Search Results for - Narrowed by: IYTE Library - Electronics. - Optical and Electronic Materials.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dLIBRARY$002509Library$0025091$00253AIYTE$002509IYTE$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026qf$003dSUBJECT$002509Subject$002509Optical$002band$002bElectronic$002bMaterials.$002509Optical$002band$002bElectronic$002bMaterials.$0026ps$003d300?2024-06-17T04:11:04ZInfrared Photodetectors Based on Low-Dimensional Materialsent://SD_ILS/0/SD_ILS:20834842024-06-17T04:11:04Z2024-06-17T04:11:04Zby Guo, Nan. author.<br/><a href="https://doi.org/10.1007/978-981-13-2838-1">https://doi.org/10.1007/978-981-13-2838-1</a><br/>Format: Electronic Resources<br/>Antenna Design Solutions for RFID Tags Based on Metamaterial-Inspired Resonators and Other Resonant Structuresent://SD_ILS/0/SD_ILS:20879362024-06-17T04:11:04Z2024-06-17T04:11:04Zby Zuffanelli, Simone. author.<br/><a href="https://doi.org/10.1007/978-3-319-62030-5">https://doi.org/10.1007/978-3-319-62030-5</a><br/>Format: Electronic Resources<br/>Solid State Lighting Reliability Part 2 Components to Systemsent://SD_ILS/0/SD_ILS:20874972024-06-17T04:11:04Z2024-06-17T04:11:04Zby van Driel, Willem Dirk. editor.<br/><a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format: Electronic Resources<br/>Research on the Radiation Effects and Compact Model of SiGe HBTent://SD_ILS/0/SD_ILS:20879082024-06-17T04:11:04Z2024-06-17T04:11:04Zby Sun, Yabin. author.<br/><a href="https://doi.org/10.1007/978-981-10-4612-4">https://doi.org/10.1007/978-981-10-4612-4</a><br/>Format: Electronic Resources<br/>Handbook of Visual Display Technologyent://SD_ILS/0/SD_ILS:20871112024-06-17T04:11:04Z2024-06-17T04:11:04Zby Chen, Janglin. editor.<br/><a href="https://doi.org/10.1007/978-3-319-14346-0">https://doi.org/10.1007/978-3-319-14346-0</a><br/>Format: Electronic Resources<br/>Nanoporous Metals for Advanced Energy Technologiesent://SD_ILS/0/SD_ILS:20873622024-06-17T04:11:04Z2024-06-17T04:11:04Zby Ding, Yi. author.<br/><a href="https://doi.org/10.1007/978-3-319-29749-1">https://doi.org/10.1007/978-3-319-29749-1</a><br/>Format: Electronic Resources<br/>Ferromagnetic Microwire Composites From Sensors to Microwave Applicationsent://SD_ILS/0/SD_ILS:20879222024-06-17T04:11:04Z2024-06-17T04:11:04Zby Peng, Hua-Xin. author.<br/><a href="https://doi.org/10.1007/978-3-319-29276-2">https://doi.org/10.1007/978-3-319-29276-2</a><br/>Format: Electronic Resources<br/>Elements of Plasma Technologyent://SD_ILS/0/SD_ILS:20883942024-06-17T04:11:04Z2024-06-17T04:11:04Zby Wong, Chiow San. author.<br/><a href="https://doi.org/10.1007/978-981-10-0117-8">https://doi.org/10.1007/978-981-10-0117-8</a><br/>Format: Electronic Resources<br/>Polarization Effects in Semiconductors From Ab InitioTheory to Device Applicationsent://SD_ILS/0/SD_ILS:5016082024-06-17T04:11:04Z2024-06-17T04:11:04Zby Wood, Colin. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68319-5">http://dx.doi.org/10.1007/978-0-387-68319-5</a><br/>Format: Electronic Resources<br/>Memories in Wireless Systemsent://SD_ILS/0/SD_ILS:5034792024-06-17T04:11:04Z2024-06-17T04:11:04Zby Micheloni, Rino. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-79078-5">http://dx.doi.org/10.1007/978-3-540-79078-5</a><br/>Format: Electronic Resources<br/>Adaptive Structural Systems with Piezoelectric Transducer Circuitryent://SD_ILS/0/SD_ILS:5019682024-06-17T04:11:04Z2024-06-17T04:11:04Zby Tang, Jiong. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-78751-0">http://dx.doi.org/10.1007/978-0-387-78751-0</a><br/>Format: Electronic Resources<br/>The Materials Science of Semiconductorsent://SD_ILS/0/SD_ILS:5016252024-06-17T04:11:04Z2024-06-17T04:11:04Zby Rockett, Angus. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68650-9">http://dx.doi.org/10.1007/978-0-387-68650-9</a><br/>Format: Electronic Resources<br/>Piezoelectric and Acoustic Materials for Transducer Applicationsent://SD_ILS/0/SD_ILS:5018792024-06-17T04:11:04Z2024-06-17T04:11:04Zby Safari, Ahmad. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-76540-2">http://dx.doi.org/10.1007/978-0-387-76540-2</a><br/>Format: Electronic Resources<br/>Nanoelectronics and Photonics From Atoms to Materials, Devices, and Architecturesent://SD_ILS/0/SD_ILS:5018752024-06-17T04:11:04Z2024-06-17T04:11:04Zby Korkin, Anatoli. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-76499-3">http://dx.doi.org/10.1007/978-0-387-76499-3</a><br/>Format: Electronic Resources<br/>Wafer Level 3-D ICs Process Technologyent://SD_ILS/0/SD_ILS:5018772024-06-17T04:11:04Z2024-06-17T04:11:04Zby Tan, Chuan Seng. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-76534-1">http://dx.doi.org/10.1007/978-0-387-76534-1</a><br/>Format: Electronic Resources<br/>Physical Limitations of Semiconductor Devicesent://SD_ILS/0/SD_ILS:5017902024-06-17T04:11:04Z2024-06-17T04:11:04Zby Vashchenko, V. A. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-74514-5">http://dx.doi.org/10.1007/978-0-387-74514-5</a><br/>Format: Electronic Resources<br/>Gallium Nitride Electronicsent://SD_ILS/0/SD_ILS:5028742024-06-17T04:11:04Z2024-06-17T04:11:04Zby Quay, Rüdiger. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-71892-5">http://dx.doi.org/10.1007/978-3-540-71892-5</a><br/>Format: Electronic Resources<br/>Semiconductor Nanostructuresent://SD_ILS/0/SD_ILS:5033122024-06-17T04:11:04Z2024-06-17T04:11:04Zby Bimberg, Dieter. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-77899-8">http://dx.doi.org/10.1007/978-3-540-77899-8</a><br/>Format: Electronic Resources<br/>Vacuum Electronics Components and Devicesent://SD_ILS/0/SD_ILS:5028782024-06-17T04:11:04Z2024-06-17T04:11:04Zby Eichmeier, Joseph A. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-71929-8">http://dx.doi.org/10.1007/978-3-540-71929-8</a><br/>Format: Electronic Resources<br/>Piezoelectric Transducers and Applicationsent://SD_ILS/0/SD_ILS:5032582024-06-17T04:11:04Z2024-06-17T04:11:04Zby Vives, Antonio Arnau. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-77508-9">http://dx.doi.org/10.1007/978-3-540-77508-9</a><br/>Format: Electronic Resources<br/>Nanoscale Phenomena Basic Science to Device Applicationsent://SD_ILS/0/SD_ILS:5017282024-06-17T04:11:04Z2024-06-17T04:11:04Zby Tang, Zikang. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-73048-6">http://dx.doi.org/10.1007/978-0-387-73048-6</a><br/>Format: Electronic Resources<br/>Transparent Electronicsent://SD_ILS/0/SD_ILS:5016942024-06-17T04:11:04Z2024-06-17T04:11:04Zby Wager, John F. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-72342-6">http://dx.doi.org/10.1007/978-0-387-72342-6</a><br/>Format: Electronic Resources<br/>Simulation of Semiconductor Processes and Devices 2007 SISPAD 2007ent://SD_ILS/0/SD_ILS:5088032024-06-17T04:11:04Z2024-06-17T04:11:04Zby Grasser, Tibor. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-211-72861-1">http://dx.doi.org/10.1007/978-3-211-72861-1</a><br/>Format: Electronic Resources<br/>Lead-Free Solderingent://SD_ILS/0/SD_ILS:5058042024-06-17T04:11:04Z2024-06-17T04:11:04Zby Bath, Jasbir. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68422-2">http://dx.doi.org/10.1007/978-0-387-68422-2</a><br/>Format: Electronic Resources<br/>Photonic Crystal Fibers Properties and Applicationsent://SD_ILS/0/SD_ILS:5076182024-06-17T04:11:04Z2024-06-17T04:11:04Zby Poli, Federica. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-6326-8">http://dx.doi.org/10.1007/978-1-4020-6326-8</a><br/>Format: Electronic Resources<br/>Nanoscaled Semiconductor-on-Insulator Structures and Devicesent://SD_ILS/0/SD_ILS:5076342024-06-17T04:11:04Z2024-06-17T04:11:04Zby Hall, Steve. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-6380-0">http://dx.doi.org/10.1007/978-1-4020-6380-0</a><br/>Format: Electronic Resources<br/>A Guide to Lead-free Solders Physical Metallurgy and Reliabilityent://SD_ILS/0/SD_ILS:5085082024-06-17T04:11:04Z2024-06-17T04:11:04Zby Evans, John W. author.<br/><a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format: Electronic Resources<br/>Piezoelectric Multilayer Beam Bending Actuators Static and Dynamic Behavior and Aspects of Sensor Integrationent://SD_ILS/0/SD_ILS:5107242024-06-17T04:11:04Z2024-06-17T04:11:04Zby Ballas, Rüdiger G. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-32642-7">http://dx.doi.org/10.1007/978-3-540-32642-7</a><br/>Format: Electronic Resources<br/>Wide Bandgap Semiconductors Fundamental Properties and Modern Photonic and Electronic Devicesent://SD_ILS/0/SD_ILS:5118342024-06-17T04:11:04Z2024-06-17T04:11:04Zby Takahashi, Kiyoshi. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-47235-3">http://dx.doi.org/10.1007/978-3-540-47235-3</a><br/>Format: Electronic Resources<br/>Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Scienceent://SD_ILS/0/SD_ILS:5054992024-06-17T04:11:04Z2024-06-17T04:11:04Zby Lang, Sidney B. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-38039-1">http://dx.doi.org/10.1007/978-0-387-38039-1</a><br/>Format: Electronic Resources<br/>Integrated Circuit Packaging, Assembly and Interconnectionsent://SD_ILS/0/SD_ILS:5052562024-06-17T04:11:04Z2024-06-17T04:11:04Zby Greig, William J. author.<br/><a href="http://dx.doi.org/10.1007/0-387-33913-2">http://dx.doi.org/10.1007/0-387-33913-2</a><br/>Format: Electronic Resources<br/>Solder Joint Technology Materials, Properties, and Reliabilityent://SD_ILS/0/SD_ILS:5055272024-06-17T04:11:04Z2024-06-17T04:11:04Zby Tu, King-Ning. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format: Electronic Resources<br/>Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packagingent://SD_ILS/0/SD_ILS:5051722024-06-17T04:11:04Z2024-06-17T04:11:04Zby Suhir, E. editor.<br/><a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Electronic Resources<br/>Data Convertersent://SD_ILS/0/SD_ILS:5051252024-06-17T04:11:04Z2024-06-17T04:11:04Zby Maloberti, Franco. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-32486-9">http://dx.doi.org/10.1007/978-0-387-32486-9</a><br/>Format: Electronic Resources<br/>Nanotechnology for Electronic Materials and Devicesent://SD_ILS/0/SD_ILS:5057682024-06-17T04:11:04Z2024-06-17T04:11:04Zby Korkin, Anatoli. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-49965-9">http://dx.doi.org/10.1007/978-0-387-49965-9</a><br/>Format: Electronic Resources<br/>Lead-Free Electronic Solders A Special Issue of the Journal of Materials Science: Materials in Electronicsent://SD_ILS/0/SD_ILS:5056722024-06-17T04:11:04Z2024-06-17T04:11:04Zby Subramanian, K. N. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-48433-4">http://dx.doi.org/10.1007/978-0-387-48433-4</a><br/>Format: Electronic Resources<br/>Springer Handbook of Electronic and Photonic Materialsent://SD_ILS/0/SD_ILS:5048792024-06-17T04:11:04Z2024-06-17T04:11:04Zby Kasap, Safa. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-29185-7">http://dx.doi.org/10.1007/978-0-387-29185-7</a><br/>Format: Electronic Resources<br/>Gallium Nitride Processing for Electronics, Sensors and Spintronicsent://SD_ILS/0/SD_ILS:5085332024-06-17T04:11:04Z2024-06-17T04:11:04Zby Pearton, Stephen J. author.<br/><a href="http://dx.doi.org/10.1007/1-84628-359-0">http://dx.doi.org/10.1007/1-84628-359-0</a><br/>Format: Electronic Resources<br/>MEMS: A Practical Guide to Design, Analysis, and Applicationsent://SD_ILS/0/SD_ILS:5109732024-06-17T04:11:04Z2024-06-17T04:11:04Zby Korvink, Jan G. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-33655-6">http://dx.doi.org/10.1007/978-3-540-33655-6</a><br/>Format: Electronic Resources<br/>Continuous-Time Sigma-Delta A/D Conversion Fundamentals, Performance Limits and Robust Implementationsent://SD_ILS/0/SD_ILS:5094312024-06-17T04:11:04Z2024-06-17T04:11:04Zby Ortmanns, Maurits. author.<br/><a href="http://dx.doi.org/10.1007/3-540-28473-7">http://dx.doi.org/10.1007/3-540-28473-7</a><br/>Format: Electronic Resources<br/>Optical Interconnects The Silicon Approachent://SD_ILS/0/SD_ILS:5095222024-06-17T04:11:04Z2024-06-17T04:11:04Zby Pavesi, Lorenzo. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-28912-8">http://dx.doi.org/10.1007/978-3-540-28912-8</a><br/>Format: Electronic Resources<br/>The Physics of Semiconductors An Introduction Including Devices and Nanophysicsent://SD_ILS/0/SD_ILS:5111882024-06-17T04:11:04Z2024-06-17T04:11:04Zby Grundmann, Marius. author.<br/><a href="http://dx.doi.org/10.1007/3-540-34661-9">http://dx.doi.org/10.1007/3-540-34661-9</a><br/>Format: Electronic Resources<br/>Mid-infrared Semiconductor Optoelectronicsent://SD_ILS/0/SD_ILS:5084452024-06-17T04:11:04Z2024-06-17T04:11:04Zby Krier, Anthony. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-209-8">http://dx.doi.org/10.1007/1-84628-209-8</a><br/>Format: Electronic Resources<br/>Handbook of Advanced Magnetic Materialsent://SD_ILS/0/SD_ILS:5076872024-06-17T04:11:04Z2024-06-17T04:11:04Zby Liu, Yi. editor.<br/><a href="http://dx.doi.org/10.1007/b115335">http://dx.doi.org/10.1007/b115335</a><br/>Format: Electronic Resources<br/>Analog Design Essentialsent://SD_ILS/0/SD_ILS:5044362024-06-17T04:11:04Z2024-06-17T04:11:04Zby Sansen, Willy M. C. author.<br/><a href="http://dx.doi.org/10.1007/b135984">http://dx.doi.org/10.1007/b135984</a><br/>Format: Electronic Resources<br/>Gizopoulos / Advances in ElectronicTestingent://SD_ILS/0/SD_ILS:5049132024-06-17T04:11:04Z2024-06-17T04:11:04Zby Gizopoulos, Dimitris. editor.<br/><a href="http://dx.doi.org/10.1007/0-387-29409-0">http://dx.doi.org/10.1007/0-387-29409-0</a><br/>Format: Electronic Resources<br/>Modern Ferrite Technologyent://SD_ILS/0/SD_ILS:5049142024-06-17T04:11:04Z2024-06-17T04:11:04Zby Goldman, Alex. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-29413-1">http://dx.doi.org/10.1007/978-0-387-29413-1</a><br/>Format: Electronic Resources<br/>MEMS/NEMS Handbook Techniques and Applicationsent://SD_ILS/0/SD_ILS:5044402024-06-17T04:11:04Z2024-06-17T04:11:04Zby Leondes, Cornelius T. editor.<br/><a href="http://dx.doi.org/10.1007/b136111">http://dx.doi.org/10.1007/b136111</a><br/>Format: Electronic Resources<br/>Bonding in Microsystem Technologyent://SD_ILS/0/SD_ILS:5069342024-06-17T04:11:04Z2024-06-17T04:11:04Zby Dziuban, Jan A. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4589-1">http://dx.doi.org/10.1007/1-4020-4589-1</a><br/>Format: Electronic Resources<br/>Fault-Tolerance Techniques for SRAM-based FPGAsent://SD_ILS/0/SD_ILS:5050442024-06-17T04:11:04Z2024-06-17T04:11:04Zby Kastensmidt, Fernanda Lima. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-31069-5">http://dx.doi.org/10.1007/978-0-387-31069-5</a><br/>Format: Electronic Resources<br/>Fast, Efficient and Predictable Memory Accesses Optimization Algorithms for Memory Architecture Aware Compilationent://SD_ILS/0/SD_ILS:5070272024-06-17T04:11:04Z2024-06-17T04:11:04Zby Wehmeyer, Lars. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4822-X">http://dx.doi.org/10.1007/1-4020-4822-X</a><br/>Format: Electronic Resources<br/>Fundamentals of Switching Theory and Logic Design A Hands on Approachent://SD_ILS/0/SD_ILS:5049832024-06-17T04:11:04Z2024-06-17T04:11:04Zby Astola, Jaakko T. author.<br/><a href="http://dx.doi.org/10.1007/0-387-30311-1">http://dx.doi.org/10.1007/0-387-30311-1</a><br/>Format: Electronic Resources<br/>Nanoscale Transistors Device Physics, Modeling and Simulationent://SD_ILS/0/SD_ILS:5047182024-06-17T04:11:04Z2024-06-17T04:11:04Zby Lundstrom, Mark S. author.<br/><a href="http://dx.doi.org/10.1007/0-387-28003-0">http://dx.doi.org/10.1007/0-387-28003-0</a><br/>Format: Electronic Resources<br/>Fundamentals of Solid State Engineeringent://SD_ILS/0/SD_ILS:5048182024-06-17T04:11:04Z2024-06-17T04:11:04Zby Razeghi, Manijeh. author.<br/><a href="http://dx.doi.org/10.1007/0-387-28751-5">http://dx.doi.org/10.1007/0-387-28751-5</a><br/>Format: Electronic Resources<br/>Shape and Functional Elements of the Bulk Silicon Microtechnique A Manual of Wet-Etched Silicon Structuresent://SD_ILS/0/SD_ILS:5090222024-06-17T04:11:04Z2024-06-17T04:11:04Zby Frühauf, Joachim. author.<br/><a href="http://dx.doi.org/10.1007/b138230">http://dx.doi.org/10.1007/b138230</a><br/>Format: Electronic Resources<br/>Ambient Intelligenceent://SD_ILS/0/SD_ILS:5091282024-06-17T04:11:04Z2024-06-17T04:11:04Zby Weber, Werner. editor.<br/><a href="http://dx.doi.org/10.1007/b138670">http://dx.doi.org/10.1007/b138670</a><br/>Format: Electronic Resources<br/>Nanotechnology and Nanoelectronics Materials, Devices, Measurement Techniquesent://SD_ILS/0/SD_ILS:5089372024-06-17T04:11:04Z2024-06-17T04:11:04Zby Fahrner, W. 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