Search Results for - Narrowed by: English - Electronics. - Surfaces and Interfaces, Thin Films.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002band$002bInterfaces$00252C$002bThin$002bFilms.$002509Surfaces$002band$002bInterfaces$00252C$002bThin$002bFilms.$0026ps$003d300?2024-06-21T00:46:24ZMagnetostatic Modelling of Thin Layers Using the Method of Moments And Its Implementation in Octave/Matlabent://SD_ILS/0/SD_ILS:20866382024-06-21T00:46:24Z2024-06-21T00:46:24Zby Szewczyk, Roman. author.<br/><a href="https://doi.org/10.1007/978-3-319-77985-0">https://doi.org/10.1007/978-3-319-77985-0</a><br/>Format: Electronic Resources<br/>Nanotribology and Nanomechanics An Introductionent://SD_ILS/0/SD_ILS:5032752024-06-21T00:46:24Z2024-06-21T00:46:24Zby Bhushan, Bharat. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-77608-6">http://dx.doi.org/10.1007/978-3-540-77608-6</a><br/>Format: Electronic Resources<br/>Wafer Level 3-D ICs Process Technologyent://SD_ILS/0/SD_ILS:5018772024-06-21T00:46:24Z2024-06-21T00:46:24Zby Tan, Chuan Seng. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-76534-1">http://dx.doi.org/10.1007/978-0-387-76534-1</a><br/>Format: Electronic Resources<br/>Semiconductor Nanostructuresent://SD_ILS/0/SD_ILS:5033122024-06-21T00:46:24Z2024-06-21T00:46:24Zby Bimberg, Dieter. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-77899-8">http://dx.doi.org/10.1007/978-3-540-77899-8</a><br/>Format: Electronic Resources<br/>Laser Ablation and its Applicationsent://SD_ILS/0/SD_ILS:5050032024-06-21T00:46:24Z2024-06-21T00:46:24Zby Phipps, Claude. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-30453-3">http://dx.doi.org/10.1007/978-0-387-30453-3</a><br/>Format: Electronic Resources<br/>Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packagingent://SD_ILS/0/SD_ILS:5051722024-06-21T00:46:24Z2024-06-21T00:46:24Zby Suhir, E. editor.<br/><a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Electronic Resources<br/>Physics of Ferroelectrics A Modern Perspectiveent://SD_ILS/0/SD_ILS:5111682024-06-21T00:46:24Z2024-06-21T00:46:24Zby Rabe, Karin M. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-34591-6">http://dx.doi.org/10.1007/978-3-540-34591-6</a><br/>Format: Electronic Resources<br/>Springer Handbook of Electronic and Photonic Materialsent://SD_ILS/0/SD_ILS:5048792024-06-21T00:46:24Z2024-06-21T00:46:24Zby Kasap, Safa. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-29185-7">http://dx.doi.org/10.1007/978-0-387-29185-7</a><br/>Format: Electronic Resources<br/>Fundamentals of Nanoscale Film Analysisent://SD_ILS/0/SD_ILS:5048922024-06-21T00:46:24Z2024-06-21T00:46:24Zby Alford, Terry L. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format: Electronic Resources<br/>Micromachined Thin-Film Sensors for SOI-CMOS Co-Integrationent://SD_ILS/0/SD_ILS:5048382024-06-21T00:46:24Z2024-06-21T00:46:24Zby Laconte, J. author.<br/><a href="http://dx.doi.org/10.1007/0-387-28843-0">http://dx.doi.org/10.1007/0-387-28843-0</a><br/>Format: Electronic Resources<br/>Introducing Molecular Electronicsent://SD_ILS/0/SD_ILS:5099942024-06-21T00:46:24Z2024-06-21T00:46:24Zby Cuniberti, Gianaurelio. editor.<br/><a href="http://dx.doi.org/10.1007/b101525">http://dx.doi.org/10.1007/b101525</a><br/>Format: Electronic Resources<br/>Integrated Chemical Microsensor Systems in CMOS Technologyent://SD_ILS/0/SD_ILS:5092162024-06-21T00:46:24Z2024-06-21T00:46:24Zby Hierlemann, Andreas. author.<br/><a href="http://dx.doi.org/10.1007/b138987">http://dx.doi.org/10.1007/b138987</a><br/>Format: Electronic Resources<br/>Modern Techniques for Characterizing Magnetic Materialsent://SD_ILS/0/SD_ILS:5041642024-06-21T00:46:24Z2024-06-21T00:46:24Zby Zhu, Yimei. editor.<br/><a href="http://dx.doi.org/10.1007/b101202">http://dx.doi.org/10.1007/b101202</a><br/>Format: Electronic Resources<br/>Thin Films and Heterostructures for Oxide Electronicsent://SD_ILS/0/SD_ILS:5044812024-06-21T00:46:24Z2024-06-21T00:46:24Zby Ogale, Satischandra B. author.<br/><a href="http://dx.doi.org/10.1007/b136780">http://dx.doi.org/10.1007/b136780</a><br/>Format: Electronic Resources<br/>Nanotribology and Nanomechanics An Introductionent://SD_ILS/0/SD_ILS:5093982024-06-21T00:46:24Z2024-06-21T00:46:24Zby Bhushan, Bharat. editor.<br/><a href="http://dx.doi.org/10.1007/3-540-28248-3">http://dx.doi.org/10.1007/3-540-28248-3</a><br/>Format: Electronic Resources<br/>Materials for Information Technology Devices, Interconnects and Packagingent://SD_ILS/0/SD_ILS:5084652024-06-21T00:46:24Z2024-06-21T00:46:24Zby Zschech, Ehrenfried. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-235-7">http://dx.doi.org/10.1007/1-84628-235-7</a><br/>Format: Electronic Resources<br/>