Search Results for - Narrowed by: Springer Collection - Engineering.SirsiDynix Enterprisehttps://catalog.iyte.edu.tr/client/en_US/default/default/qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AONLINESPR$002509Springer$002bCollection$0026qf$003dSUBJECT$002509Subject$002509Engineering.$002509Engineering.$0026ps$003d300?2024-06-18T01:58:30ZPhysical Chemistry Essentialsent://SD_ILS/0/SD_ILS:20835482024-06-18T01:58:30Z2024-06-18T01:58:30Zby Hofmann, Andreas. author.<br/><a href="https://doi.org/10.1007/978-3-319-74167-3">https://doi.org/10.1007/978-3-319-74167-3</a><br/>Format: Electronic Resources<br/>Intelligent Orthopaedics Artificial Intelligence and Smart Image-guided Technology for Orthopaedicsent://SD_ILS/0/SD_ILS:20821782024-06-18T01:58:30Z2024-06-18T01:58:30Zby Zheng, Guoyan. editor.<br/><a href="https://doi.org/10.1007/978-981-13-1396-7">https://doi.org/10.1007/978-981-13-1396-7</a><br/>Format: Electronic Resources<br/>Genetic Programming Theory and Practice 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Leonard. editor.<br/><a href="https://doi.org/10.1007/978-3-319-68053-8">https://doi.org/10.1007/978-3-319-68053-8</a><br/>Format: Electronic Resources<br/>Hydrogels Recent Advancesent://SD_ILS/0/SD_ILS:20834262024-06-18T01:58:30Z2024-06-18T01:58:30Zby Thakur, Vijay Kumar. editor.<br/><a href="https://doi.org/10.1007/978-981-10-6077-9">https://doi.org/10.1007/978-981-10-6077-9</a><br/>Format: Electronic Resources<br/>Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterizationent://SD_ILS/0/SD_ILS:20839772024-06-18T01:58:30Z2024-06-18T01:58:30Zby Brodusch, Nicolas. author.<br/><a href="https://doi.org/10.1007/978-981-10-4433-5">https://doi.org/10.1007/978-981-10-4433-5</a><br/>Format: Electronic Resources<br/>Computing, Analytics and Networks First International Conference, ICAN 2017, Chandigarh, India, October 27-28, 2017, Revised Selected Papersent://SD_ILS/0/SD_ILS:20849312024-06-18T01:58:30Z2024-06-18T01:58:30Zby Sharma, Rajnish. editor.<br/><a 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