615-7</a><br/>Format: Electronic Resources<br/>Formation of KNbO3 Thin Films for Self-Powered ReRAM Devices and Artificial Synapsesent://SD_ILS/0/SD_ILS:20834612024-06-20T02:26:58Z2024-06-20T02:26:58Zby Lee, Tae-Ho. author.<br/><a href="https://doi.org/10.1007/978-981-13-2535-9">https://doi.org/10.1007/978-981-13-2535-9</a><br/>Format: Electronic Resources<br/>Physical Design and Mask Synthesis for Directed Self-Assembly Lithographyent://SD_ILS/0/SD_ILS:20838842024-06-20T02:26:58Z2024-06-20T02:26:58Zby Shim, Seongbo. author.<br/><a href="https://doi.org/10.1007/978-3-319-76294-4">https://doi.org/10.1007/978-3-319-76294-4</a><br/>Format: Electronic Resources<br/>Principles and Structures of FPGAsent://SD_ILS/0/SD_ILS:20842562024-06-20T02:26:58Z2024-06-20T02:26:58Zby Amano, Hideharu. editor.<br/><a href="https://doi.org/10.1007/978-981-13-0824-6">https://doi.org/10.1007/978-981-13-0824-6</a><br/>Format: Electronic Resources<br/>Managing 3D printing technologies for manufacturingent://SD_ILS/0/SD_ILS:22307872024-06-20T02:26:58Z2024-06-20T02:26:58Zby Chen, Tin-Chih Toly, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5430364">Click to View</a><br/>Format: Electronic Resources<br/>Equipment health monitoring in complex systemsent://SD_ILS/0/SD_ILS:21564622024-06-20T02:26:58Z2024-06-20T02:26:58Zby King, Stephen P., author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5430714">Click to View</a><br/>Format: Electronic Resources<br/>Creazione di valore e reporting integrato nell'evoluzione dei sistemi di controlloent://SD_ILS/0/SD_ILS:21234512024-06-20T02:26:58Z2024-06-20T02:26:58Zby Ferrando, Pier Maria, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5426642">Click to View</a><br/>Format: Electronic Resources<br/>Phase Change Memory Device Physics, Reliability and Applicationsent://SD_ILS/0/SD_ILS:20839432024-06-20T02:26:58Z2024-06-20T02:26:58Zby Redaelli, Andrea. editor.<br/><a href="https://doi.org/10.1007/978-3-319-69053-7">https://doi.org/10.1007/978-3-319-69053-7</a><br/>Format: Electronic Resources<br/>Quantitative systems pharmacology : models and model-based systems with applicationsent://SD_ILS/0/SD_ILS:22148882024-06-20T02:26:58Z2024-06-20T02:26:58Zby Manca, Davide, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5471097">Click to View</a><br/>Format: Electronic Resources<br/>Model-based system and architecture engineering with the arcadia methodent://SD_ILS/0/SD_ILS:22135582024-06-20T02:26:58Z2024-06-20T02:26:58Zby Voirin, Jean-Luc, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5162995">Click to View</a><br/>Format: Electronic Resources<br/>A systems approach to managing the complexities of process industriesent://SD_ILS/0/SD_ILS:22135462024-06-20T02:26:58Z2024-06-20T02:26:58Zby Salimi, Fabienne, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5162802">Click to View</a><br/>Format: Electronic Resources<br/>Process systems engineering for pharmaceutical manufacturingent://SD_ILS/0/SD_ILS:22142432024-06-20T02:26:58Z2024-06-20T02:26:58Zby Singh, Ravendra, editor.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5324014">Click to View</a><br/>Format: Electronic Resources<br/>Hands-on Experience with Altera FPGA Development Boardsent://SD_ILS/0/SD_ILS:20862272024-06-20T02:26:58Z2024-06-20T02:26:58Zby Parab, Jivan S. author.<br/><a href="https://doi.org/10.1007/978-81-322-3769-3">https://doi.org/10.1007/978-81-322-3769-3</a><br/>Format: Electronic Resources<br/>Fog Computing in the Internet of Things Intelligence at the 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editor.<br/><a href="https://doi.org/10.1007/978-3-319-67295-3">https://doi.org/10.1007/978-3-319-67295-3</a><br/>Format: Electronic Resources<br/>5G and E-Band Communication Circuits in Deep-Scaled CMOSent://SD_ILS/0/SD_ILS:20883702024-06-20T02:26:58Z2024-06-20T02:26:58Zby Vigilante, Marco. author.<br/><a href="https://doi.org/10.1007/978-3-319-72646-5">https://doi.org/10.1007/978-3-319-72646-5</a><br/>Format: Electronic Resources<br/>Microwave, Radar & RF Engineering With Laboratory Manualent://SD_ILS/0/SD_ILS:20875202024-06-20T02:26:58Z2024-06-20T02:26:58Zby Chaturvedi, Prakash Kumar. author.<br/><a href="https://doi.org/10.1007/978-981-10-7965-8">https://doi.org/10.1007/978-981-10-7965-8</a><br/>Format: Electronic Resources<br/>Energy Harvesting for Self-Powered Wearable Devicesent://SD_ILS/0/SD_ILS:20881862024-06-20T02:26:58Z2024-06-20T02:26:58Zby Alhawari, Mohammad. author.<br/><a href="https://doi.org/10.1007/978-3-319-62578-2">https://doi.org/10.1007/978-3-319-62578-2</a><br/>Format: Electronic Resources<br/>Internet-of-Things (IoT) Systems Architectures, Algorithms, Methodologiesent://SD_ILS/0/SD_ILS:20881872024-06-20T02:26:58Z2024-06-20T02:26:58Zby Serpanos, Dimitrios. author.<br/><a href="https://doi.org/10.1007/978-3-319-69715-4">https://doi.org/10.1007/978-3-319-69715-4</a><br/>Format: Electronic Resources<br/>IBM z14 technical guideent://SD_ILS/0/SD_ILS:23157422024-06-20T02:26:58Z2024-06-20T02:26:58Zby Lascu, Octavian, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780738442716/?ar">https://go.oreilly.com/library-access/library/view/-/9780738442716/?ar</a>
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href="https://doi.org/10.1007/978-3-319-21293-7">https://doi.org/10.1007/978-3-319-21293-7</a><br/>Format: Electronic Resources<br/>Practical Electrical Engineeringent://SD_ILS/0/SD_ILS:20872982024-06-20T02:26:58Z2024-06-20T02:26:58Zby N. Makarov, Sergey. author.<br/><a href="https://doi.org/10.1007/978-3-319-21173-2">https://doi.org/10.1007/978-3-319-21173-2</a><br/>Format: Electronic Resources<br/>Multiband RF Circuits and Techniques for Wireless Transmittersent://SD_ILS/0/SD_ILS:20868212024-06-20T02:26:58Z2024-06-20T02:26:58Zby Chen, Wenhua. author.<br/><a href="https://doi.org/10.1007/978-3-662-50440-6">https://doi.org/10.1007/978-3-662-50440-6</a><br/>Format: Electronic Resources<br/>Efficient Sensor Interfaces, Advanced Amplifiers and Low Power RF Systems Advances in Analog Circuit Design 2015ent://SD_ILS/0/SD_ILS:20873122024-06-20T02:26:58Z2024-06-20T02:26:58Zby Makinwa, Kofi A.A. editor.<br/><a href="https://doi.org/10.1007/978-3-319-21185-5">https://doi.org/10.1007/978-3-319-21185-5</a><br/>Format: Electronic Resources<br/>Engineering Applications of FPGAs Chaotic Systems, Artificial Neural Networks, Random Number Generators, and Secure Communication Systemsent://SD_ILS/0/SD_ILS:20877442024-06-20T02:26:58Z2024-06-20T02:26:58Zby Tlelo-Cuautle, Esteban. author.<br/><a href="https://doi.org/10.1007/978-3-319-34115-6">https://doi.org/10.1007/978-3-319-34115-6</a><br/>Format: Electronic Resources<br/>Fault-Tolerant Digital Microfluidic Biochips Compilation and Synthesisent://SD_ILS/0/SD_ILS:20874682024-06-20T02:26:58Z2024-06-20T02:26:58Zby Pop, Paul. author.<br/><a href="https://doi.org/10.1007/978-3-319-23072-6">https://doi.org/10.1007/978-3-319-23072-6</a><br/>Format: Electronic Resources<br/>3D Stacked Chips From Emerging Processes to Heterogeneous Systemsent://SD_ILS/0/SD_ILS:20874722024-06-20T02:26:58Z2024-06-20T02:26:58Zby Elfadel, Ibrahim (Abe) M. editor.<br/><a href="https://doi.org/10.1007/978-3-319-20481-9">https://doi.org/10.1007/978-3-319-20481-9</a><br/>Format: Electronic Resources<br/>Make: FPGAs : turning software into hardware with eight fun and easy DIY projects.ent://SD_ILS/0/SD_ILS:23099842024-06-20T02:26:58Z2024-06-20T02:26:58Zby Romano, David, author.<br/><a href="https://learning.oreilly.com/library/view/~/9781457187841">https://learning.oreilly.com/library/view/~/9781457187841</a>
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href="https://doi.org/10.1007/978-3-319-27392-1">https://doi.org/10.1007/978-3-319-27392-1</a><br/>Format: Electronic Resources<br/>Software Design for Resilient Computer Systemsent://SD_ILS/0/SD_ILS:20871352024-06-20T02:26:58Z2024-06-20T02:26:58Zby Schagaev, Igor. author.<br/><a href="https://doi.org/10.1007/978-3-319-29465-0">https://doi.org/10.1007/978-3-319-29465-0</a><br/>Format: Electronic Resources<br/>Signal Integrity Applied Electromagnetics and Professional Practiceent://SD_ILS/0/SD_ILS:20867542024-06-20T02:26:58Z2024-06-20T02:26:58Zby Russ, Samuel H. author.<br/><a href="https://doi.org/10.1007/978-3-319-29758-3">https://doi.org/10.1007/978-3-319-29758-3</a><br/>Format: Electronic Resources<br/>Millimeter-Wave Antennas: Configurations and Applicationsent://SD_ILS/0/SD_ILS:20866822024-06-20T02:26:58Z2024-06-20T02:26:58Zby du Preez, Jaco. author.<br/><a href="https://doi.org/10.1007/978-3-319-35068-4">https://doi.org/10.1007/978-3-319-35068-4</a><br/>Format: Electronic Resources<br/>Advanced Microsystems for Automotive Applications 2016 Smart Systems for the Automobile of the Futureent://SD_ILS/0/SD_ILS:20874312024-06-20T02:26:58Z2024-06-20T02:26:58Zby Schulze, Tim. editor.<br/><a href="https://doi.org/10.1007/978-3-319-44766-7">https://doi.org/10.1007/978-3-319-44766-7</a><br/>Format: Electronic Resources<br/>Runtime Reconfiguration in Networked Embedded Systems Design and Testing Practicesent://SD_ILS/0/SD_ILS:20874332024-06-20T02:26:58Z2024-06-20T02:26:58Zby Papp, Zoltan. editor.<br/><a href="https://doi.org/10.1007/978-981-10-0715-6">https://doi.org/10.1007/978-981-10-0715-6</a><br/>Format: Electronic Resources<br/>Digital Logic Design Using Verilog Coding and RTL Synthesisent://SD_ILS/0/SD_ILS:20870932024-06-20T02:26:58Z2024-06-20T02:26:58Zby Taraate, Vaibbhav. author.<br/><a href="https://doi.org/10.1007/978-81-322-2791-5">https://doi.org/10.1007/978-81-322-2791-5</a><br/>Format: Electronic Resources<br/>Techniques for Building Timing-Predictable Embedded Systemsent://SD_ILS/0/SD_ILS:20867042024-06-20T02:26:58Z2024-06-20T02:26:58Zby Guan, Nan. author.<br/><a href="https://doi.org/10.1007/978-3-319-27198-9">https://doi.org/10.1007/978-3-319-27198-9</a><br/>Format: Electronic Resources<br/>On-Chip Power Delivery and Managementent://SD_ILS/0/SD_ILS:20878352024-06-20T02:26:58Z2024-06-20T02:26:58Zby Vaisband, Inna P. author.<br/><a href="https://doi.org/10.1007/978-3-319-29395-0">https://doi.org/10.1007/978-3-319-29395-0</a><br/>Format: Electronic Resources<br/>Parallel Power Electronics Filters in Three-Phase Four-Wire Systems Principle, Control and Designent://SD_ILS/0/SD_ILS:20875932024-06-20T02:26:58Z2024-06-20T02:26:58Zby Wong, Man-Chung. author.<br/><a href="https://doi.org/10.1007/978-981-10-1530-4">https://doi.org/10.1007/978-981-10-1530-4</a><br/>Format: Electronic Resources<br/>Principles of Performance and Reliability Modeling and Evaluation Essays in Honor of Kishor Trivedi on his 70th Birthdayent://SD_ILS/0/SD_ILS:20875992024-06-20T02:26:58Z2024-06-20T02:26:58Zby Fiondella, Lance. editor.<br/><a href="https://doi.org/10.1007/978-3-319-30599-8">https://doi.org/10.1007/978-3-319-30599-8</a><br/>Format: Electronic Resources<br/>Reversible and Quantum Circuits Optimization and Complexity Analysisent://SD_ILS/0/SD_ILS:20882452024-06-20T02:26:58Z2024-06-20T02:26:58Zby Abdessaied, Nabila. author.<br/><a href="https://doi.org/10.1007/978-3-319-31937-7">https://doi.org/10.1007/978-3-319-31937-7</a><br/>Format: Electronic Resources<br/>CMOS Indoor Light Energy Harvesting System for Wireless Sensing Applicationsent://SD_ILS/0/SD_ILS:20883432024-06-20T02:26:58Z2024-06-20T02:26:58Zby Ferreira Carvalho, Carlos Manuel. author.<br/><a href="https://doi.org/10.1007/978-3-319-21617-1">https://doi.org/10.1007/978-3-319-21617-1</a><br/>Format: Electronic Resources<br/>Secure System Design and Trustable Computingent://SD_ILS/0/SD_ILS:20875142024-06-20T02:26:58Z2024-06-20T02:26:58Zby Chang, Chip-Hong. editor.<br/><a href="https://doi.org/10.1007/978-3-319-14971-4">https://doi.org/10.1007/978-3-319-14971-4</a><br/>Format: Electronic Resources<br/>Long Term Evolution 4G and Beyondent://SD_ILS/0/SD_ILS:20883642024-06-20T02:26:58Z2024-06-20T02:26:58Zby Paradisi, Alberto. editor.<br/><a href="https://doi.org/10.1007/978-3-319-23823-4">https://doi.org/10.1007/978-3-319-23823-4</a><br/>Format: Electronic Resources<br/>Near Threshold Computing Technology, Methods and Applicationsent://SD_ILS/0/SD_ILS:20875232024-06-20T02:26:58Z2024-06-20T02:26:58Zby Hübner, Michael. editor.<br/><a href="https://doi.org/10.1007/978-3-319-23389-5">https://doi.org/10.1007/978-3-319-23389-5</a><br/>Format: Electronic Resources<br/>Leadership in Chaordic Organizationsent://SD_ILS/0/SD_ILS:23134582024-06-20T02:26:58Z2024-06-20T02:26:58Zby McCarter, Beverly G., author<br/><a href="https://learning.oreilly.com/library/view/~/9781420074185/?ar">https://learning.oreilly.com/library/view/~/9781420074185/?ar</a>
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<a href="https://learning.oreilly.com/library/view/~/9781466579927">https://learning.oreilly.com/library/view/~/9781466579927</a><br/>Format: Electronic Resources<br/>Foundations of software and system performance engineering : process, performance modeling, requirements, testing, scalability, and practiceent://SD_ILS/0/SD_ILS:23041392024-06-20T02:26:58Z2024-06-20T02:26:58Zby Bondi, André B.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780133038149/?ar">https://go.oreilly.com/library-access/library/view/-/9780133038149/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9780133038149/?ar">https://learning.oreilly.com/library/view/~/9780133038149/?ar</a><br/>Format: Electronic Resources<br/>IBM z13 technical guideent://SD_ILS/0/SD_ILS:23071482024-06-20T02:26:58Z2024-06-20T02:26:58Zby Lascu, Octavian, author.<br/><a href="https://learning.oreilly.com/library/view/~/9780738440545/?ar">https://learning.oreilly.com/library/view/~/9780738440545/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/9780738440545/?ar">https://go.oreilly.com/library-access/library/view/-/9780738440545/?ar</a><br/>Format: Electronic Resources<br/>Engineering systems acquisition and supportent://SD_ILS/0/SD_ILS:23061312024-06-20T02:26:58Z2024-06-20T02:26:58Zby Mo, John P. T., editor.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780857092120/?ar">https://go.oreilly.com/library-access/library/view/-/9780857092120/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9780857092120/?ar">https://learning.oreilly.com/library/view/~/9780857092120/?ar</a><br/>Format: Electronic Resources<br/>Flexible decision management with business rules on IBM z systemsent://SD_ILS/0/SD_ILS:23077982024-06-20T02:26:58Z2024-06-20T02:26:58Zby Hiscock, Mark, author.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780738440729/?ar">https://go.oreilly.com/library-access/library/view/-/9780738440729/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9780738440729/?ar">https://learning.oreilly.com/library/view/~/9780738440729/?ar</a><br/>Format: Electronic Resources<br/>Formal Methods Applied to Complex Systems.ent://SD_ILS/0/SD_ILS:12739152024-06-20T02:26:58Z2024-06-20T02:26:58Zby Boulanger, Jean-Louis.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1734311">Click to View</a><br/>Format: Electronic Resources<br/>Analytical Routes to Chaos in Nonlinear Engineering.ent://SD_ILS/0/SD_ILS:12710742024-06-20T02:26:58Z2024-06-20T02:26:58Zby Luo, Albert C. J.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1680247">Click to View</a><br/>Format: Electronic Resources<br/>Identification of Physical Systems : Applications to Condition Monitoring, Fault Diagnosis, Soft Sensor and Controller Design.ent://SD_ILS/0/SD_ILS:12692562024-06-20T02:26:58Z2024-06-20T02:26:58Zby Doraiswami, Rajamani.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1652084">Click to View</a><br/>Format: Electronic Resources<br/>Optimization in Engineering Sciences : Approximate and Metaheuristic Methods.ent://SD_ILS/0/SD_ILS:12780162024-06-20T02:26:58Z2024-06-20T02:26:58Zby Borne, Pierre.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1830128">Click to View</a><br/>Format: Electronic Resources<br/>An analysis of the success factors in implementing an ITIL-based IT Change and Release Management Application : Based on the IBM Change and Configuration Management Database (CCMDB).ent://SD_ILS/0/SD_ILS:12686702024-06-20T02:26:58Z2024-06-20T02:26:58Zby Jurkscheit, Jane.<br/><a href="http://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1640419">Click to View</a><br/>Format: Electronic Resources<br/>Guide Bonnes Pratiques en Expression du Besoinent://SD_ILS/0/SD_ILS:21236912024-06-20T02:26:58Z2024-06-20T02:26:58Zby Fanmuy, Gauthier, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=5709838">Click to View</a><br/>Format: Electronic Resources<br/>Basic process engineering controlent://SD_ILS/0/SD_ILS:20592482024-06-20T02:26:58Z2024-06-20T02:26:58Zby Agachi, Paul Șerban, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=4190803">Click to View</a><br/>Format: Electronic Resources<br/>Introduction to civil engineering systems : a systems perspective to the development of civil engineering facilitiesent://SD_ILS/0/SD_ILS:22791862024-06-20T02:26:58Z2024-06-20T02:26:58Zby Labi, Samuel, 1962- author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=7103622">Click to View</a><br/>Format: Electronic Resources<br/>Reliability of large and complex systemsent://SD_ILS/0/SD_ILS:22072852024-06-20T02:26:58Z2024-06-20T02:26:58Zby Kołowrocki, Krzysztof, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1657928">Click to View</a><br/>Format: Electronic Resources<br/>System requirements analysisent://SD_ILS/0/SD_ILS:22066052024-06-20T02:26:58Z2024-06-20T02:26:58Zby Grady, Jeffrey O.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1429420">Click to View</a><br/>Format: Electronic Resources<br/>Reliability of large and complex systemsent://SD_ILS/0/SD_ILS:22705392024-06-20T02:26:58Z2024-06-20T02:26:58Zby Ko±owrocki, Krzysztof, author.<br/><a href="https://ebookcentral.proquest.com/lib/iyte/detail.action?docID=1657928">Click to View</a><br/>Format: Electronic Resources<br/>System requirements analysisent://SD_ILS/0/SD_ILS:23011752024-06-20T02:26:58Z2024-06-20T02:26:58Zby Grady, Jeffrey O.<br/><a href="https://go.oreilly.com/library-access/library/view/-/9780124171077/?ar">https://go.oreilly.com/library-access/library/view/-/9780124171077/?ar</a>
<a href="https://learning.oreilly.com/library/view/~/9780124171077/?ar">https://learning.oreilly.com/library/view/~/9780124171077/?ar</a><br/>Format: Electronic Resources<br/>End-to-end high availability solution for System z from a Linux perspectiveent://SD_ILS/0/SD_ILS:23051172024-06-20T02:26:58Z2024-06-20T02:26:58Zby Parziale, Lydia.<br/><a href="https://learning.oreilly.com/library/view/~/073844006X/?ar">https://learning.oreilly.com/library/view/~/073844006X/?ar</a>
<a href="https://go.oreilly.com/library-access/library/view/-/073844006X/?ar">https://go.oreilly.com/library-access/library/view/-/073844006X/?ar</a><br/>Format: Electronic Resources<br/>