Search Results for - Narrowed by: Springer Collection - 2005 - Electronics and Microelectronics, Instrumentation.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AONLINESPR$002509Springer$002bCollection$0026qf$003dPUBDATE$002509Publication$002bDate$0025092005$0025092005$0026qf$003dSUBJECT$002509Subject$002509Electronics$002band$002bMicroelectronics$00252C$002bInstrumentation.$002509Electronics$002band$002bMicroelectronics$00252C$002bInstrumentation.$0026ps$003d300?2024-09-23T00:03:45ZSilicon Quantum Integrated Circuits Silicon-Germanium Heterostructure Devices: Basics and Realisationsent://SD_ILS/0/SD_ILS:5088582024-09-23T00:03:45Z2024-09-23T00:03:45Zby Kasper, Erich. author.<br/><a href="http://dx.doi.org/10.1007/b137494">http://dx.doi.org/10.1007/b137494</a><br/>Format: Electronic Resources<br/>Microscale Diagnostic Techniquesent://SD_ILS/0/SD_ILS:5088782024-09-23T00:03:45Z2024-09-23T00:03:45Zby Breuer, Kenneth S. editor.<br/><a href="http://dx.doi.org/10.1007/b137604">http://dx.doi.org/10.1007/b137604</a><br/>Format: Electronic Resources<br/>System-level Test and Validation of Hardware/Software Systemsent://SD_ILS/0/SD_ILS:5084002024-09-23T00:03:45Z2024-09-23T00:03:45Zby Sonza Reorda, Matteo. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-145-8">http://dx.doi.org/10.1007/1-84628-145-8</a><br/>Format: Electronic Resources<br/>Materials for Information Technology Devices, Interconnects and Packagingent://SD_ILS/0/SD_ILS:5084652024-09-23T00:03:45Z2024-09-23T00:03:45Zby Zschech, Ehrenfried. editor.<br/><a href="http://dx.doi.org/10.1007/1-84628-235-7">http://dx.doi.org/10.1007/1-84628-235-7</a><br/>Format: Electronic Resources<br/>Electronic Noise and Interfering Signals Principles and Applicationsent://SD_ILS/0/SD_ILS:5089012024-09-23T00:03:45Z2024-09-23T00:03:45Zby Vasilescu, Gabriel. author.<br/><a href="http://dx.doi.org/10.1007/b137720">http://dx.doi.org/10.1007/b137720</a><br/>Format: Electronic Resources<br/>Modeling and Simulation for RF System Designent://SD_ILS/0/SD_ILS:5046582024-09-23T00:03:45Z2024-09-23T00:03:45Zby Frevert, Ronny. author.<br/><a href="http://dx.doi.org/10.1007/0-387-27585-1">http://dx.doi.org/10.1007/0-387-27585-1</a><br/>Format: Electronic Resources<br/>Matching Properties of Deep Sub-Micron MOS Transistorsent://SD_ILS/0/SD_ILS:5042992024-09-23T00:03:45Z2024-09-23T00:03:45Zby Croon, Jeroen A. author.<br/><a href="http://dx.doi.org/10.1007/b105122">http://dx.doi.org/10.1007/b105122</a><br/>Format: Electronic Resources<br/>Transaction Level Modeling with SystemC TLM Concepts and Applications for Embedded Systemsent://SD_ILS/0/SD_ILS:5045032024-09-23T00:03:45Z2024-09-23T00:03:45Zby Ghenassia, Frank. editor.<br/><a href="http://dx.doi.org/10.1007/b137175">http://dx.doi.org/10.1007/b137175</a><br/>Format: Electronic Resources<br/>Microflows 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