Search Results for - Narrowed by: Springer Collection - Circuits and Systems. - Optical and Electronic Materials.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AONLINESPR$002509Springer$002bCollection$0026qf$003dSUBJECT$002509Subject$002509Circuits$002band$002bSystems.$002509Circuits$002band$002bSystems.$0026qf$003dSUBJECT$002509Subject$002509Optical$002band$002bElectronic$002bMaterials.$002509Optical$002band$002bElectronic$002bMaterials.$0026ps$003d300?2024-06-23T10:57:04ZPhysical Design and Mask Synthesis for Directed Self-Assembly Lithographyent://SD_ILS/0/SD_ILS:20838842024-06-23T10:57:04Z2024-06-23T10:57:04Zby Shim, Seongbo. author.<br/><a href="https://doi.org/10.1007/978-3-319-76294-4">https://doi.org/10.1007/978-3-319-76294-4</a><br/>Format: Electronic Resources<br/>Gallium Nitride-enabled High Frequency and High Efficiency Power Conversionent://SD_ILS/0/SD_ILS:20870602024-06-23T10:57:04Z2024-06-23T10:57:04Zby Meneghesso, Gaudenzio. editor.<br/><a href="https://doi.org/10.1007/978-3-319-77994-2">https://doi.org/10.1007/978-3-319-77994-2</a><br/>Format: Electronic Resources<br/>Phase Change Memory Device Physics, Reliability and Applicationsent://SD_ILS/0/SD_ILS:20839432024-06-23T10:57:04Z2024-06-23T10:57:04Zby Redaelli, Andrea. editor.<br/><a href="https://doi.org/10.1007/978-3-319-69053-7">https://doi.org/10.1007/978-3-319-69053-7</a><br/>Format: Electronic Resources<br/>Solid State Lighting Reliability Part 2 Components to Systemsent://SD_ILS/0/SD_ILS:20874972024-06-23T10:57:04Z2024-06-23T10:57:04Zby van Driel, Willem Dirk. editor.<br/><a href="https://doi.org/10.1007/978-3-319-58175-0">https://doi.org/10.1007/978-3-319-58175-0</a><br/>Format: Electronic Resources<br/>Fan-Out Wafer-Level Packagingent://SD_ILS/0/SD_ILS:20864492024-06-23T10:57:04Z2024-06-23T10:57:04Zby Lau, John H. author.<br/><a href="https://doi.org/10.1007/978-981-10-8884-1">https://doi.org/10.1007/978-981-10-8884-1</a><br/>Format: Electronic Resources<br/>Functional Metamaterials and Metadevicesent://SD_ILS/0/SD_ILS:20833312024-06-23T10:57:04Z2024-06-23T10:57:04Zby Tong, Xingcun Colin. author.<br/><a href="https://doi.org/10.1007/978-3-319-66044-8">https://doi.org/10.1007/978-3-319-66044-8</a><br/>Format: Electronic Resources<br/>Polarization Effects in Semiconductors From Ab InitioTheory to Device Applicationsent://SD_ILS/0/SD_ILS:5016082024-06-23T10:57:04Z2024-06-23T10:57:04Zby Wood, Colin. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68319-5">http://dx.doi.org/10.1007/978-0-387-68319-5</a><br/>Format: Electronic Resources<br/>ESD Protection Device and Circuit Design for Advanced CMOS Technologiesent://SD_ILS/0/SD_ILS:5022382024-06-23T10:57:04Z2024-06-23T10:57:04Zby Semenov, Oleg. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-8301-3">http://dx.doi.org/10.1007/978-1-4020-8301-3</a><br/>Format: Electronic Resources<br/>Physical Limitations of Semiconductor Devicesent://SD_ILS/0/SD_ILS:5017902024-06-23T10:57:04Z2024-06-23T10:57:04Zby Vashchenko, V. A. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-74514-5">http://dx.doi.org/10.1007/978-0-387-74514-5</a><br/>Format: Electronic Resources<br/>Semiconductor Device Physics and Designent://SD_ILS/0/SD_ILS:5020822024-06-23T10:57:04Z2024-06-23T10:57:04Zby Mishra, Umesh K. author.<br/><a href="http://dx.doi.org/10.1007/978-1-4020-6481-4">http://dx.doi.org/10.1007/978-1-4020-6481-4</a><br/>Format: Electronic Resources<br/>Memories in Wireless Systemsent://SD_ILS/0/SD_ILS:5034792024-06-23T10:57:04Z2024-06-23T10:57:04Zby Micheloni, Rino. editor.<br/><a href="http://dx.doi.org/10.1007/978-3-540-79078-5">http://dx.doi.org/10.1007/978-3-540-79078-5</a><br/>Format: Electronic Resources<br/>Lead-Free Solderingent://SD_ILS/0/SD_ILS:5058042024-06-23T10:57:04Z2024-06-23T10:57:04Zby Bath, Jasbir. editor.<br/><a href="http://dx.doi.org/10.1007/978-0-387-68422-2">http://dx.doi.org/10.1007/978-0-387-68422-2</a><br/>Format: Electronic Resources<br/>Data Convertersent://SD_ILS/0/SD_ILS:5051252024-06-23T10:57:04Z2024-06-23T10:57:04Zby Maloberti, Franco. author.<br/><a href="http://dx.doi.org/10.1007/978-0-387-32486-9">http://dx.doi.org/10.1007/978-0-387-32486-9</a><br/>Format: Electronic Resources<br/>Integrated Circuit Packaging, Assembly and Interconnectionsent://SD_ILS/0/SD_ILS:5052562024-06-23T10:57:04Z2024-06-23T10:57:04Zby Greig, William J. author.<br/><a href="http://dx.doi.org/10.1007/0-387-33913-2">http://dx.doi.org/10.1007/0-387-33913-2</a><br/>Format: Electronic Resources<br/>Fast, Efficient and Predictable Memory Accesses Optimization Algorithms for Memory Architecture Aware Compilationent://SD_ILS/0/SD_ILS:5070272024-06-23T10:57:04Z2024-06-23T10:57:04Zby Wehmeyer, Lars. author.<br/><a href="http://dx.doi.org/10.1007/1-4020-4822-X">http://dx.doi.org/10.1007/1-4020-4822-X</a><br/>Format: Electronic Resources<br/>Fundamentals of Solid State Engineeringent://SD_ILS/0/SD_ILS:5048182024-06-23T10:57:04Z2024-06-23T10:57:04Zby Razeghi, Manijeh. author.<br/><a href="http://dx.doi.org/10.1007/0-387-28751-5">http://dx.doi.org/10.1007/0-387-28751-5</a><br/>Format: Electronic Resources<br/>Gizopoulos / Advances in ElectronicTestingent://SD_ILS/0/SD_ILS:5049132024-06-23T10:57:04Z2024-06-23T10:57:04Zby Gizopoulos, Dimitris. editor.<br/><a href="http://dx.doi.org/10.1007/0-387-29409-0">http://dx.doi.org/10.1007/0-387-29409-0</a><br/>Format: Electronic Resources<br/>VLSI-Design of Non-Volatile Memoriesent://SD_ILS/0/SD_ILS:5088972024-06-23T10:57:04Z2024-06-23T10:57:04Zby Campardo, Giovanni. author.<br/><a href="http://dx.doi.org/10.1007/b137712">http://dx.doi.org/10.1007/b137712</a><br/>Format: Electronic Resources<br/>