Search Results for - Narrowed by: Springer Collection - 2008 - Characterization and Evaluation of Materials.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AONLINESPR$002509Springer$002bCollection$0026qf$003dPUBDATE$002509Publication$002bDate$0025092008$0025092008$0026qf$003dSUBJECT$002509Subject$002509Characterization$002band$002bEvaluation$002bof$002bMaterials.$002509Characterization$002band$002bEvaluation$002bof$002bMaterials.$0026ps$003d300?2024-06-21T06:30:07ZSoft Matter Characterizationent://SD_ILS/0/SD_ILS:5020492024-06-21T06:30:07Z2024-06-21T06:30:07Zby Borsali, Redouane. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-4465-6">http://dx.doi.org/10.1007/978-1-4020-4465-6</a><br/>Format: Electronic Resources<br/>Self-Consistent Methods for Composites Vol. 2: Wave Propagation in Heterogeneous Materialsent://SD_ILS/0/SD_ILS:5021912024-06-21T06:30:07Z2024-06-21T06:30:07Zby Kanaun, S. K. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-6968-0">http://dx.doi.org/10.1007/978-1-4020-6968-0</a><br/>Format: Electronic Resources<br/>Laser Spectroscopy Vol. 2 Experimental Techniquesent://SD_ILS/0/SD_ILS:5030792024-06-21T06:30:07Z2024-06-21T06:30:07Zby Demtröder, Wolfgang. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-74954-7">http://dx.doi.org/10.1007/978-3-540-74954-7</a><br/>Format: Electronic Resources<br/>Creep Mechanicsent://SD_ILS/0/SD_ILS:5035752024-06-21T06:30:07Z2024-06-21T06:30:07Zby Betten, Josef. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-85051-9">http://dx.doi.org/10.1007/978-3-540-85051-9</a><br/>Format: Electronic Resources<br/>Advanced Materials and Structures for Extreme Operating Conditionsent://SD_ILS/0/SD_ILS:5030152024-06-21T06:30:07Z2024-06-21T06:30:07Zby Skrzypek, Jacek J. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-74300-2">http://dx.doi.org/10.1007/978-3-540-74300-2</a><br/>Format: Electronic Resources<br/>Analysis of Failure in Fiber Polymer Laminates The Theory of Alfred Puckent://SD_ILS/0/SD_ILS:5031312024-06-21T06:30:07Z2024-06-21T06:30:07Zby Knops, Martin. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-75765-8">http://dx.doi.org/10.1007/978-3-540-75765-8</a><br/>Format: Electronic Resources<br/>Polymer Surfaces and Interfaces Characterization, Modification and Applicationsent://SD_ILS/0/SD_ILS:5029662024-06-21T06:30:07Z2024-06-21T06:30:07Zby Stamm, Manfred. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-73865-7">http://dx.doi.org/10.1007/978-3-540-73865-7</a><br/>Format: Electronic Resources<br/>Transmission Electron Microscopy and Diffractometry of Materialsent://SD_ILS/0/SD_ILS:5029682024-06-21T06:30:07Z2024-06-21T06:30:07Zby Fultz, Brent. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format: Electronic Resources<br/>Laser Spectroscopy Vol. 1 Basic Principlesent://SD_ILS/0/SD_ILS:5029242024-06-21T06:30:07Z2024-06-21T06:30:07Zby Demtröder, Wolfgang. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-73418-5">http://dx.doi.org/10.1007/978-3-540-73418-5</a><br/>Format: Electronic Resources<br/>Chromatography for Sustainable Polymeric Materials Renewable, Degradable and Recyclableent://SD_ILS/0/SD_ILS:5034262024-06-21T06:30:07Z2024-06-21T06:30:07Zby Albertsson, Ann-Christine. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-78763-1">http://dx.doi.org/10.1007/978-3-540-78763-1</a><br/>Format: Electronic Resources<br/>Self-Consistent Methods for Composites Vol.1: Static Problemsent://SD_ILS/0/SD_ILS:5021132024-06-21T06:30:07Z2024-06-21T06:30:07Zby Kanaun, S. K. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-6664-1">http://dx.doi.org/10.1007/978-1-4020-6664-1</a><br/>Format: Electronic Resources<br/>Time-Resolved Spectroscopy in Complex Liquids An Experimental Perspectiveent://SD_ILS/0/SD_ILS:5015522024-06-21T06:30:07Z2024-06-21T06:30:07Zby Torre, Renato. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-25558-3">http://dx.doi.org/10.1007/978-0-387-25558-3</a><br/>Format: Electronic Resources<br/>Polymer Engineering Science and Viscoelasticity An Introductionent://SD_ILS/0/SD_ILS:5017612024-06-21T06:30:07Z2024-06-21T06:30:07Zby Brinson, Hal F. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-73861-1">http://dx.doi.org/10.1007/978-0-387-73861-1</a><br/>Format: Electronic Resources<br/>Structures Under Crash and Impact Continuum Mechanics, Discretization and Experimental Characterizationent://SD_ILS/0/SD_ILS:5017622024-06-21T06:30:07Z2024-06-21T06:30:07Zby Hiermaier, Stefan Josef. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-73863-5">http://dx.doi.org/10.1007/978-0-387-73863-5</a><br/>Format: Electronic Resources<br/>One-Dimensional Nanostructuresent://SD_ILS/0/SD_ILS:5017772024-06-21T06:30:07Z2024-06-21T06:30:07Zby Wang, Zhiming M. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-74132-1">http://dx.doi.org/10.1007/978-0-387-74132-1</a><br/>Format: Electronic Resources<br/>Silicon Based Polymers Advances in Synthesis and Supramolecular Organizationent://SD_ILS/0/SD_ILS:5022922024-06-21T06:30:07Z2024-06-21T06:30:07Zby Ganachaud, François. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-8528-4">http://dx.doi.org/10.1007/978-1-4020-8528-4</a><br/>Format: Electronic Resources<br/>Minerals as Advanced Materials Ient://SD_ILS/0/SD_ILS:5032172024-06-21T06:30:07Z2024-06-21T06:30:07Zby Krivovichev, Sergey V. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-77123-4">http://dx.doi.org/10.1007/978-3-540-77123-4</a><br/>Format: Electronic Resources<br/>Atomistic Modeling of Materials Failureent://SD_ILS/0/SD_ILS:5018682024-06-21T06:30:07Z2024-06-21T06:30:07Zby Buehler, Markus J. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-76426-9">http://dx.doi.org/10.1007/978-0-387-76426-9</a><br/>Format: Electronic Resources<br/>Materials Handbook A Concise Desktop Referenceent://SD_ILS/0/SD_ILS:5024182024-06-21T06:30:07Z2024-06-21T06:30:07Zby Cardarelli, Francois. author.<br/><a href="http://dx.doi.org/10.1007/978-1-84628-669-8">http://dx.doi.org/10.1007/978-1-84628-669-8</a><br/>Format: Electronic Resources<br/>Standardization and Quality Assurance in Fluorescence Measurements II Bioanalytical and Biomedical Applicationsent://SD_ILS/0/SD_ILS:5028142024-06-21T06:30:07Z2024-06-21T06:30:07Zby Resch-Genger, Ute. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-70571-0">http://dx.doi.org/10.1007/978-3-540-70571-0</a><br/>Format: Electronic Resources<br/>Standardization and Quality Assurance in Fluorescence Measurements I Techniquesent://SD_ILS/0/SD_ILS:5030942024-06-21T06:30:07Z2024-06-21T06:30:07Zby Resch-Genger, Ute. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-75207-3">http://dx.doi.org/10.1007/978-3-540-75207-3</a><br/>Format: Electronic Resources<br/>The Behavior Of Structures Composed Of Composite Materialsent://SD_ILS/0/SD_ILS:5015162024-06-21T06:30:07Z2024-06-21T06:30:07Zby Vinson, Jack R. editor.<br/><a href="http://dx.doi.org/10.1007/0-306-48414-5">http://dx.doi.org/10.1007/0-306-48414-5</a><br/>Format: Electronic Resources<br/>Micro and Nano Mechanical Testing of Materials and Devicesent://SD_ILS/0/SD_ILS:5019662024-06-21T06:30:07Z2024-06-21T06:30:07Zby Yang, Fuqian. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-78701-5">http://dx.doi.org/10.1007/978-0-387-78701-5</a><br/>Format: Electronic Resources<br/>Microstructuring of Glassesent://SD_ILS/0/SD_ILS:5026072024-06-21T06:30:07Z2024-06-21T06:30:07Zby Hülsenberg, Dagmar. author.<br/><a href="http://dx.doi.org/10.1007/978-3-540-49888-9">http://dx.doi.org/10.1007/978-3-540-49888-9</a><br/>Format: Electronic Resources<br/>Polymer Microscopyent://SD_ILS/0/SD_ILS:5017062024-06-21T06:30:07Z2024-06-21T06:30:07Zby Sawyer, Linda C. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-72628-1">http://dx.doi.org/10.1007/978-0-387-72628-1</a><br/>Format: Electronic Resources<br/>Narrow Gap Semiconductors 2007 Proceedings of the 13th International Conference, 8–12 July, 2007, Guildford, UKent://SD_ILS/0/SD_ILS:5022652024-06-21T06:30:07Z2024-06-21T06:30:07Zby Murdin, Ben. editor.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-8425-6">http://dx.doi.org/10.1007/978-1-4020-8425-6</a><br/>Format: Electronic Resources<br/>Nanoscale Phenomena Basic Science to Device Applicationsent://SD_ILS/0/SD_ILS:5017282024-06-21T06:30:07Z2024-06-21T06:30:07Zby Tang, Zikang. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-73048-6">http://dx.doi.org/10.1007/978-0-387-73048-6</a><br/>Format: Electronic Resources<br/>Bulk Metallic Glassesent://SD_ILS/0/SD_ILS:5015862024-06-21T06:30:07Z2024-06-21T06:30:07Zby Miller, Michael. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-48921-6">http://dx.doi.org/10.1007/978-0-387-48921-6</a><br/>Format: Electronic Resources<br/>Nanocomposites Ionic Conducting Materials and Structural Spectroscopiesent://SD_ILS/0/SD_ILS:5016342024-06-21T06:30:07Z2024-06-21T06:30:07Zby Knauth, Philippe. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68907-4">http://dx.doi.org/10.1007/978-0-387-68907-4</a><br/>Format: Electronic Resources<br/>Physics and Properties of Narrow Gap Semiconductorsent://SD_ILS/0/SD_ILS:5018072024-06-21T06:30:07Z2024-06-21T06:30:07Zby Chu, Junhao. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-74801-6">http://dx.doi.org/10.1007/978-0-387-74801-6</a><br/>Format: Electronic Resources<br/>