Search Results for - Narrowed by: English - Electronics. - Surfaces and Interfaces, Thin Films. SirsiDynix Enterprise https://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002band$002bInterfaces$00252C$002bThin$002bFilms.$002509Surfaces$002band$002bInterfaces$00252C$002bThin$002bFilms.$0026ps$003d300? 2024-06-21T00:46:24Z Magnetostatic Modelling of Thin Layers Using the Method of Moments And Its Implementation in Octave/Matlab ent://SD_ILS/0/SD_ILS:2086638 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Szewczyk, Roman. author.<br/><a href="https://doi.org/10.1007/978-3-319-77985-0">https://doi.org/10.1007/978-3-319-77985-0</a><br/>Format:&#160;Electronic Resources<br/> Nanotribology and Nanomechanics An Introduction ent://SD_ILS/0/SD_ILS:503275 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Bhushan, Bharat. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-77608-6">http://dx.doi.org/10.1007/978-3-540-77608-6</a><br/>Format:&#160;Electronic Resources<br/> Wafer Level 3-D ICs Process Technology ent://SD_ILS/0/SD_ILS:501877 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Tan, Chuan Seng. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-76534-1">http://dx.doi.org/10.1007/978-0-387-76534-1</a><br/>Format:&#160;Electronic Resources<br/> Semiconductor Nanostructures ent://SD_ILS/0/SD_ILS:503312 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Bimberg, Dieter. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-77899-8">http://dx.doi.org/10.1007/978-3-540-77899-8</a><br/>Format:&#160;Electronic Resources<br/> Laser Ablation and its Applications ent://SD_ILS/0/SD_ILS:505003 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Phipps, Claude. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-30453-3">http://dx.doi.org/10.1007/978-0-387-30453-3</a><br/>Format:&#160;Electronic Resources<br/> Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging ent://SD_ILS/0/SD_ILS:505172 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Suhir, E. editor.<br/><a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format:&#160;Electronic Resources<br/> Physics of Ferroelectrics A Modern Perspective ent://SD_ILS/0/SD_ILS:511168 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Rabe, Karin M. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-34591-6">http://dx.doi.org/10.1007/978-3-540-34591-6</a><br/>Format:&#160;Electronic Resources<br/> Springer Handbook of Electronic and Photonic Materials ent://SD_ILS/0/SD_ILS:504879 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Kasap, Safa. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-29185-7">http://dx.doi.org/10.1007/978-0-387-29185-7</a><br/>Format:&#160;Electronic Resources<br/> Fundamentals of Nanoscale Film Analysis ent://SD_ILS/0/SD_ILS:504892 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Alford, Terry L. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format:&#160;Electronic Resources<br/> Micromachined Thin-Film Sensors for SOI-CMOS Co-Integration ent://SD_ILS/0/SD_ILS:504838 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Laconte, J. author.<br/><a href="http://dx.doi.org/10.1007/0-387-28843-0">http://dx.doi.org/10.1007/0-387-28843-0</a><br/>Format:&#160;Electronic Resources<br/> Introducing Molecular Electronics ent://SD_ILS/0/SD_ILS:509994 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Cuniberti, Gianaurelio. editor.<br/><a href="http://dx.doi.org/10.1007/b101525">http://dx.doi.org/10.1007/b101525</a><br/>Format:&#160;Electronic Resources<br/> Integrated Chemical Microsensor Systems in CMOS Technology ent://SD_ILS/0/SD_ILS:509216 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Hierlemann, Andreas. author.<br/><a href="http://dx.doi.org/10.1007/b138987">http://dx.doi.org/10.1007/b138987</a><br/>Format:&#160;Electronic Resources<br/> Modern Techniques for Characterizing Magnetic Materials ent://SD_ILS/0/SD_ILS:504164 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Zhu, Yimei. editor.<br/><a href="http://dx.doi.org/10.1007/b101202">http://dx.doi.org/10.1007/b101202</a><br/>Format:&#160;Electronic Resources<br/> Thin Films and Heterostructures for Oxide Electronics ent://SD_ILS/0/SD_ILS:504481 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Ogale, Satischandra B. author.<br/><a href="http://dx.doi.org/10.1007/b136780">http://dx.doi.org/10.1007/b136780</a><br/>Format:&#160;Electronic Resources<br/> Nanotribology and Nanomechanics An Introduction ent://SD_ILS/0/SD_ILS:509398 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Bhushan, Bharat. editor.<br/><a href="http://dx.doi.org/10.1007/3-540-28248-3">http://dx.doi.org/10.1007/3-540-28248-3</a><br/>Format:&#160;Electronic Resources<br/> Materials for Information Technology Devices, Interconnects and Packaging ent://SD_ILS/0/SD_ILS:508465 2024-06-21T00:46:24Z 2024-06-21T00:46:24Z by&#160;Zschech, Ehrenfried. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-235-7">http://dx.doi.org/10.1007/1-84628-235-7</a><br/>Format:&#160;Electronic Resources<br/>