Search Results for - Narrowed by: IYTE Library - 2006 - Electronics.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dLIBRARY$002509Library$0025091$00253AIYTE$002509IYTE$002bLibrary$0026qf$003dPUBDATE$002509Publication$002bDate$0025092006$0025092006$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026ps$003d300?2024-09-24T21:57:30ZTemel elektronik devre uygulamalarıent://SD_ILS/0/SD_ILS:411892024-09-24T21:57:30Z2024-09-24T21:57:30Zby Güleryüz, H. Veysel, author.<br/>Format: Books<br/>Electronic and Telecommunication Engineering Concepts In Industrial Product Design With A Case Study Of Cell Phoneent://SD_ILS/0/SD_ILS:517262024-09-24T21:57:30Z2024-09-24T21:57:30Zby Dülger, Ufuk.<br/><a href="http://hdl.handle.net/11147/3779">Access to Electronic Version.</a><br/>Format: Manuscript<br/>Piezoelectric Transducers for Vibration Control and Dampingent://SD_ILS/0/SD_ILS:5085182024-09-24T21:57:30Z2024-09-24T21:57:30Zby Moheimani, S. O. Reza. author.<br/><a href="http://dx.doi.org/10.1007/1-84628-332-9">http://dx.doi.org/10.1007/1-84628-332-9</a><br/>Format: Electronic Resources<br/>Nonlinear H2/H∞ Constrained Feedback Control A Practical Design Approach Using Neural Networksent://SD_ILS/0/SD_ILS:5085302024-09-24T21:57:30Z2024-09-24T21:57:30Zby Abu-Khalaf, Murad. author.<br/><a href="http://dx.doi.org/10.1007/1-84628-350-7">http://dx.doi.org/10.1007/1-84628-350-7</a><br/>Format: Electronic Resources<br/>Electronics Process Technology Production Modelling, Simulation and Optimisationent://SD_ILS/0/SD_ILS:5085322024-09-24T21:57:30Z2024-09-24T21:57:30Zby Sauer, Wilfried. author.<br/><a href="http://dx.doi.org/10.1007/1-84628-354-X">http://dx.doi.org/10.1007/1-84628-354-X</a><br/>Format: Electronic Resources<br/>Gallium Nitride Processing for Electronics, Sensors and Spintronicsent://SD_ILS/0/SD_ILS:5085332024-09-24T21:57:30Z2024-09-24T21:57:30Zby Pearton, Stephen J. author.<br/><a href="http://dx.doi.org/10.1007/1-84628-359-0">http://dx.doi.org/10.1007/1-84628-359-0</a><br/>Format: Electronic Resources<br/>Integrated Circuit Test Engineering Modern Techniquesent://SD_ILS/0/SD_ILS:5084212024-09-24T21:57:30Z2024-09-24T21:57:30Zby Grout, Ian A. author.<br/><a href="http://dx.doi.org/10.1007/1-84628-173-3">http://dx.doi.org/10.1007/1-84628-173-3</a><br/>Format: Electronic Resources<br/>Nanotechnology Assessment and Perspectivesent://SD_ILS/0/SD_ILS:5107632024-09-24T21:57:30Z2024-09-24T21:57:30Zby Brune, H. author.<br/><a href="http://dx.doi.org/10.1007/3-540-32820-3">http://dx.doi.org/10.1007/3-540-32820-3</a><br/>Format: Electronic Resources<br/>Carbon The Future Material for Advanced Technology Applicationsent://SD_ILS/0/SD_ILS:5113142024-09-24T21:57:30Z2024-09-24T21:57:30Zby Messina, Giacomo. editor.<br/><a href="http://dx.doi.org/10.1007/b105262">http://dx.doi.org/10.1007/b105262</a><br/>Format: Electronic Resources<br/>Wide-Bandwidth High-Dynamic Range D/A Convertersent://SD_ILS/0/SD_ILS:5049992024-09-24T21:57:30Z2024-09-24T21:57:30Zby Doris, Konstantinos. author.<br/><a href="http://dx.doi.org/10.1007/0-387-30416-9">http://dx.doi.org/10.1007/0-387-30416-9</a><br/>Format: Electronic Resources<br/>Verification Methodology Manual for SystemVerilogent://SD_ILS/0/SD_ILS:5044112024-09-24T21:57:30Z2024-09-24T21:57:30Zby Bergeron, Janick. author.<br/><a href="http://dx.doi.org/10.1007/b135575">http://dx.doi.org/10.1007/b135575</a><br/>Format: Electronic Resources<br/>BioMEMSent://SD_ILS/0/SD_ILS:5048162024-09-24T21:57:30Z2024-09-24T21:57:30Zby Urban, Gerald A. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-28732-4">http://dx.doi.org/10.1007/978-0-387-28732-4</a><br/>Format: Electronic Resources<br/>Fundamentals of Solid State Engineeringent://SD_ILS/0/SD_ILS:5048182024-09-24T21:57:30Z2024-09-24T21:57:30Zby Razeghi, Manijeh. author.<br/><a href="http://dx.doi.org/10.1007/0-387-28751-5">http://dx.doi.org/10.1007/0-387-28751-5</a><br/>Format: Electronic Resources<br/>Low Power VCO Design in CMOSent://SD_ILS/0/SD_ILS:5095622024-09-24T21:57:30Z2024-09-24T21:57:30Zby Tiebout, Marc. author.<br/><a href="http://dx.doi.org/10.1007/3-540-29256-X">http://dx.doi.org/10.1007/3-540-29256-X</a><br/>Format: Electronic Resources<br/>MEMS: A Practical Guide to Design, Analysis, and Applicationsent://SD_ILS/0/SD_ILS:5109732024-09-24T21:57:30Z2024-09-24T21:57:30Zby Korvink, Jan G. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-33655-6">http://dx.doi.org/10.1007/978-3-540-33655-6</a><br/>Format: Electronic Resources<br/>Mid-infrared Semiconductor Optoelectronicsent://SD_ILS/0/SD_ILS:5084452024-09-24T21:57:30Z2024-09-24T21:57:30Zby Krier, Anthony. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-209-8">http://dx.doi.org/10.1007/1-84628-209-8</a><br/>Format: Electronic Resources<br/>The Physics of Semiconductors An Introduction Including Devices and Nanophysicsent://SD_ILS/0/SD_ILS:5111882024-09-24T21:57:30Z2024-09-24T21:57:30Zby Grundmann, Marius. author.<br/><a href="http://dx.doi.org/10.1007/3-540-34661-9">http://dx.doi.org/10.1007/3-540-34661-9</a><br/>Format: Electronic Resources<br/>Pulsed Power Systems Principles and Applicationsent://SD_ILS/0/SD_ILS:5111892024-09-24T21:57:30Z2024-09-24T21:57:30Zby Bluhm, Hansjoachim. author.<br/><a href="http://dx.doi.org/10.1007/3-540-34662-7">http://dx.doi.org/10.1007/3-540-34662-7</a><br/>Format: Electronic Resources<br/>Optical Interconnects The Silicon Approachent://SD_ILS/0/SD_ILS:5095222024-09-24T21:57:30Z2024-09-24T21:57:30Zby Pavesi, Lorenzo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-28912-8">http://dx.doi.org/10.1007/978-3-540-28912-8</a><br/>Format: Electronic Resources<br/>Interfacing with C++ Programming Real-World Applicationsent://SD_ILS/0/SD_ILS:5109632024-09-24T21:57:30Z2024-09-24T21:57:30Zby Katupitiya, Jayantha. author.<br/><a href="http://dx.doi.org/10.1007/3-540-33581-1">http://dx.doi.org/10.1007/3-540-33581-1</a><br/>Format: Electronic Resources<br/>Advanced Microsystems for Automotive Applications 2006ent://SD_ILS/0/SD_ILS:5109322024-09-24T21:57:30Z2024-09-24T21:57:30Zby Valldorf, Jürgen. editor.<br/><a href="http://dx.doi.org/10.1007/3-540-33410-6">http://dx.doi.org/10.1007/3-540-33410-6</a><br/>Format: Electronic Resources<br/>High-Performance Energy-Efficient Microprocessor Designent://SD_ILS/0/SD_ILS:5052682024-09-24T21:57:30Z2024-09-24T21:57:30Zby Oklobdzija, Vojin G. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-34047-0">http://dx.doi.org/10.1007/978-0-387-34047-0</a><br/>Format: Electronic Resources<br/>Nanomechanics of Materials and Structuresent://SD_ILS/0/SD_ILS:5066842024-09-24T21:57:30Z2024-09-24T21:57:30Zby Chuang, T. -J. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-3951-4">http://dx.doi.org/10.1007/1-4020-3951-4</a><br/>Format: Electronic Resources<br/>Geomagnetics for Aeronautical Safety A Case Study in and around the Balkansent://SD_ILS/0/SD_ILS:5071062024-09-24T21:57:30Z2024-09-24T21:57:30Zby Rasson, Jean L. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-5025-1">http://dx.doi.org/10.1007/978-1-4020-5025-1</a><br/>Format: Electronic Resources<br/>Fast, Efficient and Predictable Memory Accesses Optimization Algorithms for Memory Architecture Aware Compilationent://SD_ILS/0/SD_ILS:5070272024-09-24T21:57:30Z2024-09-24T21:57:30Zby Wehmeyer, Lars. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4822-X">http://dx.doi.org/10.1007/1-4020-4822-X</a><br/>Format: Electronic Resources<br/>Integrated System-Level Modeling of Network-on-Chip enabled Multi-Processor Platformsent://SD_ILS/0/SD_ILS:5070292024-09-24T21:57:30Z2024-09-24T21:57:30Zby Kogel, Tim. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4826-2">http://dx.doi.org/10.1007/1-4020-4826-2</a><br/>Format: Electronic Resources<br/>Low-Power Low-Voltage Sigma-Delta Modulators in Nanometer CMOSent://SD_ILS/0/SD_ILS:5067552024-09-24T21:57:30Z2024-09-24T21:57:30Zby Yao, Libin. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4140-3">http://dx.doi.org/10.1007/1-4020-4140-3</a><br/>Format: Electronic Resources<br/>Essential Issues in SOC Design Designing Complex Systems-on-Chipent://SD_ILS/0/SD_ILS:5072372024-09-24T21:57:30Z2024-09-24T21:57:30Zby Lin, Youn-Long Steve. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-5352-5">http://dx.doi.org/10.1007/1-4020-5352-5</a><br/>Format: Electronic Resources<br/>Microsystems Mechanical Designent://SD_ILS/0/SD_ILS:5087912024-09-24T21:57:30Z2024-09-24T21:57:30Zby Bona, Francesco. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-211-48549-1">http://dx.doi.org/10.1007/978-3-211-48549-1</a><br/>Format: Electronic Resources<br/>CMOS Cascade Sigma-Delta Modulators for Sensors and Telecom Error Analysis and Practical Designent://SD_ILS/0/SD_ILS:5070132024-09-24T21:57:30Z2024-09-24T21:57:30Zby Río, R. del. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4776-2">http://dx.doi.org/10.1007/1-4020-4776-2</a><br/>Format: Electronic Resources<br/>METHODOLOGY FOR THE DIGITAL CALIBRATION OF ANALOG CIRCUITS AND SYSTEMSent://SD_ILS/0/SD_ILS:5068052024-09-24T21:57:30Z2024-09-24T21:57:30Zby Pastre, Marc. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4253-1">http://dx.doi.org/10.1007/1-4020-4253-1</a><br/>Format: Electronic Resources<br/>Oscillation-Based Test in Mixed-Signal Circuitsent://SD_ILS/0/SD_ILS:5072212024-09-24T21:57:30Z2024-09-24T21:57:30Zby Sánchez, Gloria Huertas. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format: Electronic Resources<br/>Handbook of Advanced Magnetic Materialsent://SD_ILS/0/SD_ILS:5076872024-09-24T21:57:30Z2024-09-24T21:57:30Zby Liu, Yi. editor.<br/><a href="http://dx.doi.org/10.1007/b115335">http://dx.doi.org/10.1007/b115335</a><br/>Format: Electronic Resources<br/>RF POWER AMPLIFIERS FOR MOBILE COMMUNICATIONSent://SD_ILS/0/SD_ILS:5071442024-09-24T21:57:30Z2024-09-24T21:57:30Zby Reynaert, Patrick. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-5117-4">http://dx.doi.org/10.1007/1-4020-5117-4</a><br/>Format: Electronic Resources<br/>Scientific detectors for astronomy 2005 Explorers of the Photon Odysseyent://SD_ILS/0/SD_ILS:5068322024-09-24T21:57:30Z2024-09-24T21:57:30Zby Beletic, Jenna E. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-4330-9">http://dx.doi.org/10.1007/1-4020-4330-9</a><br/>Format: Electronic Resources<br/>Embedded Security in Cars Securing Current and Future Automotive IT Applicationsent://SD_ILS/0/SD_ILS:5094242024-09-24T21:57:30Z2024-09-24T21:57:30Zby Lemke, Kerstin. editor.<br/><a href="http://dx.doi.org/10.1007/3-540-28428-1">http://dx.doi.org/10.1007/3-540-28428-1</a><br/>Format: Electronic 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ANALOG/RF IC DESIGNent://SD_ILS/0/SD_ILS:5069212024-09-24T21:57:30Z2024-09-24T21:57:30Zby GRABINSKI, WLADYSLAW. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-4556-5">http://dx.doi.org/10.1007/1-4020-4556-5</a><br/>Format: Electronic Resources<br/>IQ CALIBRATION TECHNIQUES FOR CMOS RADIO TRANSCEIVERSent://SD_ILS/0/SD_ILS:5071322024-09-24T21:57:30Z2024-09-24T21:57:30Zby Chen, Sao-Jie. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-5083-6">http://dx.doi.org/10.1007/1-4020-5083-6</a><br/>Format: Electronic Resources<br/>Design Automation Methods and Tools for Microfluidics-Based Biochipsent://SD_ILS/0/SD_ILS:5071472024-09-24T21:57:30Z2024-09-24T21:57:30Zby Chakrabarty, Krishnendu. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-5123-9">http://dx.doi.org/10.1007/1-4020-5123-9</a><br/>Format: Electronic Resources<br/>Continuous-Time Sigma-Delta A/D Conversion Fundamentals, Performance Limits and Robust Implementationsent://SD_ILS/0/SD_ILS:5094312024-09-24T21:57:30Z2024-09-24T21:57:30Zby Ortmanns, Maurits. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28473-7">http://dx.doi.org/10.1007/3-540-28473-7</a><br/>Format: Electronic Resources<br/>Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devicesent://SD_ILS/0/SD_ILS:5068492024-09-24T21:57:30Z2024-09-24T21:57:30Zby Gusev, Evgeni. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-4367-8">http://dx.doi.org/10.1007/1-4020-4367-8</a><br/>Format: Electronic Resources<br/>Sub-threshold Design for Ultra Low-Power Systemsent://SD_ILS/0/SD_ILS:5053072024-09-24T21:57:30Z2024-09-24T21:57:30Zby Wang, Alice. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-34501-7">http://dx.doi.org/10.1007/978-0-387-34501-7</a><br/>Format: Electronic Resources<br/>A Roadmap for Formal Property Verificationent://SD_ILS/0/SD_ILS:5070052024-09-24T21:57:30Z2024-09-24T21:57:30Zby DasGupta, Pallab. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-4758-9">http://dx.doi.org/10.1007/978-1-4020-4758-9</a><br/>Format: Electronic Resources<br/>MOBILE AD HOC NETWORKSent://SD_ILS/0/SD_ILS:5069502024-09-24T21:57:30Z2024-09-24T21:57:30Zby TAVLI, BULENT. editor.<br/><a href="http://dx.doi.org/10.1007/1-4020-4633-2">http://dx.doi.org/10.1007/1-4020-4633-2</a><br/>Format: Electronic Resources<br/>Calibration techniques in nyquist A/D convertersent://SD_ILS/0/SD_ILS:5069512024-09-24T21:57:30Z2024-09-24T21:57:30Zby Ploeg, Hendrik. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4635-9">http://dx.doi.org/10.1007/1-4020-4635-9</a><br/>Format: Electronic Resources<br/>Advanced design techniques for RF power amplifiersent://SD_ILS/0/SD_ILS:5069532024-09-24T21:57:30Z2024-09-24T21:57:30Zby Rudiakova, Anna. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4639-1">http://dx.doi.org/10.1007/1-4020-4639-1</a><br/>Format: Electronic Resources<br/>Control Design Techniques in Power Electronics 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